Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Accelerating GLS Simulation closure in DFT with EmulatorDas, Kriti Sundar ; Prakash, Padmini ; Zala, Abhimanyusinh2021 IEEE International Test Conference India (ITC India), 2021, p.1-6IEEESem texto completo |
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2 |
Material Type: Ata de Congresso
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Assertion & Functional Coverage Driven Verification of AMBA Advance Peripheral Bus Protocol Using System VerilogDwivedi, Prashant ; Mishra, Neha ; Singh-Rajput, Amit2021 International Conference on Advances in Electrical, Computing, Communication and Sustainable Technologies (ICAECT), 2021, p.1-6IEEESem texto completo |
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3 |
Material Type: Ata de Congresso
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Advanced verification of Single precision floating point ALUVarunkumar, J ; Anusha, R ; Shreenidhi, S ; Vishwas, S2019 1st International Conference on Advanced Technologies in Intelligent Control, Environment, Computing & Communication Engineering (ICATIECE), 2019, p.365-368IEEESem texto completo |
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4 |
Material Type: Ata de Congresso
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Design of Generic Verification Procedure for IIC Protocol in UVMJaideep Varier, E.V. ; Prabakar, V. ; Balamurugan, Karthigha2019 3rd International conference on Electronics, Communication and Aerospace Technology (ICECA), 2019, p.1146-1150IEEESem texto completo |
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5 |
Material Type: Standard
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IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Test Flow SpecificationIEEE P1450.4/D04, February 2017, 2017, p.1-182IEEESem texto completo |
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6 |
Material Type: Standard
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IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow SpecificationIEEE Std 1450.4-2017, 2018, p.1-190IEEETexto completo disponível |
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7 |
Material Type: Standard
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IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Test Flow SpecificationP1450.4/D05, September 2017, 2017, p.1-226IEEESem texto completo |
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8 |
Material Type: Standard
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IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Test Flow SpecificationIEEE P1450.4/D06, October 2017, 2017, p.1-188IEEESem texto completo |