Physical characterization and reliability aspects of MuGFETs
Cor Claeys Eddy Simoen; J.MRafi; Marcelo Antonio Pavanello; João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
SBMicro 2007
Pennington The Electrochemical Society 2007
Item não circula. Consulte sua biblioteca.(Acessar)
Comparison between 0.13Mm partially-depleted silicon-on-insulator technology with floating body operation at 300 K and 90 K
Marcelo Antonio Pavanello João Antonio Martino 1959-; A Mercha; J.MRafi; Eddy Simoen; Cor Claeys; H Van Meer; K De Meyer; International Symposium on Microelectronics Technology and Devices SBMICRO 2002 (17 2002 Porto Alegre, RS)
Morimoto, N.I.; Ribas, P.R.; Verdonck, P.B., eds Microelectronics Technology and Devices SBMICRO 2002 Pennington : The Electrochemical Society, 2002
Pennington The Electrochemical Society 2002
Item não circula. Consulte sua biblioteca.(Acessar)