Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
Beamline P02.1 at PETRA III for high-resolution and high-energy powder diffractionDippel, Ann-Christin ; Liermann, Hanns-Peter ; Delitz, Jan Torben ; Walter, Peter ; Schulte-Schrepping, Horst ; Seeck, Oliver H. ; Franz, HermannJournal of synchrotron radiation, 2015-05, Vol.22 (3), p.675-687 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
|
2 |
Material Type: Artigo
|
PETRA IV: the ultralow‐emittance source project at DESYSchroer, Christian G. ; Agapov, Ilya ; Brefeld, Werner ; Brinkmann, Reinhard ; Chae, Yong-Chul ; Chao, Hung-Chun ; Eriksson, Mikael ; Keil, Joachim ; Nuel Gavaldà, Xavier ; Röhlsberger, Ralf ; Seeck, Oliver H. ; Sprung, Michael ; Tischer, Markus ; Wanzenberg, Rainer ; Weckert, EdgarJournal of synchrotron radiation, 2018-09, Vol.25 (5), p.1277-1290 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
|
3 |
Material Type: Artigo
|
Quantized Self-Assembly of Discotic Rings in a Liquid Crystal Confined in NanoporesSentker, Kathrin ; Zantop, Arne W ; Lippmann, Milena ; Hofmann, Tommy ; Seeck, Oliver H ; Kityk, Andriy V ; Yildirim, Arda ; Schönhals, Andreas ; Mazza, Marco G ; Huber, PatrickPhysical review letters, 2018-02, Vol.120 (6), p.067801-067801, Article 067801 [Periódico revisado por pares]United StatesTexto completo disponível |
|
4 |
Material Type: Livro
|
X-Ray Diffraction: Modern Experimental TechniquesSeeck, Oliver H ; Murphy, Bridget Seeck, Oliver H. ; Murphy, BridgetSingapore: Pan Stanford 2015Sem texto completo |
|
5 |
Material Type: Artigo
|
A new setup for high resolution fast X-ray reflectivity data acquisitionLippmann, Milena ; Buffet, Adeline ; Pflaum, Kathrin ; Ehnes, Anita ; Ciobanu, Anca ; Seeck, Oliver H.Review of scientific instruments, 2016-11, Vol.87 (11), p.113904-113904 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
|
6 |
Material Type: Artigo
|
Overview over Surface Sensitive X-Ray TechniquesSeeck, Oliver H.Synchrotron radiation news, 2024-05, Vol.37 (3), p.4-10 [Periódico revisado por pares]Abingdon: Taylor & Francis LtdSem texto completo |
|
7 |
Material Type: Artigo
|
A novel X-ray diffractometer for studies of liquid-liquid interfacesMurphy, Bridget M. ; Greve, Matthais ; Runge, Benjamin ; Koops, Christian T. ; Elsen, Annika ; Stettner, Jochim ; Seeck, Oliver H. ; Magnussen, Olaf M.Journal of synchrotron radiation, 2014-01, Vol.21 (1), p.45-56 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
|
8 |
Material Type: Artigo
|
In situ X-ray studies of adlayer-induced crystal nucleation at the liquid–liquid interfaceElsen, Annika ; Festersen, Sven ; Runge, Benjamin ; Koops, Christian T. ; Ocko, Benjamin M. ; Deutsch, Moshe ; Seeck, Oliver H. ; Murphy, Bridget M. ; Magnussen, Olaf M.Proceedings of the National Academy of Sciences - PNAS, 2013-04, Vol.110 (17), p.6663-6668 [Periódico revisado por pares]United States: National Academy of SciencesTexto completo disponível |
|
9 |
Material Type: Artigo
|
Orientation order of a nonpolar molecular fluid compressed into a nanosmall spaceWang, Dan ; Lippmann, Milena ; Gäding, Johannes ; Ehnes, Anita ; Novikov, Dmitri ; Meißner, Robert ; Seeck, Oliver HNanoscale, 2023-05, Vol.15 (17), p.819-828 [Periódico revisado por pares]England: Royal Society of ChemistryTexto completo disponível |
|
10 |
Material Type: Artigo
|
Culling a Self-Assembled Quantum Dot as a Single-Photon Source Using X‑ray MicroscopyDey, Arka Bikash ; Sanyal, Milan K. ; Schropp, Andreas ; Achilles, Silvio ; Keller, Thomas F. ; Farrer, Ian ; Ritchie, David A. ; Bertram, Florian ; Schroer, Christian G. ; Seeck, Oliver H.ACS nano, 2023-08, Vol.17 (16), p.16080-16088 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |