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1 |
Material Type: Artigo
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EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patternsLiu, Hongwei ; Foley, Matthew ; Lin, Qingyun ; Liu, JiangwenJournal of applied crystallography, 2016-04, Vol.49 (2), p.636-641 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
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Material Type: Livro
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Interpretation of electron diffraction patternsK. W. Andrews (Kenneth William) D. J Dyson (David John); S. R Keown (Samuel Robert)London Adam Hilger Ltd. 1971Localização: IF - Instituto de Física (548.83 A567i )(Acessar) |
3 |
Material Type: Artigo
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Orientation and diffraction patterns of δ-Ni2Si precipitates in Cu–Ni–Si alloyJia, Yan-lin ; Wang, Ming-pu ; Chen, Chang ; Dong, Qi-yi ; Wang, Shan ; Li, ZhouJournal of alloys and compounds, 2013-04, Vol.557, p.147-151 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
4 |
Material Type: Artigo
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Segal crystallinity index revisited by the simulation of X-ray diffraction patterns of cotton cellulose Iβ and cellulose IINam, Sunghyun ; French, Alfred D. ; Condon, Brian D. ; Concha, MonicaCarbohydrate polymers, 2016-01, Vol.135, p.1-9 [Periódico revisado por pares]England: Elsevier LtdTexto completo disponível |
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Material Type: Livro
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Interpretation of Electron Diffraction PatternsAndrews David John Dyson; Samuel Robert KeownSpringer US 1967Acesso online |
6 |
Material Type: Livro
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Interpretation of X-ray powder diffraction patternsH. Lipson (Henry) 1910- H SteepleLondon Macmillan New York St Martin's Press 1970Localização: IQSC - Inst. Química de São Carlos (548.83 L669i ex.1 )(Acessar) |
7 |
Material Type: Artigo
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ProLEED Studio : software for modeling low-energy electron diffraction patternsProcházka, Pavel ; Čechal, JanJournal of applied crystallography, 2024-02, Vol.57 (Pt 1), p.187-193 [Periódico revisado por pares]United States: Blackwell Publishing LtdTexto completo disponível |
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Material Type: Artigo
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Rapid Identification of X‑ray Diffraction Patterns Based on Very Limited Data by Interpretable Convolutional Neural NetworksWang, Hong ; Xie, Yunchao ; Li, Dawei ; Deng, Heng ; Zhao, Yunxin ; Xin, Ming ; Lin, JianJournal of chemical information and modeling, 2020-04, Vol.60 (4), p.2004-2011 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
9 |
Material Type: Artigo
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Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patternsNolze, Gert ; Tokarski, Tomasz ; Rychłowski, Łukasz ; Cios, Grzegorz ; Winkelmann, AimoJournal of applied crystallography, 2021-06, Vol.54 (3), p.1012-1022 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
10 |
Material Type: Artigo
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Simulating Powder X‑ray Diffraction Patterns of Two-Dimensional MaterialsJiang, Yibin ; Cao, Lingyun ; Hu, Xuefu ; Ren, Zikun ; Zhang, Cankun ; Wang, ChengInorganic chemistry, 2018-12, Vol.57 (24), p.15123-15132 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |