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Investigation of Transient Reverse Currents in X-Ray Detector Pin Diodes by Discharge Current Transient Spectroscopy
Investigation of Transient Reverse Currents in X-Ray Detector Pin Diodes by Discharge Current Transient Spectroscopy
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Investigation of Transient Reverse Currents in X-Ray Detector Pin Diodes by Discharge Current Transient Spectroscopy

Hideharu Matsuura, Hideharu Matsuura ; Kazushige Segawa, Kazushige Segawa

Japanese Journal of Applied Physics, 2000-01, Vol.39 (1R), p.178 [Periódico revisado por pares]

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Difference between Traps Determined from Transient Capacitance and Transient Reverse Current
Difference between Traps Determined from Transient Capacitance and Transient Reverse Current
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Difference between Traps Determined from Transient Capacitance and Transient Reverse Current

Hideharu Matsuura, Hideharu Matsuura ; Kazushige Segawa, Kazushige Segawa ; Tatsuya Ebisui, Tatsuya Ebisui

Japanese Journal of Applied Physics, 2000-05, Vol.39 (5R), p.2714 [Periódico revisado por pares]

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3
An Improved Method for Determining Densities and Energy Levels of Dopants and Traps by Means of Hall-Effect Measurement
An Improved Method for Determining Densities and Energy Levels of Dopants and Traps by Means of Hall-Effect Measurement
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An Improved Method for Determining Densities and Energy Levels of Dopants and Traps by Means of Hall-Effect Measurement

Hideharu Matsuura, Hideharu Matsuura

Japanese Journal of Applied Physics, 1999, Vol.38 (9R), p.5176 [Periódico revisado por pares]

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