Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Proceedings 1972 annual Reliability and Maintainability Symposium, San Francisco, Calif., January 25,26,27, 1972Reliability and Maintainability Symposium (1972 San Francisco) Institute of Electrical and Electronics Engineers; American Institute of Industrial EngineersNew York Institute of Electrical and Electronics Engineers 1972Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1972 )(Acessar) |
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2 |
Material Type: Livro
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Proceedings Philadelphia, Pa., January 23,24,25, 1973Reliability and Maintainability Symposium (1973 Philadelphia) Institute of Electrical and Electronics Engineers; Philadelphia 1973New York Institute of Electrical and Electronics Engineers 1973Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1973 )(Acessar) |
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3 |
Material Type: Livro
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1967 Annual Symposium on Reliability proceedings : Washington, D.C., January 10, 11, 12, 1967Symposium on Reliability (1967 Washington, D.C.) Institute of Electrical and Electronics EngineersNew York, N.Y. Institute of Electrical and Electronics Engineers c1967Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 Sy68r 1967 )(Acessar) |
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4 |
Material Type: Livro
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Annual Reliability and Maintainability Symposium 1998 proceedings, Anaheim, California USA, 1998 January 19-22Reliability and Maintainability Symposium (1998 Anaheim, Calif.) Institute of Electrical and Electronics Engineers; International Symposium on Product Quality & IntegrityNew York Institute of Electrical and Electronics Engineers Piscataway, NJ IEEE Service Center c1998Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 R279p 1998 )(Acessar) |
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5 |
Material Type: Livro
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Annual Reliability and Maintainability Symposium 2000 proceedings : The International Symposium on Product Quality & Integrity : Los Angeles, California USA, 2000 January 24-27Reliability and Maintainability Symposium (2000 Los Angeles, Calif.) Institute of Electrical and Electronics Engineers; International Symposium on Product Quality & IntegrityPiscataway, N.J. Institute of Electrical and Electronics Engineers c2000Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 R279p 2000 )(Acessar) |
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6 |
Material Type: Livro
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Annual Reliability and Maintainability Symposium 2002 proceedings : the International Symposium on Product Quality & Integrity : Seattle, Washington, USA, 2002 January 28-31Reliability and Maintainability Symposium (2002 Seattle, Wash.) Society of Automotive Engineers; Institute of Electrical and Electronics EngineersPiscataway, N.J. Institute of Electrical and Electronics Engineers c2002Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 R279p 2002 )(Acessar) |
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7 |
Material Type: Livro
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Annual Reliability and Maintainability Symposium 2001 proceedings : The International Symposium on Product Quality & Integrity : Philadelphia, Pennsylvania USA, 2001 January 22-25Reliability and Maintainability Symposium (2001 Philadelphia, Pa.) Institute of Electrical and Electronics Engineers; International Symposium on Product Quality & IntegrityPiscataway, N.J. Institute of Electrical and Electronics Engineers c2001Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 R279p 2001 )(Acessar) |
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8 |
Material Type: Livro
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Annual Reliability and Maintainability Symposium 1999 proceedings, Washington, D.C., USA, 1999 January 18-21Reliability and Maintainability Symposium (1999 Washington, D.C.) Institute of Electrical and Electronics Engineers; International Symposium on Product Quality & IntegrityNew York Institute of Electrical and Electronics Engineers Piscataway, NJ IEEE Service Center c1999Localização: EPBC - Esc. Politécnica-Bib Central (62.004.15 R279p 1999 )(Acessar) |
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9 |
Material Type: Livro
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Reliability, Maintainability and Risk: Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related SystemsSmith, David JSan Diego: Elsevier Science 2005Texto completo disponível |
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10 |
Material Type: Livro
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Functional Analysis Methods for Reliability ModelsGupur, GeniBasel: Springer-Verlag 2011Texto completo disponível |