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1
Ieee Transactions on device and Materials Reliability
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Ieee Transactions on device and Materials Reliability

UNITED STATES IEEE

Acesso online. A biblioteca também possui exemplares impressos.

2
2000 IEEE International Reliability Physics Symposium proceedings : 38th annual : San Jose, California, April 10-13, 2000
2000 IEEE International Reliability Physics Symposium proceedings : 38th annual : San Jose, California, April 10-13, 2000
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2000 IEEE International Reliability Physics Symposium proceedings : 38th annual : San Jose, California, April 10-13, 2000

International Reliability Physics Symposium (38th 2000 San Jose, Calif.) IEEE Electron Devices Society; IEEE Reliability Society

Piscataway, N.J. IEEE c2000

Localização: EPBC - Esc. Politécnica-Bib Central    (621.38 Ie2r 38. )(Acessar)

3
1999 IEEE International Reliability Physics Symposium proceedings : 37th annual : San Diego, California, March 23-25, 1999
1999 IEEE International Reliability Physics Symposium proceedings : 37th annual : San Diego, California, March 23-25, 1999
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1999 IEEE International Reliability Physics Symposium proceedings : 37th annual : San Diego, California, March 23-25, 1999

International Reliability Physics Symposium (37th 1999 San Diego, Calif.) IEEE Electron Devices Society; IEEE Reliability Society

Piscataway, N.J. IEEE c1999

Localização: EPBC - Esc. Politécnica-Bib Central    (621.38 Ie2r 37. )(Acessar)

4
Conference record of the Twenty Sixth IEEE Photovoltaic Specialists Conference, 1997 Anaheim Marriott, Anaheim, CA, 29 September - 03 October 1997
Conference record of the Twenty Sixth IEEE Photovoltaic Specialists Conference, 1997 Anaheim Marriott, Anaheim, CA, 29 September - 03 October 1997
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Conference record of the Twenty Sixth IEEE Photovoltaic Specialists Conference, 1997 Anaheim Marriott, Anaheim, CA, 29 September - 03 October 1997

IEEE Photovoltaic Specialists Conference (26th 1997 Anaheim, Calif.) Institute of Electrical and Electronics Engineers; IEEE Electron Devices Society

New York, N.Y. Institute of Electrical and Electronics Engineers Piscathaway, N.J. IEEE Service Center 1997

Localização: EPBC - Esc. Politécnica-Bib Central    (621.311.243 Ie2p 26. )(Acessar)

5
Microsensors
Microsensors
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Microsensors

Richard S Muller; IEEE Electron Devices Society

New York IEEE Press c1991

Localização: IEE - Inst. de Energia e Ambiente    (621.3.049.77 M626 )(Acessar)

6
Proceedings of the Twelfth Biennial University/Government/Industry Microelectronics Symposium July 20-23, 1997, Rochester Institute of Technology, Rochester, New York
Proceedings of the Twelfth Biennial University/Government/Industry Microelectronics Symposium July 20-23, 1997, Rochester Institute of Technology, Rochester, New York
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Proceedings of the Twelfth Biennial University/Government/Industry Microelectronics Symposium July 20-23, 1997, Rochester Institute of Technology, Rochester, New York

University/Government/Industry Microelectronics Symposium (12th 1997 Rochester, N.Y.) IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers Rochester Section

New York IEEE Piscataway, NJ Available from IEEE Service Center c1997

Localização: EPBC - Esc. Politécnica-Bib Central    (621.4.049.77 Un3 12. )(Acessar)

7
Proceedings of the IEEE 1996 Custom Integrated Circuits Conference Town and Country Hotel, San Diego, California, May 5-8, 1996
Proceedings of the IEEE 1996 Custom Integrated Circuits Conference Town and Country Hotel, San Diego, California, May 5-8, 1996
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Proceedings of the IEEE 1996 Custom Integrated Circuits Conference Town and Country Hotel, San Diego, California, May 5-8, 1996

Custom Integrated Circuits Conference (18th 1996 San Diego, Calif.) IEEE Electron Devices Society; IEEE Solid-State Circuits Council

New York, NY Institute of Electrical and Electronics Engineers Piscataway, NJ IEEE Order Dept. c1996

Localização: EPBC - Esc. Politécnica-Bib Central    (621.3.049.771 C969p 1996 )(Acessar)

8
ICMTS 1989 proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh, Scotland, 13-14th March 1989
ICMTS 1989 proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh, Scotland, 13-14th March 1989
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ICMTS 1989 proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh, Scotland, 13-14th March 1989

IEEE International Conference on Microelectronic Test Structures (1989 Edinburgh, Scotland) IEEE Electron Devices Society; Institution of Electrical Engineers

New York, NY IEEE c1989

Acesso online. A biblioteca também possui exemplares impressos.

9
Proceedings of the IEEE 1985 Custom Integrated Circuits Conference, the Portland Hilton, Portland, Oregon, May 20-23, 1985
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Proceedings of the IEEE 1985 Custom Integrated Circuits Conference, the Portland Hilton, Portland, Oregon, May 20-23, 1985

Custom Integrated Circuits Conference (1985 Portland, Or.) IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers Rochester Section; IEEE Solid-State Circuits Council

New York, NY Institute of Electrical and Electronics Engineers Piscataway, NJ Additional copies, IEEE Order Dept. c1985

Localização: EPBC - Esc. Politécnica-Bib Central    (621.3.049.771 C969p 1985 )(Acessar)

10
Proceedings of the 1983 Custom Integrated Circuits Conference, Genesee Plaza/Holiday Inn, Rochester, NY, May 23-25, 1983
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Proceedings of the 1983 Custom Integrated Circuits Conference, Genesee Plaza/Holiday Inn, Rochester, NY, May 23-25, 1983

Custom Integrated Circuits Conference (1983 Rochester, N.Y.) Institute of Electrical and Electronics Engineers Rochester Section; IEEE Electron Devices Society Ottawa, Ontario Chapter

New York Institute of Electrical and Electronics Engineers 1983

Localização: EPBC - Esc. Politécnica-Bib Central    (621.3.040.771 C969p 1983 )(Acessar)

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