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Refinado por: Nome da Publicação: Journal Of Physics. D, Applied Physics remover
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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment
Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment
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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment

Salditt, T ; Metzger, T H ; Peisl, J ; Goerigk, G

Journal of physics. D, Applied physics, 1995-04, Vol.28 (4A), p.A236-A240 [Periódico revisado por pares]

Bristol: IOP Publishing

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2
Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots
Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots
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Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots

Metzger, T H ; Kegel, I ; Paniago, R ; Peisl, J

Journal of physics. D, Applied physics, 1999-05, Vol.32 (10A), p.A202-A207 [Periódico revisado por pares]

IOP Publishing

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3
X-ray studies on self-organized wires in SiGe/Si multilayers
X-ray studies on self-organized wires in SiGe/Si multilayers
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X-ray studies on self-organized wires in SiGe/Si multilayers

Roch, T ; Holý, V ; Daniel, A ; Höflinger, E ; Meduna, M ; Metzger, T H ; Bauer, G ; Zhu, J ; Brunner, K ; Abstreiter, G

Journal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A6-A10 [Periódico revisado por pares]

Bristol: IOP Publishing

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4
Experimental and theoretical comparison of Sb, As, and P diffusion mechanisms and doping in CdTe
Experimental and theoretical comparison of Sb, As, and P diffusion mechanisms and doping in CdTe
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Experimental and theoretical comparison of Sb, As, and P diffusion mechanisms and doping in CdTe

Colegrove, E ; Yang, J-H ; Harvey, S P ; Young, M R ; Burst, J M ; Duenow, J N ; Albin, D S ; Wei, S-H ; Metzger, W K

Journal of physics. D, Applied physics, 2018-01, Vol.51 (7), p.75102 [Periódico revisado por pares]

United States: IOP Publishing

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5
Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy
Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy
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Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy

KOVATS, Z ; SALDITT, T ; METZGER, T. H ; PEISL, J ; STIMPEL, T ; LORENZ, H ; CHU, J. O ; ISMALL, K

Journal of physics. D, Applied physics, 1999-02, Vol.32 (4), p.359-368 [Periódico revisado por pares]

Bristol: Institute of Physics

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6
Grazing incidence x-ray scattering : an ideal tool to study the structure of quantum dots: Special issue on high resolution x-ray diffraction and topography
Grazing incidence x-ray scattering : an ideal tool to study the structure of quantum dots: Special issue on high resolution x-ray diffraction and topography
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Grazing incidence x-ray scattering : an ideal tool to study the structure of quantum dots: Special issue on high resolution x-ray diffraction and topography

METZGER, T. H ; KEGEL, I ; PANIAGO, R ; PEISL, J

Journal of physics. D, Applied physics, 1999, Vol.32 (10A), p.A202-A207 [Periódico revisado por pares]

Bristol: Institute of Physics

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7
Interface morphology in strained layer epitaxy of Si/Ge layers studied by x-ray scattering under grazing incidence and atomic force microscopy
Interface morphology in strained layer epitaxy of Si/Ge layers studied by x-ray scattering under grazing incidence and atomic force microscopy
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Interface morphology in strained layer epitaxy of Si/Ge layers studied by x-ray scattering under grazing incidence and atomic force microscopy

Kovats, Z ; Salditt, T ; Metzger, T H ; Peisl, J ; Stimpel, T ; Lorenz, H ; Chu, J O ; Ismail, K

Journal of physics. D, Applied physics, 1999-02, Vol.32 (4), p.359-368 [Periódico revisado por pares]

IOP Publishing

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8
The 2020 photovoltaic technologies roadmap
The 2020 photovoltaic technologies roadmap
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The 2020 photovoltaic technologies roadmap

Wilson, Gregory M ; Al-Jassim, Mowafak ; Metzger, Wyatt K ; Glunz, Stefan W ; Verlinden, Pierre ; Xiong, Gang ; Mansfield, Lorelle M ; Stanbery, Billy J ; Zhu, Kai ; Yan, Yanfa ; Berry, Joseph J ; Ptak, Aaron J ; Dimroth, Frank ; Kayes, Brendan M ; Tamboli, Adele C ; Peibst, Robby ; Catchpole, Kylie ; Reese, Matthew O ; Klinga, Christopher S ; Denholm, Paul ; Morjaria, Mahesh ; Deceglie, Michael G ; Freeman, Janine M ; Mikofski, Mark A ; Jordan, Dirk C ; TamizhMani, Govindasamy ; Sulas-Kern, Dana B

Journal of physics. D, Applied physics, 2020-12, Vol.53 (49), p.493001 [Periódico revisado por pares]

United States: IOP Publishing

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9
Se diffusion in CdTe thin films for photovoltaics
Se diffusion in CdTe thin films for photovoltaics
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Se diffusion in CdTe thin films for photovoltaics

Colegrove, Eric ; Zheng, Xin ; Ablekim, Tursun ; Duenow, Joel N ; Perkins, Craig L ; Moutinho, Helio R ; Metzger, Wyatt K

Journal of physics. D, Applied physics, 2021-01, Vol.54 (2), p.25501 [Periódico revisado por pares]

United Kingdom: IOP Publishing

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10
Hydrogenated graphene oxide (H-G-SiO 2 ) Janus structure: experimental and computational study of strong piezo-electricity response
Hydrogenated graphene oxide (H-G-SiO 2 ) Janus structure: experimental and computational study of strong piezo-electricity response
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Hydrogenated graphene oxide (H-G-SiO 2 ) Janus structure: experimental and computational study of strong piezo-electricity response

Bidmeshkipour, S ; Alidoosti, M ; Hosseinzadeh, A ; Seyyedi, S M S ; Elahi, M ; Pourfath, M ; Mohajerzadeh, S

Journal of physics. D, Applied physics, 2020-04, Vol.53 (17), p.175303 [Periódico revisado por pares]

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