skip to main content
Idioma:
Resultados 1 2 3 4 5 next page
Mostrar Somente
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Thin diameter optical displacement sensor for grasping force sensing of surgical robot
Thin diameter optical displacement sensor for grasping force sensing of surgical robot
Material Type:
Artigo 		Adicionar ao Meu Espaço

Thin diameter optical displacement sensor for grasping force sensing of surgical robot

Dong, Jiayuan ; Sato, Kazutaka ; Morizane, Shuichi ; Ueki, Masaru ; Takenaka, Atsushi ; Lee, Sang‐Seok ; Matsunaga, Tadao

Electronics and communications in Japan, 2023-12, Vol.106 (4), p.n/a

Hoboken: Wiley Subscription Services, Inc

Texto completo disponível

Citações Citado por
2
Three-dimensional reconstruction of super-resolved white-light interferograms based on deep learning
Three-dimensional reconstruction of super-resolved white-light interferograms based on deep learning
Material Type:
Artigo 		Adicionar ao Meu Espaço

Three-dimensional reconstruction of super-resolved white-light interferograms based on deep learning

Xin, Lei ; Liu, Xin ; Yang, Zhongming ; Zhang, Xingyu ; Gao, Zhishan ; Liu, Zhaojun

Optics and lasers in engineering, 2021-10, Vol.145, p.106663, Article 106663 [Periódico revisado por pares]

Elsevier Ltd

Texto completo disponível

Citações Citado por
3
Improved demodulation method of white light interference peak interval for simultaneous measurement of thickness and group refractive index
Improved demodulation method of white light interference peak interval for simultaneous measurement of thickness and group refractive index
Material Type:
Artigo 		Adicionar ao Meu Espaço

Improved demodulation method of white light interference peak interval for simultaneous measurement of thickness and group refractive index

Zhu, Yunlong ; Ma, Yumeng ; Lang, Junyi ; Lu, Xu ; Dang, Fanyang ; Zhu, Yao ; Zhang, Xiaojun ; Yuan, Yonggui ; Yang, Jun

Optics and laser technology, 2024-12, Vol.179, p.111240, Article 111240 [Periódico revisado por pares]

Elsevier Ltd

Texto completo disponível

Citações Citado por
4
A robust white-light interference signal leakage sampling correction method based on wavelet transform
A robust white-light interference signal leakage sampling correction method based on wavelet transform
Material Type:
Artigo 		Adicionar ao Meu Espaço

A robust white-light interference signal leakage sampling correction method based on wavelet transform

Xin, Lei ; Liu, Zhenhua ; Dou, Jiantai ; Yang, Zhongming ; Zhang, Xingyu ; Liu, Zhaojun

Optics and lasers in engineering, 2020-10, Vol.133, p.106156, Article 106156 [Periódico revisado por pares]

Elsevier Ltd

Texto completo disponível

Citações Citado por
5
Variations in the appearance quality of brown rice during the four stages of milling
Variations in the appearance quality of brown rice during the four stages of milling
Material Type:
Artigo 		Adicionar ao Meu Espaço

Variations in the appearance quality of brown rice during the four stages of milling

Ren, Haibin ; Qi, Shengmin ; Zhang, Lianhui ; Wang, Lu ; Huang, Jin ; Yang, Haiqing ; Ren, Chengang ; Zhou, Wenchen

Journal of cereal science, 2021-11, Vol.102, p.103344, Article 103344 [Periódico revisado por pares]

Elsevier Ltd

Texto completo disponível

Citações Citado por
6
Topography measurement and reconstruction of inner surfaces based on white light interference
Topography measurement and reconstruction of inner surfaces based on white light interference
Material Type:
Artigo 		Adicionar ao Meu Espaço

Topography measurement and reconstruction of inner surfaces based on white light interference

Dong, Yuchu ; Li, Zexiao ; Zhu, Linlin ; Zhang, Xiaodong

Measurement : journal of the International Measurement Confederation, 2021-12, Vol.186, p.110199, Article 110199 [Periódico revisado por pares]

London: Elsevier Ltd

Texto completo disponível

Citações Citado por
7
Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy
Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy
Material Type:
Artigo 		Adicionar ao Meu Espaço

Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy

Hu, Chi ; Liu, Xiaojun ; Yang, Wenjun ; Lu, Wenlong ; Yu, Nengguo ; Chang, Suping

Optics and lasers in engineering, 2018-01, Vol.100, p.71-76 [Periódico revisado por pares]

Elsevier Ltd

Texto completo disponível

Citações Citado por
8
A Novel White Light Interference Based AFM Head
A Novel White Light Interference Based AFM Head
Material Type:
Artigo 		Adicionar ao Meu Espaço

A Novel White Light Interference Based AFM Head

Yang, Wenjun ; Yang, Xiaojun ; Lu, Wenlong ; Yu, Nengguo ; Chen, Liangzhou ; Zhou, Liping ; Chang, Suping

Journal of lightwave technology, 2017-08, Vol.35 (16), p.3604-3610 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
9
Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers
Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers
Material Type:
Artigo 		Adicionar ao Meu Espaço

Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers

Ermilova, Elena ; Weise, Matthias ; Hertwig, Andreas Segonds, Patricia ; Descrovi, Emiliano ; Pauliat, Gilles

Journal of the European Optical Society. Rapid publications, 2023, Vol.19 (1), p.23 [Periódico revisado por pares]

EDP Sciences

Texto completo disponível

Citações Citado por
10
Experimental Study of White Light Interferometry in Mach-Zehnder Interferometers Based on Standard Single Mode Fiber
Experimental Study of White Light Interferometry in Mach-Zehnder Interferometers Based on Standard Single Mode Fiber
Material Type:
Artigo 		Adicionar ao Meu Espaço

Experimental Study of White Light Interferometry in Mach-Zehnder Interferometers Based on Standard Single Mode Fiber

Cano-Perez, José Luis ; Gutiérrez-Gutiérrez, Jaime ; Perezcampos-Mayoral, Christian ; Pérez-Campos, Eduardo L ; Pina-Canseco, María Del Socorro ; Tepech-Carrillo, Lorenzo ; Vargas-Treviño, Marciano ; Guerra-Hernández, Erick Israel ; Martínez-Helmes, Abraham ; Estudillo-Ayala, Julián Moisés ; Sierra-Hernández, Juan Manuel ; Rojas-Laguna, Roberto

Sensors (Basel, Switzerland), 2024-05, Vol.24 (10), p.3026 [Periódico revisado por pares]

Switzerland: MDPI AG

Texto completo disponível

Citações Citado por
Resultados 1 2 3 4 5 next page

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Revistas revisadas por pares (164)

Refinar Meus Resultados

Tipo de Recurso 

  1. Artigos  (184)
  2. Anais de Congresso  (65)
  3. Reports  (7)
  4. Book Chapters  (2)
  5. Livros  (1)
  6. Mais opções open sub menu

Data de Publicação 

De até
Refinar
  1. Antes de1996  (6)
  2. 1996Até2002  (19)
  3. 2003Até2008  (62)
  4. 2009Até2015  (54)
  5. Após 2015  (118)
  6. Mais opções open sub menu

Idioma 

  1. Inglês  (253)
  2. Japonês  (18)
  3. Russo  (2)
  4. Mais opções open sub menu

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.