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Material Type: Ata de Congresso
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In-datacenter performance analysis of a tensor processing unitJouppi, Norman P. ; Borchers, Al ; Boyle, Rick ; Cantin, Pierre-luc ; Chao, Clifford ; Clark, Chris ; Coriell, Jeremy ; Daley, Mike ; Dau, Matt ; Dean, Jeffrey ; Gelb, Ben ; Young, Cliff ; Ghaemmaghami, Tara Vazir ; Gottipati, Rajendra ; Gulland, William ; Hagmann, Robert ; Ho, C. Richard ; Hogberg, Doug ; Hu, John ; Hundt, Robert ; Hurt, Dan ; Ibarz, Julian ; Patil, Nishant ; Jaffey, Aaron ; Jaworski, Alek ; Kaplan, Alexander ; Khaitan, Harshit ; Killebrew, Daniel ; Koch, Andy ; Kumar, Naveen ; Lacy, Steve ; Laudon, James ; Law, James ; Patterson, David ; Le, Diemthu ; Leary, Chris ; Liu, Zhuyuan ; Lucke, Kyle ; Lundin, Alan ; MacKean, Gordon ; Maggiore, Adriana ; Mahony, Maire ; Miller, Kieran ; Nagarajan, Rahul ; Agrawal, Gaurav ; Narayanaswami, Ravi ; Ni, Ray ; Nix, Kathy ; Norrie, Thomas ; Omernick, Mark ; Penukonda, Narayana ; Phelps, Andy ; Ross, Jonathan ; Ross, Matt ; Salek, Amir ; Bajwa, Raminder ; Samadiani, Emad ; Severn, Chris ; Sizikov, Gregory ; Snelham, Matthew ; Souter, Jed ; Steinberg, Dan ; Swing, Andy ; Tan, Mercedes ; Thorson, Gregory ; Tian, Bo ; Bates, Sarah ; Toma, Horia ; Tuttle, Erick ; Vasudevan, Vijay ; Walter, Richard ; Wang, Walter ; Wilcox, Eric ; Yoon, Doe Hyun ; Bhatia, Suresh ; Boden, Nan2017 ACM/IEEE 44th Annual International Symposium on Computer Architecture (ISCA), 2017, p.1-12ACMSem texto completo |
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Material Type: Ata de Congresso
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When NAS Meets Robustness: In Search of Robust Architectures Against Adversarial AttacksGuo, Minghao ; Yang, Yuzhe ; Xu, Rui ; Liu, Ziwei ; Lin, Dahua2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2020, p.628-637IEEESem texto completo |
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Material Type: Ata de Congresso
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The Unreasonable Effectiveness of Deep Features as a Perceptual MetricZhang, Richard ; Isola, Phillip ; Efros, Alexei A. ; Shechtman, Eli ; Wang, Oliver2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.586-595IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Cross-Stitch Networks for Multi-task LearningMisra, Ishan ; Shrivastava, Abhinav ; Gupta, Abhinav ; Hebert, Martial2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2016, p.3994-4003IEEETexto completo disponível |
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Material Type: Ata de Congresso
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NEBULA: a neuromorphic spin-based ultra-low power architecture for SNNs and ANNsSingh, Sonali ; Sarma, Anup ; Jao, Nicholas ; Pattnaik, Ashutosh ; Lu, Sen ; Yang, Kezhou ; Sengupta, Abhronil ; Narayanan, Vijaykrishnan ; Das, Chita R.2020 ACM/IEEE 47th Annual International Symposium on Computer Architecture (ISCA), 2020, p.363-376Piscataway, NJ, USA: IEEE PressSem texto completo |
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Material Type: Ata de Congresso
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Learning Efficient Convolutional Networks through Network SlimmingZhuang Liu ; Jianguo Li ; Zhiqiang Shen ; Gao Huang ; Shoumeng Yan ; Changshui Zhang2017 IEEE International Conference on Computer Vision (ICCV), 2017, p.2755-2763IEEESem texto completo |
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Material Type: Ata de Congresso
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Practical Block-Wise Neural Network Architecture GenerationZhong, Zhao ; Yan, Junjie ; Wu, Wei ; Shao, Jing ; Liu, Cheng-Lin2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.2423-2432IEEETexto completo disponível |
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Material Type: Ata de Congresso
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MetaFormer is Actually What You Need for VisionYu, Weihao ; Luo, Mi ; Zhou, Pan ; Si, Chenyang ; Zhou, Yichen ; Wang, Xinchao ; Feng, Jiashi ; Yan, Shuicheng2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2022, p.10809-10819IEEESem texto completo |
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Material Type: Ata de Congresso
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Learning to Localize Sound Source in Visual ScenesSenocak, Arda ; Oh, Tae-Hyun ; Kim, Junsik ; Yang, Ming-Hsuan ; Kweon, In So2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.4358-4366IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Gated-SCNN: Gated Shape CNNs for Semantic SegmentationTakikawa, Towaki ; Acuna, David ; Jampani, Varun ; Fidler, Sanja2019 IEEE/CVF International Conference on Computer Vision (ICCV), 2019, p.5228-5237IEEESem texto completo |