Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Utilization of ELITE System for Precise Fault Localization of Metal Defect Functional FailureApolinaria, Ronald C.2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2020, p.1-6IEEESem texto completo |
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Material Type: Artigo
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The Leaky Integrating Threshold and Its Impact on Evidence Accumulation Models of Choice Response Time (RT)Verdonck, Stijn ; Loossens, Tim ; Philiastides, Marios G. Grigorenko, Elena L ; Holyoak, Keith JPsychological review, 2021-03, Vol.128 (2), p.203-221 [Periódico revisado por pares]United States: American Psychological AssociationTexto completo disponível |