Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Conference Proceeding
|
![]() |
A Numerical Investigation of the Gap Effect on the Condensation Heat Transfer in Vertical Mini-Channels with Various Wettability ConditionsSon, Hyo Je ; Lee, Hanchoon ; Yang, Jae Sung ; Jung, Seungmo ; Ha, Man Yeong ; Min, June KeeASHRAE transactions, 2022, Vol.128 (1), p.50-58 [Peer Reviewed Journal]Atlanta: American Society of Heating, Refrigerating, and Air-Conditioning Engineers, Inc. (ASHRAE)Full text available |
2 |
Material Type: Conference Proceeding
|
![]() |
Comments on electromigration analysis methodsZhu, X. ; Kotadia, H. ; Xu, S. ; Lu, H. ; Mannan, S. H. ; Bailey, C. ; Chan, Y. C.2013 14th International Conference on Electronic Packaging Technology, 2013, p.529-534IEEEFull text available |
3 |
Material Type: Conference Proceeding
|
![]() |
Intrinsic study of current crowding and current density gradient effects on electromigration in BEOL copper interconnectsCroes, K. ; Li, Y. ; Lofrano, M. ; Wilson, C. J. ; Tokei, Z.2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.2C.3.1-2C.3.4IEEEFull text available |
4 |
Material Type: Conference Proceeding
|
![]() |
Damage of SAC405 solder joint under PDCWei Yao ; Basaran, C.13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.403-407IEEEFull text available |
5 |
Material Type: Conference Proceeding
|
![]() |
Review of Joule heating in graphene nano-ribbonYanbiao Chu ; Basaran, C.13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.7-9IEEEFull text available |
6 |
Material Type: Conference Proceeding
|
![]() |
Mean time to failure of SnAgCuNi solder joints under DCBasaran, Cemal ; Shidong Li ; Hopkins, D. C. ; Wei Yao13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.518-520IEEEFull text available |
7 |
Material Type: Conference Proceeding
|
![]() |
Solder joint grain boundary structure and diffusivity via molecular dynamics simulationsBasaran, C. ; Sellers, M. S. ; Schultz, A. J. ; Kofke, D. A. ; Yongchang Lee13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.514-517IEEEFull text available |
8 |
Material Type: Conference Proceeding
|
![]() |
Modeling Joule heating in carbon nanotubes with Monte Carlo simulationsRagab, Tarek ; Basaran, Cemal13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.20-29IEEEFull text available |
9 |
Material Type: Conference Proceeding
|
![]() |
Skin effect and material degradation of lead-free solder joint under ACYao Wei ; Cemal, B.13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.408-412IEEEFull text available |
10 |
Material Type: Conference Proceeding
|
![]() |
A velocity averaging method for bridging molecular dynamics with finite element analysisYongchang Lee ; Basaran, C.13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.399-402IEEEFull text available |