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Material Type: Artigo
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Statistical modeling of epitaxial thin films of an intrinsic antiferromagnetic topological insulatorRafaela Felix da Silva Penacchio Celso I Fornari; Yorí G Camillo; Philipp Kagerer; Sebastian Buchberger; Martin Kamp; Hendrik Bentmann; Friedrich Reinert; Sergio Luiz MorelhãoThin Solid Films Amsterdam: Elsevier, 2022 v. 750, 31 de maio de 2022, número do artigo: 139183Amsterdam 2022Item não circula. Consulte sua biblioteca.(Acessar) |
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Material Type: Artigo
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Molecular beam epitaxy of antiferromagnetic (MnBi2Te4)(Bi2Te3) thin films on BaF2 (111)Philipp Kagerer Celso Israel Fornari; S Buchberger; Sergio L Morelhao https://orcid.org/0000-0003-1643-0948; R. C Vidal; Abdul-Vakhab Tcakaev; V Zabolotnyy; E Weschke; Vladimir Hinkov; Martin Kamp; B Büchner; Anna Isaeva; H Bentmann; F ReinertJournal of Applied Physics Maryland: AIP-American Institute of Physics, 2020 v. 128, n. 13, número do artigo: 135303, 05 outubro 2020, onlineMaryland 2020Item não circula. Consulte sua biblioteca.(Acessar) |
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Material Type: Artigo
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Momentum-space signatures of Berry flux monopoles in the Weyl semimetal TaAsÜnzelmann, M. ; Bentmann, H. ; Figgemeier, T. ; Eck, P. ; Neu, J. N. ; Geldiyev, B. ; Diekmann, F. ; Rohlf, S. ; Buck, J. ; Hoesch, M. ; Kalläne, M. ; Rossnagel, K. ; Thomale, R. ; Siegrist, T. ; Sangiovanni, G. ; Sante, D. Di ; Reinert, F.Nature communications, 2021-06, Vol.12 (1), p.3650-3650, Article 3650 [Periódico revisado por pares]London: Nature Publishing GroupTexto completo disponível |
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Material Type: Artigo
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Strong Linear Dichroism in Spin-Polarized Photoemission from Spin-Orbit-Coupled Surface StatesBentmann, H ; Maaß, H ; Krasovskii, E E ; Peixoto, T R F ; Seibel, C ; Leandersson, M ; Balasubramanian, T ; Reinert, FPhysical review letters, 2017-09, Vol.119 (10), p.106401-106401, Article 106401 [Periódico revisado por pares]United StatesTexto completo disponível |
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Material Type: Artigo
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Orbital Complexity in Intrinsic Magnetic Topological Insulators MnBi4Te7 and MnBi6Te10Vidal, R C ; Bentmann, H ; Facio, J I ; Heider, T ; Kagerer, P ; nari, C I ; Peixoto, T R F ; Figgemeier, T ; Jung, S ; Cacho, C ; Büchner, B ; van den Brink, J ; Schneider, C M ; Plucinski, L ; Schwier, E F ; Shimada, K ; Richter, M ; Isaeva, A ; Reinert, FPhysical review letters, 2021-04, Vol.126 (17), p.1 [Periódico revisado por pares]College Park: American Physical SocietyTexto completo disponível |
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Material Type: Artigo
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Assessing Nontrivial Topology in Weyl Semimetals by Dichroic PhotoemissionSchusser, J ; Bentmann, H ; Ünzelmann, M ; Figgemeier, T ; Min, C-H ; Moser, S ; Neu, J N ; Siegrist, T ; Reinert, FPhysical review letters, 2022-12, Vol.129 (24), p.246404-246404, Article 246404 [Periódico revisado por pares]United States: American Physical Society (APS)Texto completo disponível |
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Material Type: Artigo
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Properties of topological crystalline insulator Pb0.5Sn0.5Te epitaxial films doped with bismuthKawata, B. A. ; Fornari, C. I. ; Kagerer, P. ; Heßdörfer, J. ; Bentmann, H. ; Reinert, F. ; Okazaki, A. K. ; Rappl, P. H. O. ; Abramof, E.Journal of applied physics, 2022-02, Vol.131 (8) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Structural, optical and electronic properties of the wide bandgap topological insulator Bi1.1Sb0.9Te2SKhatchenko, Yu E. ; Yakushev, M.V. ; Seibel, C. ; Bentmann, H. ; Orlita, M. ; Golyashov, V. ; Ponosov, Y.S. ; Stepina, N.P. ; Mudriy, A.V. ; Kokh, K.A. ; Tereshchenko, O.E. ; Reinert, F. ; Martin, R.W. ; Kuznetsova, T.V.Journal of alloys and compounds, 2022-01, Vol.890, p.161824, Article 161824 [Periódico revisado por pares]Lausanne: Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Origin and manipulation of the Rashba splitting in surface alloysBentmann, H ; Forster, F ; Bihlmayer, G ; Chulkov, E. V ; Moreschini, L ; Grioni, M ; Reinert, FEurophysics letters, 2009-08, Vol.87 (3), p.37003-37003p6 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Electronic structure and morphology of epitaxial Bi2Te2Se topological insulator filmsMaaß, H. ; Schreyeck, S. ; Schatz, S. ; Fiedler, S. ; Seibel, C. ; Lutz, P. ; Karczewski, G. ; Bentmann, H. ; Gould, C. ; Brunner, K. ; Molenkamp, L. W. ; Reinert, F.Journal of applied physics, 2014-11, Vol.116 (19) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |