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Porous aluminum-based DUT metal-organic frameworks for the transformation of CO2 into cyclic carbonates: A computationally supported study
Porous aluminum-based DUT metal-organic frameworks for the transformation of CO2 into cyclic carbonates: A computationally supported study
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Porous aluminum-based DUT metal-organic frameworks for the transformation of CO2 into cyclic carbonates: A computationally supported study

Kurisingal, Jintu Francis ; Li, Yixin ; Sagynbayeva, Yryskul ; Chitumalla, Ramesh Kumar ; Vuppala, Srimai ; Rachuri, Yadagiri ; Gu, Yunjang ; Jang, Joonkyung ; Park, Dae-Won

Catalysis today, 2020-08, Vol.352, p.227-236 [Revista revisada por pares]

Elsevier B.V

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A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection
A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection
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A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection

Liu, Rui ; Li, Hao ; Yang, Zhao ; Wang, Guantao ; Chen, Zefu ; Zhang, Peiyong

IEEE transactions on semiconductor manufacturing, 2024-05, Vol.37 (2), p.146-151 [Revista revisada por pares]

New York: IEEE

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Modelling of MSM photodetectors using RF measurement technique
Modelling of MSM photodetectors using RF measurement technique
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Modelling of MSM photodetectors using RF measurement technique

Cha, Cheolung ; Huang, Zhaoran Luo, Yi ; Lee, Yong Hee ; Koyama, Fumio

Proceedings of SPIE, the International Society for Optical Engineering, 2006, Vol.6352, p.63523M-63523M-8

Bellingham WA: SPIE

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