Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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On the Use of the Adjusted Rand Index as a Metric for Evaluating Supervised ClassificationSantos, Jorge M. ; Embrechts, Mark Alippi, Cesare ; Panayiotou, Christos ; Polycarpou, Marios ; Ellinas, GeorgiosArtificial Neural Networks – ICANN 2009, p.175-184 [Periódico revisado por pares]Berlin, Heidelberg: Springer Berlin HeidelbergSem texto completo |
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2 |
Material Type: Ata de Congresso
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HIRAX: A Probe of Dark Energy and Radio TransientsNewburgh, L.B. ; Bandura, K. ; Bucher, Martin ; Chang, T.-C. ; Chiang, H.C. ; Cliche, J.F. ; Davé, R. ; Dobbs, M. ; Clarkson, C. ; Ganga, K.M. ; Gogo, T. ; Gumba, A. ; Gupta, N. ; Hilton, M. ; Johnstone, B. ; Karastergiou, A. ; Kunz, M. ; Lokhorst, D. ; Maartens, R. ; Macpherson, S. ; Mdlalose, M. ; Moodley, K. ; Ngwenya, L. ; Parra, J.M. ; Peterson, J. ; Recnik, O. ; Saliwanchik, B. ; Santos, M.G. ; Sievers, J.L. ; Smirnov, O. ; Stronkhorst, P. ; Taylor, R. ; Vanderlinde, K. ; van Vuuren, G. ; Weltman, A. ; Witzemann, A.Proc.SPIE Int.Soc.Opt.Eng, 2016, Vol.9906Sem texto completo |
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3 |
Material Type: Ata de Congresso
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Remote laboratories for measurement courses during the Covid-19 eraLiguori, C. ; Pietrosanto, A. ; Carratù, M. ; Paciello, V. ; De Santos, M. ; Di Leo, G. ; Ferro, M. Singh, Ravendra ; Bhadoria, Vikas Singh ; Shouran, Mokhtar ; Ohene-Akoto, Ing. Justice ; Arunprasad, G ; Ambikapathy, AAIP Conference Proceedings, 2024, Vol.2816 (1) [Periódico revisado por pares]Melville: American Institute of PhysicsSem texto completo |
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4 |
Material Type: Ata de Congresso
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GIS-BASED RAPID EARTHQUAKE EXPOSURE AND VULNERABILITY MAPPING USING LIDAR DEM AND MACHINE LEARNING ALGORITHMS: CASE OF PORAC, PAMPANGADe Los Santos, M. J. D. ; Principe, J. A.International archives of the photogrammetry, remote sensing and spatial information sciences., 2021, Vol.XLVI-4/W6-2021, p.125-132 [Periódico revisado por pares]Gottingen: Copernicus GmbHTexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Automatic segmentation of the lumen of the carotid artery in ultrasound B-mode imagesSantos, André M. F ; Tavares, Jão Manuel R. S ; Sousa, Luísa ; Santos, Rosa ; Castro, Pedro ; Azevedo, Elsa Novak, Carol L ; Aylward, StephenProceedings of SPIE, the international society for optical engineering, 2013, Vol.8670, p.86703I-86703I-16SPIESem texto completo |
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6 |
Material Type: Ata de Congresso
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Forage potential of Cacti on drylandsDubeux, J. C. B. Jr ; Santos, M. V. F. dos ; Mello, A. C. L. de ; Da Cuna, M. Vieira ; Ferreira, M. de A ; Santos, D. C. dos ; Lira, M. de A ; Da C. Silva, MActa horticulturae, 2015 (1067), p.181-186 [Periódico revisado por pares]International Society for Horticultural ScienceTexto completo disponível |
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7 |
Material Type: Ata de Congresso
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A look into students’ conceptual understanding of the definite integral via the APOS modelSantos, Edgardo M. Ramli, Murni ; Nurhasanah, Farida ; Indriyanti, Nurma YunitaAIP Conference Proceedings, 2019, Vol.2194 (1) [Periódico revisado por pares]Melville: American Institute of PhysicsSem texto completo |
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8 |
Material Type: Ata de Congresso
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Compact tunable and reconfigurable microwave photonic filter for satellite payloadsSantos, M. C ; Yoosefi, O Sodnik, Zoran ; Cugny, Bruno ; Karafolas, NikosSPIE 2017Sem texto completo |
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9 |
Material Type: Ata de Congresso
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Reaction of pepper accessions to cochineal (Orthezia spp.) attackSantos, M. A. C ; Santos, A. S ; Batista, J. L ; Rego, M. M ; Rego, E. R ; Dietrich, O. H. SActa horticulturae, 2015 (1087), p.467-472 [Periódico revisado por pares]International Society for Horticultural ScienceTexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Optical profilometer using laser based conical triangulation for inspection of inner geometry of corroded pipes in cylindrical coordinatesBuschinelli, Pedro D. V ; Melo, João Ricardo C ; Albertazzi, Armando ; Santos, João M. C ; Camerini, Claudio S Albertazzi, Armando ; Osten, Wolfgang ; Lehmann, Peter HProceedings of SPIE, the international society for optical engineering, 2013, Vol.8788, p.87881H-87881H-10SPIESem texto completo |