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Refinado por: Base de dados/Biblioteca: Springer Nature - Springer Journals All 2022 remover tipo de recurso: Anais de Congresso remover
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1
A fast GPU code for full Monte Carlo based SPECT reconstruction
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A fast GPU code for full Monte Carlo based SPECT reconstruction

Magnander, Tobias ; Lagerlöf, Jakob Heydorn ; Hemmingsson, Jens ; Båth, Magnus ; Svensson, Johanna ; Gjertsson, Peter ; Bernhardt, Peter

European Journal of Nuclear Medicine and Molecular Imaging, 2016 [Periódico revisado por pares]

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2
Architecture and vertebral fracture. Discussion
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Architecture and vertebral fracture. Discussion

RECKER, R. R ; LEES ; SNYDER ; RAISZ ; REEVE

Calcified tissue international, 1993, Vol.53, p.S139-S142 [Periódico revisado por pares]

New York, NY: Springer-Verlag

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3
Building sustainable parking lots with the Web of Things : User-Centric Ambient Information Systems and Applications
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Building sustainable parking lots with the Web of Things : User-Centric Ambient Information Systems and Applications

MATHEW, Sujith Samuel ; ATIF, Yacine ; SHENG, Quan Z ; MAAMAR, Zakaria

Personal and ubiquitous computing (Print), 2014, Vol.18 (4), p.895-907 [Periódico revisado por pares]

Heidelberg: Springer

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4
Derivation of efficient parallel programs: An example from genetic sequence analysis
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Derivation of efficient parallel programs: An example from genetic sequence analysis

Singh, A K ; Overbeek, R

United States 1990

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5
Dynamic testing of legacy code resources on the grid
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Dynamic testing of legacy code resources on the grid

Bitonti, Luigi ; Kiss, Tamas ; Terstyanszky, Gabor ; Delaitre, Thierry ; Winter, Stephen ; Kacsuk, Peter

Conference On Computing Frontiers: Proceedings of the 3rd conference on Computing frontiers; 03-05 May 2006, 2006, p.261-268

New York, NY, USA: ACM

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6
ESCTAIC and SCATA. Autumn Meeting
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ESCTAIC and SCATA. Autumn Meeting

Journal of clinical monitoring and computing, 2000, Vol.16 (2), p.141-158 [Periódico revisado por pares]

Dordrecht: Springer

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7
Evaluation of Strain Measurement in a Die-to-Interposer Chip Using In Situ Synchrotron X-ray Diffraction and Finite-Element Analysis : LEAD-FREE SOLDERS
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Evaluation of Strain Measurement in a Die-to-Interposer Chip Using In Situ Synchrotron X-ray Diffraction and Finite-Element Analysis : LEAD-FREE SOLDERS

HSU, Hsueh-Hsien ; CHIU, Tz-Cheng ; HUANG, Yi-Ting ; WU, Albert T ; CHANG, Tao-Chih ; HUANG, Shin-Yi ; LEE, Hsin-Yi ; KU, Ching-Shun ; LIN, Yang-Yi ; SU, Chien-Hao ; CHOU, Li-Wei ; OUYANG, Yao-Tsung

Journal of electronic materials, 2014, Vol.43 (1), p.52-56 [Periódico revisado por pares]

Heidelberg: Springer

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8
Examining the shared genetic architecture of risk tolerance and related behaviors
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Examining the shared genetic architecture of risk tolerance and related behaviors

Kong, E ; Auton, A ; Fontanillas, P ; Jain, S ; Chen, CY ; Stein, M ; Bertram, L ; Eibich, P ; Lill, C ; Wagner, G ; Hammerschlaag, A ; Posthuma, D ; Taskesen, E ; Conlin, A ; Karhunen, V ; Mannikko, M ; Svento, R ; Nivard, M ; Boomsma, D ; Abdellaoui, A ; Dolan, C ; de Wit, H ; Palmer, A ; Mackillop, J ; Sanchez-Roige, S ; Hofman, A ; Ikram, MA ; Tiemeier, H ; Uitterlinden, A ; Van Rooij, F ; Groenen, P ; Thurik, R ; Beauchamp, J ; Benjamin, D ; Biroli, P ; Cesarini, D ; De Vlaming, R ; Fontana, M ; Karlsson, R ; Koellinger, P ; Laibson, D ; Lebreton, M ; Lee, J ; Meddens, F ; Meddens, G ; Okbay, A ; Rietveld, N ; Turley, P ; Wedow, R ; Gratten, J ; Johannesson, M ; Magnusson, PKE ; Bao, YC ; Kumari, M ; Smart, M ; White, J ; Joshi, P ; Wilson, J ; Clark, D ; Buzdugan, L ; Fehr, E ; Fischbacher, U ; Hasler, G ; Morcillo-Suarez, C ; Muntane, G ; Navarro, A ; Schmidt, K ; Schunk, D ; Sutter, M

BEHAVIOR GENETICS, 2017, Vol.47 (6), p.692 [Periódico revisado por pares]

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9
Forbidden-set distance labels for graphs of bounded doubling dimension
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Forbidden-set distance labels for graphs of bounded doubling dimension

Abraham, Ittai ; Chechik, Shiri ; Gavoille, Cyril ; Peleg, David

Proceedings of the 29th ACM SIGACT-SIGOPS symposium on Principles of distributed computing, 2010, p.192-200 [Periódico revisado por pares]

New York, NY, USA: ACM

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10
Formal change impact analyses for emulated control software : The industrialisation of formal methods: a view from formal methods 2003
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Formal change impact analyses for emulated control software : The industrialisation of formal methods: a view from formal methods 2003

FIDGE, C. J

International journal on software tools for technology transfer (Print), 2006, Vol.8 (4-5), p.321-335 [Periódico revisado por pares]

Berlin: Springer

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