Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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A documentation framework for architecture decisionsvan Heesch, U. ; Avgeriou, P. ; Hilliard, R.The Journal of systems and software, 2012-04, Vol.85 (4), p.795-820 [Periódico revisado por pares]New York: Elsevier IncTexto completo disponível |
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2 |
Material Type: Artigo
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Does decision documentation help junior designers rationalize their decisions? A comparative multiple-case studyvan Heesch, U. ; Avgeriou, P. ; Tang, A.The Journal of systems and software, 2013-06, Vol.86 (6), p.1545-1565 [Periódico revisado por pares]New York: Elsevier IncTexto completo disponível |
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3 |
Material Type: Artigo
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Platform design space exploration using architecture decision viewpoints–A longitudinal studyvan Heesch, U. ; Jansen, A. ; Pei-Breivold, H. ; Avgeriou, P. ; Manteuffel, C.The Journal of systems and software, 2017-02, Vol.124, p.56-81 [Periódico revisado por pares]Elsevier IncTexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Software Specification and Documentation in Continuous Software Development: A Focus Group ReportVan Heesch, U. ; Theunissen, T. ; Zimmermann, O. ; Zdun, U.Proceedings of the 22nd European Conference on Pattern Languages of Programs, 2017, p.1-13New York, NY, USA: ACMTexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Forces on Architecture Decisions - A Viewpointvan Heesch, U. ; Avgeriou, P. ; Hilliard, R.2012 Joint Working IEEE/IFIP Conference on Software Architecture and European Conference on Software Architecture, 2012, p.101-110IEEETexto completo disponível |
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6 |
Material Type: Ata de Congresso
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The Disappearance of Technical Specifications in Web and Mobile Applications: A Survey Among ProfessionalsTheunissen, Theo ; van Heesch, UweSoftware Architecture, p.265-273 [Periódico revisado por pares]Cham: Springer International PublishingTexto completo disponível |
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7 |
Material Type: Artigo
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Spatiotemporally resolved imaging of streamer discharges in air generated in a wire-cylinder reactor with (sub)nanosecond voltage pulsesHuiskamp, T ; Sengers, W ; Beckers, F J C M ; Nijdam, S ; Ebert, U ; Heesch, E J M van ; Pemen, A J MPlasma sources science & technology, 2017-07, Vol.26 (7), p.75009 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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8 |
Material Type: Artigo
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Numerical and experimental investigation of dielectric recovery in supercritical N2Zhang, J ; Markosyan, A H ; Seeger, M ; van Veldhuizen, E M ; van Heesch, E J M ; Ebert, UPlasma sources science & technology, 2015-04, Vol.24 (2) [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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9 |
Material Type: Artigo
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Numerical and experimental investigation of dielectric recovery in supercritical N 2Zhang, J ; Markosyan, A H ; Seeger, M ; van Veldhuizen, E M ; van Heesch, E J M ; Ebert, UPlasma sources science & technology, 2015-04, Vol.24 (2), p.25008 [Periódico revisado por pares]Texto completo disponível |
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10 |
Material Type: Artigo
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Numerical and experimental investigation of dielectric recovery in supercritical N sub(2)Zhang, J ; Markosyan, A H ; Seeger, M ; van Veldhuizen, E M ; van Heesch, E J M ; Ebert, UPlasma sources science & technology, 2015-04, Vol.24 (2), p.1-16 [Periódico revisado por pares]Texto completo disponível |