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1
Epistatic drift causes gradual decay of predictability in protein evolution
Epistatic drift causes gradual decay of predictability in protein evolution
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Epistatic drift causes gradual decay of predictability in protein evolution

Park, Yeonwoo ; Metzger, Brian P H ; Thornton, Joseph W

Science (American Association for the Advancement of Science), 2022-05, Vol.376 (6595), p.823-830 [Periódico revisado por pares]

United States: The American Association for the Advancement of Science

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2
Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction
Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction
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Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction

Chamard, Virginie ; Stangl, Julian ; Labat, Stephane ; Mandl, Bernhard ; Lechner, Rainer T. ; Metzger, Till H.

Journal of applied crystallography, 2008-04, Vol.41 (2), p.272-280 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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3
Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods
Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods
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Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods

Capello, L. ; Metzger, T. H. ; Holý, V. ; Servidori, M. ; Malachias, A.

Journal of applied crystallography, 2006-08, Vol.39 (4), p.571-581 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: Blackwell Publishing Ltd

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4
Effect of in-flight annealing and deposition method on gas-sensitive SnOx films made from size-selected nanoparticles
Effect of in-flight annealing and deposition method on gas-sensitive SnOx films made from size-selected nanoparticles
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Effect of in-flight annealing and deposition method on gas-sensitive SnOx films made from size-selected nanoparticles

Kennedy, M K ; Kruis, F E ; Fissan, H ; Nienhaus, H ; Lorke, A ; Metzger, T H

Sensors and actuators. B, Chemical, 2005-07, Vol.108 (1-2), p.62-69 [Periódico revisado por pares]

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5
Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry
Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry
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Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry

Deneke, Ch ; Schumann, J ; Engelhard, R ; Thomas, J ; Müller, C ; Khatri, M S ; Malachias, A ; Weisser, M ; Metzger, T H ; Schmidt, O G

Nanotechnology, 2009-01, Vol.20 (4), p.045703-045703 (5) [Periódico revisado por pares]

England: IOP Publishing

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6
Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering
Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering
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Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering

Capello, L. ; Metzger, T.H. ; Werner, M. ; van den Berg, J.A. ; Servidori, M. ; Herden, M. ; Feudel, T.

Materials science & engineering. B, Solid-state materials for advanced technology, 2005-12, Vol.124, p.200-204 [Periódico revisado por pares]

Elsevier B.V

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7
Squeezing X-ray Photons
Squeezing X-ray Photons
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Squeezing X-ray Photons

Metzger, Till H.

Science (American Association for the Advancement of Science), 2002-07, Vol.297 (5579), p.205-206 [Periódico revisado por pares]

Washington: American Society for the Advancement of Science

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8
X-ray pushing of a mechanical microswing
X-ray pushing of a mechanical microswing
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X-ray pushing of a mechanical microswing

Siria, A ; Rodrigues, M S ; Dhez, O ; Schwartz, W ; Torricelli, G ; LeDenmat, S ; Rochat, N ; Auvert, G ; Bikondoa, O ; Metzger, T H ; Wermeille, D ; Felici, R ; Comin, F ; Chevrier, J

Nanotechnology, 2008-11, Vol.19 (44), p.445501-445501 (5) [Periódico revisado por pares]

England: IOP Publishing

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9
Crystal growth of nanosized zeolites in solutions and films: In situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation
Crystal growth of nanosized zeolites in solutions and films: In situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation
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Crystal growth of nanosized zeolites in solutions and films: In situ grazing incidence diffraction (GID) study using synchrotron X-ray radiation

MINTOVA, S ; JEAN, B ; METZGER, T. H ; BEIN, T

Journal of materials science letters, 2003-05, Vol.22 (10), p.751-753 [Periódico revisado por pares]

Dordrecht: Kluwer Academic Publishers

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10
An Unusual Mechanism for Ligand Antagonism
An Unusual Mechanism for Ligand Antagonism
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An Unusual Mechanism for Ligand Antagonism

Torigoe, Chikako ; Inman, John K. ; Metzger, Henry

Science (American Association for the Advancement of Science), 1998-07, Vol.281 (5376), p.568-572 [Periódico revisado por pares]

Washington, DC: American Society for the Advancement of Science

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