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1 |
Material Type: Artigo
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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipmentSalditt, T ; Metzger, T H ; Peisl, J ; Goerigk, GJournal of physics. D, Applied physics, 1995-04, Vol.28 (4A), p.A236-A240 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
2 |
Material Type: Artigo
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Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dotsMetzger, T H ; Kegel, I ; Paniago, R ; Peisl, JJournal of physics. D, Applied physics, 1999-05, Vol.32 (10A), p.A202-A207 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
3 |
Material Type: Artigo
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X-ray studies on self-organized wires in SiGe/Si multilayersRoch, T ; Holý, V ; Daniel, A ; Höflinger, E ; Meduna, M ; Metzger, T H ; Bauer, G ; Zhu, J ; Brunner, K ; Abstreiter, GJournal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A6-A10 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
4 |
Material Type: Artigo
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Experimental and theoretical comparison of Sb, As, and P diffusion mechanisms and doping in CdTeColegrove, E ; Yang, J-H ; Harvey, S P ; Young, M R ; Burst, J M ; Duenow, J N ; Albin, D S ; Wei, S-H ; Metzger, W KJournal of physics. D, Applied physics, 2018-01, Vol.51 (7), p.75102 [Periódico revisado por pares]United States: IOP PublishingTexto completo disponível |
5 |
Material Type: Artigo
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Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopyKOVATS, Z ; SALDITT, T ; METZGER, T. H ; PEISL, J ; STIMPEL, T ; LORENZ, H ; CHU, J. O ; ISMALL, KJournal of physics. D, Applied physics, 1999-02, Vol.32 (4), p.359-368 [Periódico revisado por pares]Bristol: Institute of PhysicsTexto completo disponível |
6 |
Material Type: Artigo
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The 2020 photovoltaic technologies roadmapWilson, Gregory M ; Al-Jassim, Mowafak ; Metzger, Wyatt K ; Glunz, Stefan W ; Verlinden, Pierre ; Xiong, Gang ; Mansfield, Lorelle M ; Stanbery, Billy J ; Zhu, Kai ; Yan, Yanfa ; Berry, Joseph J ; Ptak, Aaron J ; Dimroth, Frank ; Kayes, Brendan M ; Tamboli, Adele C ; Peibst, Robby ; Catchpole, Kylie ; Reese, Matthew O ; Klinga, Christopher S ; Denholm, Paul ; Morjaria, Mahesh ; Deceglie, Michael G ; Freeman, Janine M ; Mikofski, Mark A ; Jordan, Dirk C ; TamizhMani, Govindasamy ; Sulas-Kern, Dana BJournal of physics. D, Applied physics, 2020-12, Vol.53 (49), p.493001 [Periódico revisado por pares]United States: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Se diffusion in CdTe thin films for photovoltaicsColegrove, Eric ; Zheng, Xin ; Ablekim, Tursun ; Duenow, Joel N ; Perkins, Craig L ; Moutinho, Helio R ; Metzger, Wyatt KJournal of physics. D, Applied physics, 2021-01, Vol.54 (2), p.25501 [Periódico revisado por pares]United Kingdom: IOP PublishingTexto completo disponível |
8 |
Material Type: Artigo
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Hydrogenated graphene oxide (H-G-SiO 2 ) Janus structure: experimental and computational study of strong piezo-electricity responseBidmeshkipour, S ; Alidoosti, M ; Hosseinzadeh, A ; Seyyedi, S M S ; Elahi, M ; Pourfath, M ; Mohajerzadeh, SJournal of physics. D, Applied physics, 2020-04, Vol.53 (17), p.175303 [Periódico revisado por pares]Texto completo disponível |
9 |
Material Type: Artigo
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The hole transport mechanism of MoOx/a-Si: H(i)/n-Si heterojunction photovoltaic devices: the source of the 'S-shaped' behaviorGao, M ; Chen, D Y ; Du, H W ; Wu, K J ; Meng, F Y ; Ma, Z QJournal of physics. D, Applied physics, 2020-10, Vol.53 (42) [Periódico revisado por pares]IOP PublishingTexto completo disponível |
10 |
Material Type: Artigo
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Vectorial magnetometry using magnetooptic Kerr effect including first- and second-order contributions for thin ferromagnetic filmsKuschel, T ; Bardenhagen, H ; Wilkens, H ; Schubert, R ; Hamrle, J ; Pištora, J ; Wollschläger, JJournal of physics. D, Applied physics, 2011-07, Vol.44 (26), p.265003 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |