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1
Characterization and metrology for ULSI technology 2005, Richardson, Texas, 15-18 March 2005
Characterization and metrology for ULSI technology 2005, Richardson, Texas, 15-18 March 2005
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Characterization and metrology for ULSI technology 2005, Richardson, Texas, 15-18 March 2005

International Conference on Characterization and Metrology for ULSI Technology (5th : 2005 : Richardson, Tex.) David G Seiler; National Institute of Standards and Technology (U.S.)

Melville, N.Y. : American Institute of Physics 2005

Localização: IF - Instituto de Física    (CR282 ) e outros locais(Acessar)

2
Physics and Chemistry of Mercury Cadmium Telluride and novel IR detector materials San Francisco, CA 1990
Physics and Chemistry of Mercury Cadmium Telluride and novel IR detector materials San Francisco, CA 1990
Material Type:
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Physics and Chemistry of Mercury Cadmium Telluride and novel IR detector materials San Francisco, CA 1990

David G Seiler; American Institute of Physics; American Vacuum Society; U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Novel Infrared Detector Materials (9th 1990 San Francisco, Calif.)

New York American Institute of Physics c1991

Localização: IF - Instituto de Física    (MS AIP v.235 ) e outros locais(Acessar)

3
Physics and chemistry of mercury cadmium telluride and novel IR detector materials
Physics and chemistry of mercury cadmium telluride and novel IR detector materials
Material Type:
Livro 		Adicionar ao Meu Espaço

Physics and chemistry of mercury cadmium telluride and novel IR detector materials

U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Novel Infrared Detector Materials 1990 San Francisco David G Seiler

Lucovsky, Gerald, ed American Institute of Physics Conference Proceedings American Vacuum Society Series, 11 New York, AIP, 1972-

New York AIP c1991

Localização: IFSC - Inst. Física de São Carlos    (P530 A512 n.235 )(Acessar)

4
Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, Maryland, 27-29 March 2007
Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, Maryland, 27-29 March 2007
Material Type:
Livro 		Adicionar ao Meu Espaço

Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, Maryland, 27-29 March 2007

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 : Gaithersburg, Md.) David G Seiler; National Institute of Standards and Technology (U.S.)

Melville, N. Y. : American Institute of Physics 2007

Acesso online. A biblioteca também possui exemplares impressos.

5
Spectroscopy of Semiconductors
Spectroscopy of Semiconductors
Material Type:
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Spectroscopy of Semiconductors

Robert K. Willardson Albert C Beer; Albert Carl Beer; C. L Littler; Christopher L Littler; David G Seiler; Eicke R Weber; Robert Kent Willardson; R. K Willardson

Elsevier 1992

Acesso online

6
Semiconductors and semimetals the spectroscopy of semiconductors
Semiconductors and semimetals the spectroscopy of semiconductors
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Semiconductors and semimetals the spectroscopy of semiconductors

Robert K Willardson Albert C Beer; Eicke R Weber

Boston Academic 1992

Localização: IF - Instituto de Física    (MS SS v.36 )(Acessar)

7
Frontiers of characterization and metrology for nanoelectronics 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007
Material Type:
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Frontiers of characterization and metrology for nanoelectronics 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 : Gaithersburg, Md.)

Melville, N. Y. : AIP Conference Proceedings 2007

Localização: IF - Instituto de Física    (CR355 )(Acessar)

8
Can you get what you pay for?
Can you get what you pay for?
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Can you get what you pay for?

Antônio Delfim Netto 1928-

S.l. s.n. 200-

Localização: FEA - Fac. Econ. Adm. Contab. e Atuária  ACERVO DELFIM NETTO  (C8.5.10 )(Acessar)

9
Molecular beam epitaxy growth and structure of self-assembled Bi2Se3/Bi2MnSe4 multilayer heterostructures
Molecular beam epitaxy growth and structure of self-assembled Bi2Se3/Bi2MnSe4 multilayer heterostructures
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Molecular beam epitaxy growth and structure of self-assembled Bi2Se3/Bi2MnSe4 multilayer heterostructures

Hagmann, Joseph A ; Li, Xiang ; Chowdhury, Sugata ; Dong, Si-Ning ; Rouvimov, Sergei ; Pookpanratana, Sujitra J ; Man Yu, Kin ; Orlova, Tatyana A ; Bolin, Trudy B ; Segre, Carlo U ; Seiler, David G ; Richter, Curt A ; Liu, Xinyu ; Dobrowolska, Margaret ; Furdyna, Jacek K

New journal of physics, 2017-08, Vol.19 (8), p.085002 [Periódico revisado por pares]

Bristol: IOP Publishing

Texto completo disponível

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10
Interacting nanoscale magnetic superatom cluster arrays in molybdenum oxide bronzes
Interacting nanoscale magnetic superatom cluster arrays in molybdenum oxide bronzes
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Interacting nanoscale magnetic superatom cluster arrays in molybdenum oxide bronzes

Hagmann, Joseph A ; Le, Son T ; Schneemeyer, Lynn F ; Stroscio, Joseph A ; Besara, Tiglet ; Sun, Jifeng ; Singh, David J ; Siegrist, Theo ; Seiler, David G ; Richter, Curt A

Nanoscale, 2017-06, Vol.9 (23), p.7922-7929 [Periódico revisado por pares]

England

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