Temperature, its measurement and control in science and industry volume three
Charles M Herzfeld; American Institute of Physics; Instrument Society of America; United States. National Bureau of Standards; SymposiumonTemperature (4th 1961 Columbus, Ohio)
New York Reinhold Publishing London Chapman & Hall c1962
Localização:
CENA - Cent. En. Nuclear na Agricultura
(536.5 H576t 8610 ) e outros locais(Acessar)
Theoretical and experimental study of the front and back interface trap density in accumulation mode soi mosfets at low temperature
João Antonio Martino 1959- Eddy Simoen; Cor Claeys; Symposiumon Low Temperature Electronics and High Temperature Superconductivity (3. 1995 Reno); Electrochemical Society Meeting (187. 1995 Reno)
Halo effect on 0.13 'mu'm floating-body partially depleted SOI n-Mosfets in low temperature operation
João Antonio Martino 1959- Marcelo Antonio Pavanello; Eddy Simoen; Cor Claeys; International Symposiumon Low Temperature Electronics (7. 2003 Orlando, USA)
Proceedings
Pennington The Electrochemical Society 2003
Item não circula. Consulte sua biblioteca.(Acessar)
Combined l and series resistance extraction of ldd mosfets
R Scheutelkamp João Antonio Martino 1959-; Eddy Simoen; L Deferm; Cor Claeys; Symposiumon Low Temperature Electronics and High Temperature Superconductivity (3. 1995 Reno); Electrochemical Society Meeting (187. 1995 Reno)
Operation of double gate grated-channel transistors at low temperatures
Marcelo Antonio Pavanello João Antonio Martino 1959-; Tae Mo Chung; A Kranti; Jean-Pierre Raskin; Denis Flandre; International Symposiumon Low Temperature Electronics (7. 2003 Orlando, USA)
Proceedings
Pennington The Electrochemical Society 2003
Item não circula. Consulte sua biblioteca.(Acessar)