Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: magazinearticle
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Tracking and Estimation of Frequency, Amplitude, and Form Factor of a Harmonic Time Series [Lecture Notes]Aarts, Ronald M.IEEE signal processing magazine, 2021-09, Vol.38 (5), p.86-91New York: IEEETexto completo disponível |
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2 |
Material Type: magazinearticle
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Escort tugs-the state of the artAarts, SvenMetal bulletin monthly, 1993-01 (1), p.33-36Sem texto completo |
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3 |
Material Type: magazinearticle
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Reliability monitoring and screening issues with ultrathin gate dielectric devicesAbadeer, W.W.IEEE transactions on device and materials reliability, 2001-03, Vol.1 (1), p.60-68 [Periódico revisado por pares]Piscataway, NJ: IEEETexto completo disponível |
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4 |
Material Type: magazinearticle
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A question of formulationAbamba, GSPC. Soap, perfumery and cosmetics, 1995-06, Vol.68 (6), p.33Sem texto completo |
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5 |
Material Type: magazinearticle
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Getting the balance rightAbamba, GSPC. Soap, perfumery and cosmetics, 1994-07, Vol.67 (7), p.31Sem texto completo |
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6 |
Material Type: magazinearticle
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Handing over the reins at ScotRailAbbott, JModern railways, 1994-04, Vol.51 (547), p.215-217Sem texto completo |
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7 |
Material Type: magazinearticle
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Felixstowe upgradeAbbott, JModern railways, 1999-04, Vol.56 (607), p.244-246Sem texto completo |
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8 |
Material Type: magazinearticle
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Assessing the state of arctic technology developmentABDEL GHONEIM, GOffshore (Conroe, Tex.), 2011-02, Vol.71 (2), p.66-69Tulsa, OK: PennwellTexto completo disponível |
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9 |
Material Type: magazinearticle
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Diffusion Adaptation over Multi-Agent Networks with Wireless Link ImpairmentsAbdolee, Reza ; Champagne, Benoit ; Sayed, Ali H.IEEE transactions on mobile computing, 2016-06, Vol.15 (6), p.1362-1376 [Periódico revisado por pares]Los Alamitos: IEEETexto completo disponível |
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10 |
Material Type: magazinearticle
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Leveraging Integration: Toward Efficient Linearized All-Silicon IC TransmittersAbdomerovic, Iskren ; Palmer, William D. ; Watson, Paul M. ; Worley, Rick ; Raman, SanjayIEEE microwave magazine, 2014-05, Vol.15 (3), p.86-96New York: IEEETexto completo disponível |