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Porous aluminum-based DUT metal-organic frameworks for the transformation of CO2 into cyclic carbonates: A computationally supported study
Porous aluminum-based DUT metal-organic frameworks for the transformation of CO2 into cyclic carbonates: A computationally supported study
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Porous aluminum-based DUT metal-organic frameworks for the transformation of CO2 into cyclic carbonates: A computationally supported study

Kurisingal, Jintu Francis ; Li, Yixin ; Sagynbayeva, Yryskul ; Chitumalla, Ramesh Kumar ; Vuppala, Srimai ; Rachuri, Yadagiri ; Gu, Yunjang ; Jang, Joonkyung ; Park, Dae-Won

Catalysis today, 2020-08, Vol.352, p.227-236 [Periódico revisado por pares]

Elsevier B.V

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A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection
A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection
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A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection

Liu, Rui ; Li, Hao ; Yang, Zhao ; Wang, Guantao ; Chen, Zefu ; Zhang, Peiyong

IEEE transactions on semiconductor manufacturing, 2024-05, Vol.37 (2), p.146-151 [Periódico revisado por pares]

New York: IEEE

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3
An equivalent surface dipoles based source reconstruction for estimating radiated emissions numerically from shielded PCBs
An equivalent surface dipoles based source reconstruction for estimating radiated emissions numerically from shielded PCBs
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An equivalent surface dipoles based source reconstruction for estimating radiated emissions numerically from shielded PCBs

Binda, Pankaj ; Singh, Akshay Pratap ; Singh, Kuldeep ; Mitharwal, Rajendra

International journal of electronics and communications, 2022-12, Vol.157, p.154407, Article 154407 [Periódico revisado por pares]

Elsevier GmbH

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4
Intrusive FPGA-in-the-loop debugging using a rule-based inference system
Intrusive FPGA-in-the-loop debugging using a rule-based inference system
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Intrusive FPGA-in-the-loop debugging using a rule-based inference system

Khan, Habib ul Hasan ; Podlubne, Ariel ; Göhringer, Diana

Microprocessors and microsystems, 2019-02, Vol.64, p.185-194 [Periódico revisado por pares]

Kidlington: Elsevier B.V

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5
Probe-compensated fast hybrid antenna testing
Probe-compensated fast hybrid antenna testing
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Probe-compensated fast hybrid antenna testing

Giordanengo, Giorgio ; Righero, Marco ; Araque Quijano, Javier Leonardo ; Vipiana, Francesca ; Vecchi, Giuseppe

IET microwaves, antennas & propagation, 2017-09, Vol.11 (12), p.1687-1694 [Periódico revisado por pares]

The Institution of Engineering and Technology

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6
FPGA-based fault injection design for 16K-point FFT processor
FPGA-based fault injection design for 16K-point FFT processor
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FPGA-based fault injection design for 16K-point FFT processor

Mao, Chuang-An ; Xie, Yu ; Wei, Xin ; Xie, Yi-Zhuang ; Chen, He

Journal of engineering (Stevenage, England), 2019-11, Vol.2019 (21), p.7994-7997 [Periódico revisado por pares]

The Institution of Engineering and Technology

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7
Ultra Wideband Microwave Ten-Port Reflectometer
Ultra Wideband Microwave Ten-Port Reflectometer
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Ultra Wideband Microwave Ten-Port Reflectometer

Askarian, Amirhossein ; Moradi, Gholamreza

Applied Computational Electromagnetics Society journal, 2015-01, Vol.30 (1), p.61

Pisa: River Publishers

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8
Contactless radio frequency probes for high-temperature characterisation of microwave integrated circuits
Contactless radio frequency probes for high-temperature characterisation of microwave integrated circuits
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Contactless radio frequency probes for high-temperature characterisation of microwave integrated circuits

Jordan, J.L ; Simons, R.N ; Zorman, C.A

Electronics letters, 2014-05, Vol.50 (11), p.817-819 [Periódico revisado por pares]

Stevenage: The Institution of Engineering and Technology

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9
An Ultra-High-Speed Test Module and FPGA-Based Development Platform
An Ultra-High-Speed Test Module and FPGA-Based Development Platform
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An Ultra-High-Speed Test Module and FPGA-Based Development Platform

Chen, Te-Hui ; Keezer, David C.

2016 IEEE 25th Asian Test Symposium (ATS), 2016, p.269-274

IEEE

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10
Rana grylio virus TK and DUT gene locus could be simultaneously used for foreign gene expression
Rana grylio virus TK and DUT gene locus could be simultaneously used for foreign gene expression
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Rana grylio virus TK and DUT gene locus could be simultaneously used for foreign gene expression

Huang, Xing ; Fang, Jin ; Chen, Zhongyuan ; Zhang, Qiya

Virus research, 2016-03, Vol.214, p.33-38 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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