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1
Enhancing the corrosion resistance of aluminum by superhydrophobic silane/graphene oxide coating
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Enhancing the corrosion resistance of aluminum by superhydrophobic silane/graphene oxide coating

Du, X. Q. ; Liu, Y. W. ; Chen, Y.

Applied physics. A, Materials science & processing, 2021-08, Vol.127 (8), Article 580 [Periódico revisado por pares]

Berlin/Heidelberg: Springer Berlin Heidelberg

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2
Mechanical control of electrocaloric response in epitaxial ferroelectric thin films
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Mechanical control of electrocaloric response in epitaxial ferroelectric thin films

Shan, D.L. ; Lei, C.H. ; Cai, Y.C. ; Pan, K. ; Liu, Y.Y.

International journal of solids and structures, 2021-05, Vol.216, p.59-67 [Periódico revisado por pares]

New York: Elsevier Ltd

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3
Finite element simulation for estimating the mechanical properties of multi-walled carbon nanotubes
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Finite element simulation for estimating the mechanical properties of multi-walled carbon nanotubes

Fan, C. W. ; Liu, Y. Y. ; Hwu, Chyanbin

Applied physics. A, Materials science & processing, 2009-06, Vol.95 (3), p.819-831 [Periódico revisado por pares]

Berlin/Heidelberg: Springer-Verlag

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4
Frequency Veering of Rotating Metal Porous Twisted Plate with Cantilever Boundary Using Shell Theory
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Frequency Veering of Rotating Metal Porous Twisted Plate with Cantilever Boundary Using Shell Theory

Liu, Y. Y. ; Hao, Y. X. ; Zhang, W. ; Liu, L. T. ; Yang, S. W. ; Cao, Y. T.

Acta mechanica solida Sinica, 2022-04, Vol.35 (2), p.282-302 [Periódico revisado por pares]

Singapore: Springer Singapore

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5
Instability-induced wrinkling in thermoelectric thin film/substrate structures for thermal protection systems in supersonic space shuttle applications
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Instability-induced wrinkling in thermoelectric thin film/substrate structures for thermal protection systems in supersonic space shuttle applications

Liu, Y. ; Wang, K. F. ; Wang, B. L.

Mechanics of advanced materials and structures, 2020-03, Vol.27 (6), p.455-461 [Periódico revisado por pares]

Abingdon: Taylor & Francis

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6
Light Output Enhancement of Near UV-LED by Using Ti-Doped ITO Transparent Conducting Layer
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Light Output Enhancement of Near UV-LED by Using Ti-Doped ITO Transparent Conducting Layer

Yung Hsun Lin ; Liu, Y S ; Liu, C Y

IEEE photonics technology letters, 2010-10, Vol.22 (19), p.1443-1445

New York: IEEE

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7
Enhancement of the Dzyaloshinskii-Moriya interaction and domain wall velocity through interface intermixing in Ta/CoFeB/MgO
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Enhancement of the Dzyaloshinskii-Moriya interaction and domain wall velocity through interface intermixing in Ta/CoFeB/MgO

Diez, L. Herrera ; Voto, M. ; Casiraghi, A. ; Belmeguenai, M. ; Roussigné, Y. ; Durin, G. ; Lamperti, A. ; Mantovan, R. ; Sluka, V. ; Jeudy, V. ; Liu, Y. T. ; Stashkevich, A. ; Chérif, S. M. ; Langer, J. ; Ocker, B. ; Lopez-Diaz, L. ; Ravelosona, D.

Physical review. B, 2019-02, Vol.99 (5), p.054431, Article 054431 [Periódico revisado por pares]

College Park: American Physical Society

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8
Analysis of Glasses Coated with Zn–Cr–Sn–O Thin Films by Picosecond Laser-Induced Breakdown Spectroscopy and Transmission Spectroscopy
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Analysis of Glasses Coated with Zn–Cr–Sn–O Thin Films by Picosecond Laser-Induced Breakdown Spectroscopy and Transmission Spectroscopy

Gao, Q. ; Liu, Sh ; Xiu, J. ; Li, Zh ; Liu, Y. ; Liu, H.

Journal of applied spectroscopy, 2021-11, Vol.88 (5), p.1054-1060 [Periódico revisado por pares]

New York: Springer US

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9
Effect of temperature on the growth of a-axis ZnO films: a reactive force field-based molecular dynamics study
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Effect of temperature on the growth of a-axis ZnO films: a reactive force field-based molecular dynamics study

Liu, Y.L. ; Dong, C.H. ; Sun, B.Z. ; Qi, Y.

Journal of materials research, 2017-02, Vol.32 (3), p.522-529 [Periódico revisado por pares]

New York, USA: Cambridge University Press

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10
Angular distribution of hybridization in sputtered carbon thin film
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Angular distribution of hybridization in sputtered carbon thin film

Liu, Y. ; Wang, H. ; Wei, Z. C.

AIP advances, 2017-08, Vol.7 (8), p.085303-085303-6 [Periódico revisado por pares]

Melville: American Institute of Physics

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