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Packing Conditions of Optical Separated CsI:Tl Scintillator by Silicon Collimator
Packing Conditions of Optical Separated CsI:Tl Scintillator by Silicon Collimator
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Packing Conditions of Optical Separated CsI:Tl Scintillator by Silicon Collimator

Ohtake, R. ; Tabata, K. ; Nishizawa, J. ; Koike, A. ; Aoki, T. Railean, Serghei ; Sontea, Victor ; Tiginyanu, Ion

4th International Conference on Nanotechnologies and Biomedical Engineering, p.735-739

Cham: Springer International Publishing

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2
Development of the High-Resolution Scintillator Type Imager Using Si GRID Structures
Development of the High-Resolution Scintillator Type Imager Using Si GRID Structures
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Development of the High-Resolution Scintillator Type Imager Using Si GRID Structures

Tabata, K. ; Ohtake, R. ; Nishizawa, J. ; Koike, A. ; Aoki, T. Railean, Serghei ; Sontea, Victor ; Tiginyanu, Ion

4th International Conference on Nanotechnologies and Biomedical Engineering, p.731-734

Cham: Springer International Publishing

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3
Method of HWIL simulation for the dual-mode optical sensor
Method of HWIL simulation for the dual-mode optical sensor
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Method of HWIL simulation for the dual-mode optical sensor

Yonezawa, Toru ; Kinoshita, Toshiya ; Ohtake, Ryuji ; Nakajima, Hisayuki ; Miyauchi, Hiroshi

SPIE proceedings series, 1999, Vol.3697, p.120-127

Bellingham WA: SPIE

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4
FROM REGIONALISM TO UNIVERSAL: THE PECULIAR EXAMPLE OF BRAZILIAN CONTEMPORARY ARCHITECTURE
FROM REGIONALISM TO UNIVERSAL: THE PECULIAR EXAMPLE OF BRAZILIAN CONTEMPORARY ARCHITECTURE
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FROM REGIONALISM TO UNIVERSAL: THE PECULIAR EXAMPLE OF BRAZILIAN CONTEMPORARY ARCHITECTURE

Ohtake, R WCA

Qualicer 2000. VI World Congress on Ceramic Tile Quality. Vol.I; Castellon; 12-15 Mar. 2000, 2000, p.Con 43-Con 53

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5
Outsourcing of Verifiable Attribute-Based Keyword Search
Outsourcing of Verifiable Attribute-Based Keyword Search
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Outsourcing of Verifiable Attribute-Based Keyword Search

Ohtake, Go ; Safavi-Naini, Reihaneh ; Zhang, Liang Feng Lipmaa, Helger ; Matulevičius, Raimundas ; Mitrokotsa, Aikaterini

Secure IT Systems, p.18-35 [Periódico revisado por pares]

Cham: Springer International Publishing

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6
Attribute-Based Encryption for Range Attributes
Attribute-Based Encryption for Range Attributes
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Attribute-Based Encryption for Range Attributes

Attrapadung, Nuttapong ; Hanaoka, Goichiro ; Ogawa, Kazuto ; Ohtake, Go ; Watanabe, Hajime ; Yamada, Shota Zikas, Vassilis ; De Prisco, Roberto

Security and Cryptography for Networks, p.42-61 [Periódico revisado por pares]

Cham: Springer International Publishing

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7
A Gripper System for Robustly Picking Various Objects Placed Densely by Suction and Pinching
A Gripper System for Robustly Picking Various Objects Placed Densely by Suction and Pinching
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A Gripper System for Robustly Picking Various Objects Placed Densely by Suction and Pinching

Nakamoto, Hideichi ; Ohtake, Masashi ; Komoda, Kazuma ; Sugahara, Atsushi ; Ogawa, Akihito

2018 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2018, p.6093-6098

IEEE

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8
Deposition of Amorphous Boron Carbide Films with Pulsed Magnetron Sputtering and Evaluation of their Mechanical Properties
Deposition of Amorphous Boron Carbide Films with Pulsed Magnetron Sputtering and Evaluation of their Mechanical Properties
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Deposition of Amorphous Boron Carbide Films with Pulsed Magnetron Sputtering and Evaluation of their Mechanical Properties

Saito, Kei ; Fujii, Ryo ; Ohtake, Naoto

Advanced materials research, 2014, Vol.970, p.97-101 [Periódico revisado por pares]

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9
Three-Dimensional Integration of Fully Depleted Silicon-on-Insulator Transistor Substrates for CMOS Image Sensors Using Au/SiO2 Hybrid Bonding and XeF2 Etching
Three-Dimensional Integration of Fully Depleted Silicon-on-Insulator Transistor Substrates for CMOS Image Sensors Using Au/SiO2 Hybrid Bonding and XeF2 Etching
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Three-Dimensional Integration of Fully Depleted Silicon-on-Insulator Transistor Substrates for CMOS Image Sensors Using Au/SiO2 Hybrid Bonding and XeF2 Etching

Hagiwara, Kei ; Goto, Masahide ; Iguchi, Yoshinori ; Ohtake, Hiroshi ; Saraya, Takuya ; Toshiyoshi, Hiroshi ; Higurashi, Eiji ; Hiramoto, Toshiro

ECS transactions, 2014, Vol.64 (5), p.391-396

The Electrochemical Society, Inc

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10
Back-side-illuminated image sensor with burst capturing speed of 5.2 Tpixel per second
Back-side-illuminated image sensor with burst capturing speed of 5.2 Tpixel per second
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Back-side-illuminated image sensor with burst capturing speed of 5.2 Tpixel per second

Arai, T ; Yonai, J ; Hayashida, T ; Ohtake, H ; van Kuijk, H ; Etoh, T. Goji Widenhorn, Ralf ; Dupret, Antoine

SPIE 2013

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