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1 |
Material Type: Ata de Congresso
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0 = 0, c'est le truc du noyau ! Application aux files d'attenteBouillard, Anne ; Comte, Céline ; de Panafieu, Élie ; Mathieu, FabienSem texto completo |
2 |
Material Type: Artigo
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0, 1/2‐Cuts and the Linear Ordering Problem: Surfaces That Define FacetsFiorini, SamuelSIAM journal on discrete mathematics, 2006-10, Vol.20 (4), p.893-912 [Periódico revisado por pares]Philadelphia: Society for Industrial and Applied MathematicsTexto completo disponível |
3 |
Material Type: Artigo
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0.0012 mm^sup 2^, 8 mW, single-to-differential converter with < 1.1% data cross error and < 3.4 ps RMS jitter up to 14 Gbit/s data rateChen, Yong ; Mak, Pui-In ; Zhang, Li ; Qian, He ; Wang, YanElectronics letters, 2013-05, Vol.49 (11), p.1 [Periódico revisado por pares]Stevenage: John Wiley & Sons, IncTexto completo disponível |
4 |
Material Type: Artigo
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0.009856 m3: Between the Book, the Model, and the Built in the Vedute Collection of Three-Dimensional ManuscriptsMacken, MarianArchitecture and culture, 2016-03, Vol.4 (1), p.31-50 [Periódico revisado por pares]Abingdon: RoutledgeSem texto completo |
5 |
Material Type: Artigo
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0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric EnvironmentsCecchetto, Matteo ; Alia, Ruben Garcia ; Wrobel, Frederic ; Coronetti, Andrea ; Bilko, Kacper ; Lucsanyi, David ; Fiore, Salvatore ; Bazzano, Giulia ; Pirovano, Elisa ; Nolte, RalfIEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.873-883 [Periódico revisado por pares]New York: IEEETexto completo disponível |
6 |
Material Type: Artigo
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0.1-42 GHz InP DHBT distributed amplifiers with 35 dB gain and 15 dBm outputKrishnamurthy, K ; Chow, J ; Rodwell, M J W ; Pullela, RElectronics letters, 2003-10, Vol.39 (22), p.1-1 [Periódico revisado por pares]Stevenage: John Wiley & Sons, IncSem texto completo |
7 |
Material Type: Livro
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8 |
Material Type: Livro
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9 |
Material Type: Livro
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10 |
Material Type: Livro
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1981 Winter Simulation Conference proceedings, December 9-11, 1981, Peachtree Plaza, Atlanta, GeorgiaWinter Simulation Conference (13th 1981 Atlanta, Ga.) Tuncer I Ören; Claude M Delfosse; Charles M Shub; ACM Special Interest Group on Simulation; Institute of Electrical and Electronics EngineersNew York, N.Y. 345 East 47th St., New York 10017 Institute of Electrical and Electronics Engineers c1981Localização: IME - Inst. Matemática e Estatística (QA287.C W787p v.2 )(Acessar) |