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1 |
Material Type: Artigo
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Detection of a Spinning Object Using Light's Orbital Angular MomentumLavery, Martin P. J. ; Speirits, Fiona C. ; Barnett, Stephen M. ; Padgett, Miles J.Science (American Association for the Advancement of Science), 2013-08, Vol.341 (6145), p.537-540 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
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Material Type: Artigo
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From Few to Many: Observing the Formation of a Fermi Sea One Atom at a TimeWenz, A. N. ; Zürn, G. ; Murmann, S. ; Brouzos, I. ; Lompe, T. ; Jochim, S.Science (American Association for the Advancement of Science), 2013-10, Vol.342 (6157), p.457-460 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
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Material Type: Artigo
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Delay in PhotoemissionSchultze, M ; Fiess, M ; Karpowicz, N ; Gagnon, J ; Korbman, M ; Hofstetter, M ; Neppl, S ; Cavalieri, A.L ; Komninos, Y ; Mercouris, Th ; Nicolaides, C.A ; Pazourek, R ; Nagele, S ; Feist, J ; Burgdörfer, J ; Azzeer, A.M ; Ernstorfer, R ; Kienberger, R ; Kleineberg, U ; Goulielmakis, E ; Krausz, F ; Yakovlev, V.SScience (American Association for the Advancement of Science), 2010-06, Vol.328 (5986), p.1658-1662 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
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Material Type: Artigo
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Fine Structure Constant Defines Visual Transparency of GrapheneNAIR, R. R ; BLAKE, P ; GRIGORENKO, A. N ; NOVOSELOV, K. S ; BOOTH, T ; STAUBER, T ; PERES, N. M. R ; GEIM, A. KScience (American Association for the Advancement of Science), 2008-06, Vol.320 (5881), p.1308-1308 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
5 |
Material Type: Artigo
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A 920-Kilometer Optical Fiber Link for Frequency Metrology at the 19th Decimal PlacePredehl, K. ; Grosche, G. ; Raupach, S. M. F. ; Droste, S. ; Terra, O. ; Alnis, J. ; Legero, Th ; Hänsch, T. W. ; Udem, Th ; Holzwarth, R. ; Schnatz, H.Science (American Association for the Advancement of Science), 2012-04, Vol.336 (6080), p.441-444 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
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Material Type: Ata de Congresso
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The critical role of metrology in nanotechnologySchattenburg, Mark L ; Smith, Henry ISPIE proceedings series, 2002, Vol.4608, p.116-124Bellingham WA: SPIETexto completo disponível |
7 |
Material Type: Artigo
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Progress in atomic fountains at LNE-SYRTEGuena, J. ; Abgrall, M. ; Rovera, D. ; Laurent, P. ; Chupin, B. ; Lours, M. ; Santarelli, G. ; Rosenbusch, P. ; Tobar, M. E. ; Ruoxin Li ; Gibble, K. ; Clairon, A. ; Bize, S.IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2012-03, Vol.59 (3), p.391-409 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
8 |
Material Type: Artigo
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Atom-chip-based generation of entanglement for quantum metrologyRIEDE, Max F ; BÖHI, Pascal ; YUN LI ; HÄNSCH, Theodor W ; SINATRA, Alice ; TREUTLEIN, PhilippNature (London), 2010-04, Vol.464 (7292), p.1170-1173 [Periódico revisado por pares]London: Nature Publishing GroupTexto completo disponível |
9 |
Material Type: Artigo
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Frequency Ratio of Al⁺ and Hg⁺ Single-Ion Optical Clocks; Metrology at the 17th Decimal PlaceRosenband, T ; Hume, D.B ; Schmidt, P.O ; Chou, C.W ; Brusch, A ; Lorini, L ; Oskay, W.H ; Drullinger, R.E ; Fortier, T.M ; Stalnaker, J.E ; Diddams, S.A ; Swann, W.C ; Newbury, N.R ; Itano, W.M ; Wineland, D.J ; Bergquist, J.CScience (American Association for the Advancement of Science), 2008-03, Vol.319 (5871), p.1808-1812 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
10 |
Material Type: Artigo
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Rapid and precise absolute distance measurements at long rangeCoddington, I ; Newbury, N. R ; Swann, W. C ; Nenadovic, LNature photonics, 2009-06, Vol.3 (6), p.351-356 [Periódico revisado por pares]London: Nature Publishing GroupTexto completo disponível |