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Material Type: Artigo
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Porous aluminum-based DUT metal-organic frameworks for the transformation of CO2 into cyclic carbonates: A computationally supported studyKurisingal, Jintu Francis ; Li, Yixin ; Sagynbayeva, Yryskul ; Chitumalla, Ramesh Kumar ; Vuppala, Srimai ; Rachuri, Yadagiri ; Gu, Yunjang ; Jang, Joonkyung ; Park, Dae-WonCatalysis today, 2020-08, Vol.352, p.227-236 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects DetectionLiu, Rui ; Li, Hao ; Yang, Zhao ; Wang, Guantao ; Chen, Zefu ; Zhang, PeiyongIEEE transactions on semiconductor manufacturing, 2024-05, Vol.37 (2), p.146-151 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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An equivalent surface dipoles based source reconstruction for estimating radiated emissions numerically from shielded PCBsBinda, Pankaj ; Singh, Akshay Pratap ; Singh, Kuldeep ; Mitharwal, RajendraInternational journal of electronics and communications, 2022-12, Vol.157, p.154407, Article 154407 [Periódico revisado por pares]Elsevier GmbHTexto completo disponível |
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Material Type: Artigo
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Intrusive FPGA-in-the-loop debugging using a rule-based inference systemKhan, Habib ul Hasan ; Podlubne, Ariel ; Göhringer, DianaMicroprocessors and microsystems, 2019-02, Vol.64, p.185-194 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
5 |
Material Type: Artigo
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FPGA-based fault injection design for 16K-point FFT processorMao, Chuang-An ; Xie, Yu ; Wei, Xin ; Xie, Yi-Zhuang ; Chen, HeJournal of engineering (Stevenage, England), 2019-11, Vol.2019 (21), p.7994-7997 [Periódico revisado por pares]The Institution of Engineering and TechnologyTexto completo disponível |
6 |
Material Type: Artigo
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Ultra Wideband Microwave Ten-Port ReflectometerAskarian, Amirhossein ; Moradi, GholamrezaApplied Computational Electromagnetics Society journal, 2015-01, Vol.30 (1), p.61Pisa: River PublishersTexto completo disponível |
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Material Type: Artigo
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Contactless radio frequency probes for high-temperature characterisation of microwave integrated circuitsJordan, J.L ; Simons, R.N ; Zorman, C.AElectronics letters, 2014-05, Vol.50 (11), p.817-819 [Periódico revisado por pares]Stevenage: The Institution of Engineering and TechnologyTexto completo disponível |
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Material Type: Artigo
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Rana grylio virus TK and DUT gene locus could be simultaneously used for foreign gene expressionHuang, Xing ; Fang, Jin ; Chen, Zhongyuan ; Zhang, QiyaVirus research, 2016-03, Vol.214, p.33-38 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Automatic Loss Adjustment for CDMA2000 and 1xEV-DO Standard for Downlink and UplinkKominek, Jiri ; Voznak, Miroslav ; Zidek, JanAdvances in electrical and electronic engineering, 2014-01, Vol.12 (4), p.301-306 [Periódico revisado por pares]Ostrava: Faculty of Electrical Engineering and Computer Science VSB - Technical University of OstravaTexto completo disponível |
10 |
Material Type: Ata de Congresso
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Generalized Test Bed for High-Voltage, High-Power SiC Device CharacterizationBerning, D. ; Hefner, A. ; Ortiz-Rodriguez, J.M. ; Hood, C. ; Rivera, A.Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting, 2006, Vol.1, p.338-345IEEETexto completo disponível |