Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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A Multilevel Test and Evaluation Modularization for Test Event OptimizationLee, Seunglim ; Efatmaneshnik, Mahmoud ; James, Ady2024 IEEE International Systems Conference (SysCon), 2024, p.1-6IEEESem texto completo |
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2 |
Material Type: Artigo
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A simulation-based approach to determine the evaluation adequacy of system-of-systems operational test configurationsTamburello, Robert N ; Herrmann, Jeffrey WProceedings of the Institution of Mechanical Engineers. Part O, Journal of risk and reliability, 2015-02, Vol.229 (1), p.46-51 [Periódico revisado por pares]London, England: SAGE PublicationsSem texto completo |
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3 |
Material Type: Ata de Congresso
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A New Evaluation Method for Test and Evaluation with Multi-Source InformationZhang, Tao ; Sun, Jianbin ; Jiang, Jiang ; Luo, YiYang2021 33rd Chinese Control and Decision Conference (CCDC), 2021, p.3938-3943IEEESem texto completo |
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4 |
Material Type: Ata de Congresso
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Redefining reliability evaluations for software-intensive systemsJais, Megan K.2015 Annual Reliability and Maintainability Symposium (RAMS), 2015, p.1-4IEEESem texto completo |
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5 |
Material Type: Ata de Congresso
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The impact of changes in DoD policy on reliability and sustainmentDallosta, Patrick M2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS), 2010, p.1-6IEEETexto completo disponível |
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6 |
Material Type: Report
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How Funding and Policy Affect Access to and Modernization of Major Air Force Ground Test Infrastructure AssetsFetterhoff, Thomas2017Texto completo disponível |
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7 |
Material Type: Report
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Developmental Test and Evaluation Role in Assessing System ReliabilityDiPetto, Christopher2008Texto completo disponível |
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8 |
Material Type: Report
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Defense Acquisitions: How and Where DOD Spends Its Contracting DollarsSchwartz, Moshe ; Ginsberg, Wendy ; Sargent, Jr, John F2015Texto completo disponível |
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9 |
Material Type: Artigo
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Quality and Reliability of Missile SystemPrahlada, MrDefense science journal, 2002-01, Vol.52 (1), p.5-10 [Periódico revisado por pares]New Delhi: Defence Scientific Information & Documentation CentreSem texto completo |
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10 |
Material Type: Report
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Advances in Flexible Hybrid Electronics ReliabilityMeek,Brian N ; Chaney,Richard L ; Leber,Darrell E ; Leija,Seth D ; DeGregorio,Kelly J ; Wald,Steven F ; Wilson,Dale G ; Hackler,Douglas R2017Texto completo disponível |