Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Ata de Congresso
|
A fast GPU code for full Monte Carlo based SPECT reconstructionMagnander, Tobias ; Lagerlöf, Jakob Heydorn ; Hemmingsson, Jens ; Båth, Magnus ; Svensson, Johanna ; Gjertsson, Peter ; Bernhardt, PeterEuropean Journal of Nuclear Medicine and Molecular Imaging, 2016 [Periódico revisado por pares]Texto completo disponível |
|
2 |
Material Type: Ata de Congresso
|
Architecture and vertebral fracture. DiscussionRECKER, R. R ; LEES ; SNYDER ; RAISZ ; REEVECalcified tissue international, 1993, Vol.53, p.S139-S142 [Periódico revisado por pares]New York, NY: Springer-VerlagTexto completo disponível |
|
3 |
Material Type: Ata de Congresso
|
Building sustainable parking lots with the Web of Things : User-Centric Ambient Information Systems and ApplicationsMATHEW, Sujith Samuel ; ATIF, Yacine ; SHENG, Quan Z ; MAAMAR, ZakariaPersonal and ubiquitous computing (Print), 2014, Vol.18 (4), p.895-907 [Periódico revisado por pares]Heidelberg: SpringerTexto completo disponível |
|
4 |
Material Type: Ata de Congresso
|
Derivation of efficient parallel programs: An example from genetic sequence analysisSingh, A K ; Overbeek, RUnited States 1990Texto completo disponível |
|
5 |
Material Type: Ata de Congresso
|
Dynamic testing of legacy code resources on the gridBitonti, Luigi ; Kiss, Tamas ; Terstyanszky, Gabor ; Delaitre, Thierry ; Winter, Stephen ; Kacsuk, PeterConference On Computing Frontiers: Proceedings of the 3rd conference on Computing frontiers; 03-05 May 2006, 2006, p.261-268New York, NY, USA: ACMTexto completo disponível |
|
6 |
Material Type: Ata de Congresso
|
ESCTAIC and SCATA. Autumn MeetingJournal of clinical monitoring and computing, 2000, Vol.16 (2), p.141-158 [Periódico revisado por pares]Dordrecht: SpringerTexto completo disponível |
|
7 |
Material Type: Ata de Congresso
|
Evaluation of Strain Measurement in a Die-to-Interposer Chip Using In Situ Synchrotron X-ray Diffraction and Finite-Element Analysis : LEAD-FREE SOLDERSHSU, Hsueh-Hsien ; CHIU, Tz-Cheng ; HUANG, Yi-Ting ; WU, Albert T ; CHANG, Tao-Chih ; HUANG, Shin-Yi ; LEE, Hsin-Yi ; KU, Ching-Shun ; LIN, Yang-Yi ; SU, Chien-Hao ; CHOU, Li-Wei ; OUYANG, Yao-TsungJournal of electronic materials, 2014, Vol.43 (1), p.52-56 [Periódico revisado por pares]Heidelberg: SpringerTexto completo disponível |
|
8 |
Material Type: Ata de Congresso
|
Examining the shared genetic architecture of risk tolerance and related behaviorsKong, E ; Auton, A ; Fontanillas, P ; Jain, S ; Chen, CY ; Stein, M ; Bertram, L ; Eibich, P ; Lill, C ; Wagner, G ; Hammerschlaag, A ; Posthuma, D ; Taskesen, E ; Conlin, A ; Karhunen, V ; Mannikko, M ; Svento, R ; Nivard, M ; Boomsma, D ; Abdellaoui, A ; Dolan, C ; de Wit, H ; Palmer, A ; Mackillop, J ; Sanchez-Roige, S ; Hofman, A ; Ikram, MA ; Tiemeier, H ; Uitterlinden, A ; Van Rooij, F ; Groenen, P ; Thurik, R ; Beauchamp, J ; Benjamin, D ; Biroli, P ; Cesarini, D ; De Vlaming, R ; Fontana, M ; Karlsson, R ; Koellinger, P ; Laibson, D ; Lebreton, M ; Lee, J ; Meddens, F ; Meddens, G ; Okbay, A ; Rietveld, N ; Turley, P ; Wedow, R ; Gratten, J ; Johannesson, M ; Magnusson, PKE ; Bao, YC ; Kumari, M ; Smart, M ; White, J ; Joshi, P ; Wilson, J ; Clark, D ; Buzdugan, L ; Fehr, E ; Fischbacher, U ; Hasler, G ; Morcillo-Suarez, C ; Muntane, G ; Navarro, A ; Schmidt, K ; Schunk, D ; Sutter, MBEHAVIOR GENETICS, 2017, Vol.47 (6), p.692 [Periódico revisado por pares]Texto completo disponível |
|
9 |
Material Type: Ata de Congresso
|
Forbidden-set distance labels for graphs of bounded doubling dimensionAbraham, Ittai ; Chechik, Shiri ; Gavoille, Cyril ; Peleg, DavidProceedings of the 29th ACM SIGACT-SIGOPS symposium on Principles of distributed computing, 2010, p.192-200 [Periódico revisado por pares]New York, NY, USA: ACMTexto completo disponível |
|
10 |
Material Type: Ata de Congresso
|
Formal change impact analyses for emulated control software : The industrialisation of formal methods: a view from formal methods 2003FIDGE, C. JInternational journal on software tools for technology transfer (Print), 2006, Vol.8 (4-5), p.321-335 [Periódico revisado por pares]Berlin: SpringerTexto completo disponível |