Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniquesCarbone, D ; Biermanns, A ; Ziberi, B ; Frost, F ; Plantevin, O ; Pietsch, U ; Metzger, T HJournal of physics. Condensed matter, 2009-06, Vol.21 (22), p.224007-224007 (23) [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
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2 |
Material Type: Artigo
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Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imagingFavre-Nicolin, V ; Mastropietro, F ; Eymery, J ; Camacho, D ; Niquet, Y M ; Borg, B M ; Messing, M E ; Wernersson, L-E ; Algra, R E ; Bakkers, E P A M ; Metzger, T H ; Harder, R ; Robinson, I KNew journal of physics, 2010-03, Vol.12 (3), p.035013 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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3 |
Material Type: Artigo
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Nanoscale structures and dynamics of a boundary liquid layerWALZ, M ; GERTH, S ; FALUS, P ; KLIMCZAK, M ; METZGER, T. H ; MAGERL, AJournal of physics. Condensed matter, 2011-08, Vol.23 (32), p.324102-9 [Periódico revisado por pares]Bristol: Institute of PhysicsTexto completo disponível |
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4 |
Material Type: Artigo
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Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputteringCarbone, D ; Alija, A ; Plantevin, O ; Gago, R ; Facsko, S ; Metzger, T HNanotechnology, 2008-01, Vol.19 (3), p.035304-035304 (5) [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
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5 |
Material Type: Artigo
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On the driving forces for the vertical alignment in nitride quantum dot multilayersChamard, V ; Metzger, T. H ; Sztucki, M ; Holý, V ; Tolan, M ; Bellet-Amalric, E ; Adelmann, C ; Daudin, B ; Mariette, HEurophysics letters, 2003-07, Vol.63 (2), p.268-274 [Periódico revisado por pares]Les Ulis: IOP PublishingTexto completo disponível |
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6 |
Material Type: Artigo
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Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility studyDiaz, Ana ; Chamard, Virginie ; Mocuta, Cristian ; Magalhães-Paniago, Rogerio ; Stangl, Julian ; Carbone, Dina ; Metzger, Till H ; Bauer, GüntherNew journal of physics, 2010-03, Vol.12 (3), p.035006 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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7 |
Material Type: Artigo
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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipmentSalditt, T ; Metzger, T H ; Peisl, J ; Goerigk, GJournal of physics. D, Applied physics, 1995-04, Vol.28 (4A), p.A236-A240 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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8 |
Material Type: Artigo
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Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometryDeneke, Ch ; Schumann, J ; Engelhard, R ; Thomas, J ; Müller, C ; Khatri, M S ; Malachias, A ; Weisser, M ; Metzger, T H ; Schmidt, O GNanotechnology, 2009-01, Vol.20 (4), p.045703-045703 (5) [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
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9 |
Material Type: Artigo
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Determination of the Height-Height Correlation Function of Rough Surfaces from Diffuse X-Ray ScatteringSalditt, T ; Metzger, T. H ; Peisl, J ; Reinker, B ; Moske, M ; Samwer, KEurophysics letters, 1995-11, Vol.32 (4), p.331-336 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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10 |
Material Type: Artigo
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X-ray studies on self-organized wires in SiGe/Si multilayersRoch, T ; Holý, V ; Daniel, A ; Höflinger, E ; Meduna, M ; Metzger, T H ; Bauer, G ; Zhu, J ; Brunner, K ; Abstreiter, GJournal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A6-A10 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |