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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artículo
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Calibration of a fugitive emission rate measurement of an area sourceWong, Colin L. Y. ; Ramkellawan, JeffreyJournal of the Air & Waste Management Association (1995), 2013-11, Vol.63 (11), p.1324-1334 [Revista revisada por pares]Pittsburgh, PA: Taylor & FrancisTexto completo disponible |
| 2 |
Material Type: Artículo
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Coating NiTi archwires with diamond-like carbon films: reducing fluoride-induced corrosion and improving frictional propertiesHuang, S. Y. ; Huang, J. J. ; Kang, T. ; Diao, D. F. ; Duan, Y. Z.Journal of materials science. Materials in medicine, 2013-10, Vol.24 (10), p.2287-2292 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
| 3 |
Material Type: Artículo
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Absorption enhancement of near infrared in Te doped nanoporous siliconSu, Yuanjie ; Zhang, Peng ; Jiang, Jing ; Li, Shibin ; Wu, Zhiming ; Jiang, YadongJournal of materials science. Materials in electronics, 2013-07, Vol.24 (7), p.2197-2201 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
| 4 |
Material Type: Artículo
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Growth behaviors and characteristics of low temperature spin-sprayed ZnO and Al-doped ZnO microstructuresObi, Ogheneyunume ; Zhou, Ziyao ; Beghun, Shawn ; Nan, Tianxiang ; Stoute, Stephen ; Liu, Ming ; Lou, Jing ; Yang, Xi ; Gao, Yuan ; Li, Ming ; Xing, Xing ; Sun, Nian X. ; Warzywoda, Juliusz ; Sacco, Albert ; Guo, Ting ; Nan, CewenJournal of materials science. Materials in electronics, 2013-06, Vol.24 (6), p.2058-2066 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
| 5 |
Material Type: Artículo
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The capacitance–voltage measurement of the screen-printed silicon solar cells with electrochemically etched nanostructured porous silicon antireflection coatingVinod, P. NarayananJournal of materials science. Materials in electronics, 2013-04, Vol.24 (4), p.1395-1404 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
| 6 |
Material Type: Artículo
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Influence of tungsten particles on the electrical properties of AlN ceramicMa, Huina ; Yang, Zhimin ; Du, JunJournal of materials science. Materials in electronics, 2012-12, Vol.23 (12), p.2181-2185 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
| 7 |
Material Type: Artículo
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Mechanical characterization of glass–ceramics substrate with embedded microstructureHORVATH, Eszter ; HENAP, Gábor ; TÖRÖK, Adám ; HARSANYI, GáborJournal of materials science. Materials in electronics, 2012-12, Vol.23 (12), p.2123-2129 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
| 8 |
Material Type: Artículo
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Low mechanical pressure during electrochemical etching: induced modification in optical and structural properties of n-type porous siliconNaddaf, M.Journal of materials science. Materials in electronics, 2012-12, Vol.23 (12), p.2173-2180 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
| 9 |
Material Type: magazinearticle
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Atomic dielectric resonance scanning takes to the seasSTOVE, GordonOffshore (Conroe, Tex.), 2011-11, Vol.71 (11), p.100-102Tulsa, OK: PennwellTexto completo disponible |
| 10 |
Material Type: Artículo
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Structure and electrical properties of CuAlO2 thin films derived by sol–gel processingLiu, Si-Jia ; Wang, Hua ; Xu, Ji-Wen ; Ren, Ming-Fang ; Yang, Ling ; Ju, Jin-HuaJournal of materials science. Materials in electronics, 2011-06, Vol.22 (6), p.666-671 [Revista revisada por pares]Boston: Springer USTexto completo disponible |
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