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Refinado por: Base de dados/Biblioteca: NASA Technical Reports Server remover
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Modeling and Mitigation of Multi-Loops Related Device Overvoltage in Three Level Active Neutral Point Clamped Converter
Modeling and Mitigation of Multi-Loops Related Device Overvoltage in Three Level Active Neutral Point Clamped Converter
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Modeling and Mitigation of Multi-Loops Related Device Overvoltage in Three Level Active Neutral Point Clamped Converter

Gui, Handong ; Chen, Ruirui ; Zhang, Zheyu ; Niu, Jiahao ; Ren, Ren ; Liu, Bo ; Tolbert, Leon M. ; Wang, Fei (Fred) ; Costinett, Daniel ; Blalock, Benjamin J. ; Choi, Benjamin B.

IEEE transactions on power electronics, 2019-12, Vol.35 (8) [Periódico revisado por pares]

Glenn Research Center: Institute of Electrical and Electronics Engineers

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2
Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence
Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence
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Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence

Javanainen, Arto ; Galloway, Kenneth F. ; Nicklaw, Christopher ; Bosser, Alexandre L. ; Ferlet-Cavrois, Veronique ; Lauenstein, Jean-Marie ; Pintacuda, Francesco ; Reed, Robert A. ; Schrimpf, Ronald D. ; Weller, Robert A. ; Virtanen, Ari Juha

IEEE transactions on nuclear science, 2016-10, Vol.64 (1) [Periódico revisado por pares]

Goddard Space Flight Center

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3
Threats to Resiliency of Redundant Systems Due to Destructive SEE
Threats to Resiliency of Redundant Systems Due to Destructive SEE
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Threats to Resiliency of Redundant Systems Due to Destructive SEE

Ladbury, R. ; Bay, Michael ; Zinchuk, Jeff

Goddard Space Flight Center: NASA 2020

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4
High-speed wide-angle interleaved scanning technique for a 3D imaging lidar
High-speed wide-angle interleaved scanning technique for a 3D imaging lidar
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High-speed wide-angle interleaved scanning technique for a 3D imaging lidar

Prasad, Narasimha S. ; Mylapore, Anand R.

Journal of the Optical Society of America. B, Optical physics, 2021-10, Vol.38 (10) [Periódico revisado por pares]

Langley Research Center: Optical Society of America

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5
Development of TID Hardness Assurance Methodologies to Capitalize on Statistical Radiation Environment Models
Development of TID Hardness Assurance Methodologies to Capitalize on Statistical Radiation Environment Models
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Development of TID Hardness Assurance Methodologies to Capitalize on Statistical Radiation Environment Models

Ladbury, R. ; Carstens, Thomas

Goddard Space Flight Center: Institute of Electrical and Electronics Engineers 2020

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6
A Critical Look at Coulomb Counting Approach for State of Charge Estimation in Batteries
A Critical Look at Coulomb Counting Approach for State of Charge Estimation in Batteries
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A Critical Look at Coulomb Counting Approach for State of Charge Estimation in Batteries

Movassagh, Kiarash ; Raihan, Arif ; Balasingam, Balakumar ; Pattipati, Krishna

Energies (Basel), 2021-07, Vol.14 (14), p.4074 [Periódico revisado por pares]

2230 Support: MDPI

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7
Tunable Pseudocapacitive Intercalation of Chloroaluminate Anions into Graphite Electrodes for Rechargeable Aluminum Batteries
Tunable Pseudocapacitive Intercalation of Chloroaluminate Anions into Graphite Electrodes for Rechargeable Aluminum Batteries
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Tunable Pseudocapacitive Intercalation of Chloroaluminate Anions into Graphite Electrodes for Rechargeable Aluminum Batteries

Xu, Jeffrey H. ; Schoetz, Theresa ; McManus, Joseph R. ; Subramanian, Vikesh R. ; Fields, Peter W. ; Messinger, Robert J.

Journal of the Electrochemical Society, 2021-06, Vol.168 (6), p.60514 [Periódico revisado por pares]

2230 Support: IOP Publishing

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8
The Promise of Alloy Anodes for Solid-State Batteries
The Promise of Alloy Anodes for Solid-State Batteries
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The Promise of Alloy Anodes for Solid-State Batteries

Lewis, John A ; Cavallaro, Kelsey A ; Liu, Yuhgene ; McDowell, Matthew T

Joule, 2022-07, Vol.6 (7) [Periódico revisado por pares]

2230 Support: Elsevier

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9
Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory
Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory
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Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

Chen, Dakai ; Wilcox, Edward ; Ladbury, Raymond L. ; Kim, Hak ; Phan, Anthony ; Seidleck, Christina ; Label, Kenneth

IEEE transactions on nuclear science, 2016-10, Vol.64 (1) [Periódico revisado por pares]

Goddard Space Flight Center: Electrical and Electronics Engineers (IEEE)

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10
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory
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Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory

Chen, Dakai ; Wilcox, Edward ; Ladbury, Raymond ; Seidleck, Christina ; Kim, Hak ; Phan, Anthony ; Label, Kenneth

IEEE transactions on nuclear science, 2017-10, Vol.65 (1) [Periódico revisado por pares]

Goddard Space Flight Center: IEEE

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