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Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques
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Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques

Carbone, D ; Biermanns, A ; Ziberi, B ; Frost, F ; Plantevin, O ; Pietsch, U ; Metzger, T H

Journal of physics. Condensed matter, 2009-06, Vol.21 (22), p.224007-224007 (23) [Periódico revisado por pares]

England: IOP Publishing

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Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
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Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Favre-Nicolin, V ; Mastropietro, F ; Eymery, J ; Camacho, D ; Niquet, Y M ; Borg, B M ; Messing, M E ; Wernersson, L-E ; Algra, R E ; Bakkers, E P A M ; Metzger, T H ; Harder, R ; Robinson, I K

New journal of physics, 2010-03, Vol.12 (3), p.035013 [Periódico revisado por pares]

IOP Publishing

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Nanoscale structures and dynamics of a boundary liquid layer
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Nanoscale structures and dynamics of a boundary liquid layer

WALZ, M ; GERTH, S ; FALUS, P ; KLIMCZAK, M ; METZGER, T. H ; MAGERL, A

Journal of physics. Condensed matter, 2011-08, Vol.23 (32), p.324102-9 [Periódico revisado por pares]

Bristol: Institute of Physics

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4
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
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Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering

Carbone, D ; Alija, A ; Plantevin, O ; Gago, R ; Facsko, S ; Metzger, T H

Nanotechnology, 2008-01, Vol.19 (3), p.035304-035304 (5) [Periódico revisado por pares]

England: IOP Publishing

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5
On the driving forces for the vertical alignment in nitride quantum dot multilayers
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On the driving forces for the vertical alignment in nitride quantum dot multilayers

Chamard, V ; Metzger, T. H ; Sztucki, M ; Holý, V ; Tolan, M ; Bellet-Amalric, E ; Adelmann, C ; Daudin, B ; Mariette, H

Europhysics letters, 2003-07, Vol.63 (2), p.268-274 [Periódico revisado por pares]

Les Ulis: IOP Publishing

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6
Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study
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Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study

Diaz, Ana ; Chamard, Virginie ; Mocuta, Cristian ; Magalhães-Paniago, Rogerio ; Stangl, Julian ; Carbone, Dina ; Metzger, Till H ; Bauer, Günther

New journal of physics, 2010-03, Vol.12 (3), p.035006 [Periódico revisado por pares]

IOP Publishing

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7
Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment
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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment

Salditt, T ; Metzger, T H ; Peisl, J ; Goerigk, G

Journal of physics. D, Applied physics, 1995-04, Vol.28 (4A), p.A236-A240 [Periódico revisado por pares]

Bristol: IOP Publishing

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8
Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry
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Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry

Deneke, Ch ; Schumann, J ; Engelhard, R ; Thomas, J ; Müller, C ; Khatri, M S ; Malachias, A ; Weisser, M ; Metzger, T H ; Schmidt, O G

Nanotechnology, 2009-01, Vol.20 (4), p.045703-045703 (5) [Periódico revisado por pares]

England: IOP Publishing

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9
Determination of the Height-Height Correlation Function of Rough Surfaces from Diffuse X-Ray Scattering
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Determination of the Height-Height Correlation Function of Rough Surfaces from Diffuse X-Ray Scattering

Salditt, T ; Metzger, T. H ; Peisl, J ; Reinker, B ; Moske, M ; Samwer, K

Europhysics letters, 1995-11, Vol.32 (4), p.331-336 [Periódico revisado por pares]

IOP Publishing

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10
X-ray studies on self-organized wires in SiGe/Si multilayers
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X-ray studies on self-organized wires in SiGe/Si multilayers

Roch, T ; Holý, V ; Daniel, A ; Höflinger, E ; Meduna, M ; Metzger, T H ; Bauer, G ; Zhu, J ; Brunner, K ; Abstreiter, G

Journal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A6-A10 [Periódico revisado por pares]

Bristol: IOP Publishing

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