Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Max Ernst dream and revolutionKirsten Degel; Iris Müller-Westermann; Werner Spies; Julia Drost; Ludger Derenthal; Louisiana Museum (Humlebaek); Moderna Museet (Stockholm)Ostfildern Hatje/Cantz 2008Localização: MAC - Museu de Arte Contemporânea (759.0663 E71d )(Acessar) |
2 |
Material Type: Artigo
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Scaling from eDNA to biomass: controlling allometric relationships improves precision in bycatch estimationUrban, P ; Bekkevold, D ; Degel, H ; Hansen, B K ; Jacobsen, M W ; Nielsen, A ; Nielsen, E E Miller-Saunders, KristiICES journal of marine science, 2023-05, Vol.80 (4), p.1066-1078 [Periódico revisado por pares]Oxford University PressTexto completo disponível |
3 |
Material Type: Artigo
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Patient Empowerment Improved Perioperative Quality of Care in Cancer Patients Aged ≥ 65 Years - A Randomized Controlled TrialSchmidt, Maren ; Eckardt, Rahel ; Scholtz, Kathrin ; Neuner, Bruno ; von Dossow-Hanfstingl, Vera ; Sehouli, Jalid ; Stief, Christian G ; Wernecke, Klaus-Dieter ; Spies, Claudia D Bruns, HelgePloS one, 2015-09, Vol.10 (9), p.e0137824-e0137824 [Periódico revisado por pares]United States: Public Library of ScienceTexto completo disponível |
4 |
Material Type: Artigo
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Risk factors for 30‐day complications after cancer surgery in geriatric patients: a secondary analysisScholtz, K. ; Spies, C. D. ; Mörgeli, R. ; Eckardt, R. ; Dossow, V. ; Braun, S. ; Sehouli, J. ; Bahra, M. ; Stief, C. G. ; Wernecke, K.‐D. ; Schmidt, M. ; Weiß‐Gerlach, Edith ; Al‐Hashem, Anwar ; Brinkmann, Frederik ; Collette, Anna‐Maria ; Degel, Franziska ; Beukelaer, Frederic ; Geue, Susanne ; Hartmann, Kerstin ; Hennig, Saskia ; Hoffmann, Inga ; Mohr, Oskar ; Petrov, GeorgiActa anaesthesiologica Scandinavica, 2018-04, Vol.62 (4), p.451-463 [Periódico revisado por pares]England: Wiley Subscription Services, IncTexto completo disponível |
5 |
Material Type: Artigo
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Cell specific ultrasound effects are dose and frequency dependentSchuster, A. ; Schwab, T. ; Bischof, M. ; Klotz, M. ; Lemor, R. ; Degel, C. ; Schäfer, K.-H.Annals of anatomy, 2013-01, Vol.195 (1), p.57-67 [Periódico revisado por pares]Germany: Elsevier GmbHTexto completo disponível |
6 |
Material Type: Artigo
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Variations in LA Volume Indexation Across Different Ethnicities in Healthy Subjects With Normal Body Mass Index (BMI)Ferkh, A. ; Pathan, F. ; Kizana, E. ; Singh, A. ; Singulane, C. ; Miyoshi, T. ; Prado, A. ; Addetia, K. ; Bellino, M. ; Daimon, M. ; Fajardo, P. ; Kasliwal, R. ; Kirkpatrick, J. ; Monaghan, M. ; Muraru, D. ; Ogunyankin, K. ; Park, S. ; Ronderos, R. ; Sadeghpour, A. ; Scalia, G. ; Takeuchi, M. ; Tsang, W. ; Tucay, E. ; Rodrigues, A. ; Vivekanandan, A. ; Zhang, Y. ; Schreckenberg, M. ; Blankenhagen, M. ; Degel, M. ; Hitschrich, N. ; Asch, F. ; Lang, R. ; Thomas, L.Heart, lung & circulation, 2022, Vol.31, p.S189-S190 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
7 |
Material Type: Ata de Congresso
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Performance results from the Zeiss/NaWoTec MeRit MG electron beam mask repair toolEdinger, Klaus ; Boegli, Volker ; Degel, WolfgangProc. SPIE, 2005, Vol.5853, p.361-370SPIETexto completo disponível |
8 |
Material Type: Artigo
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Advanced Low Energy Focused Ion Beam Design Based on Immersion OpticsRauscher, M ; Marianowski, K ; Degel, B ; Plies, EMicroscopy and microanalysis, 2007-09, Vol.13 (S03), p.14-15 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
9 |
Material Type: Artigo
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Limitations to low-voltage focused ion beam operationRauscher, Michael ; Marianowski, Karin ; Degel, Bernhard ; Plies, ErichMicroelectronic engineering, 2006-04, Vol.83 (4), p.815-818 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
10 |
Material Type: Ata de Congresso
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Image performance and mask characterization of 157-nm alternating phase-shifting maskChen, Yung-Tin ; Meute, Jeff ; Dean, Kim R ; Stark, David R ; Schilz, Christof M ; Dettmann, Wolfgang ; Koehle, Roderick ; Schiessl, Bettina ; Degel, WolfgangProceedings of SPIE, 2003, Vol.5040, p.618-628SPIETexto completo disponível |