Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Report
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Research on Automatic ProgrammingHARVARD COLL CAMBRIDGE MA PRESIDENT AND FELLOWS1975Texto completo disponível |
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2 |
Material Type: Artigo
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Reliability Modeling and Analysis of General Modular Redundant SystemsMathur, Francis P. ; de Sousa, Paulo T.IEEE transactions on reliability, 1975-12, Vol.R-24 (5), p.296-299 [Periódico revisado por pares]IEEETexto completo disponível |
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3 |
Material Type: magazinearticle
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Reduction: a method of proving properties of parallel programsLipton, Richard J.Communications of the ACM, 1975-12, Vol.18 (12), p.717-721Texto completo disponível |
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4 |
Material Type: Artigo
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A survey of computer education in Latin AmericaBarquin, R.C.Computer (Long Beach, Calif.), 1975-12, Vol.8 (12), p.66-72 [Periódico revisado por pares]IEEETexto completo disponível |
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5 |
Material Type: magazinearticle
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SCIENCE AND THE CITIZENScientific American, 1975-12, Vol.233 (6), p.48-55Texto completo disponível |
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6 |
Material Type: Artigo
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Optimum Censored Accelerated Life Tests for Normal and Lognormal Life DistributionsKielpinski, Thomas J. ; Nelson, WayneIEEE transactions on reliability, 1975-12, Vol.R-24 (5), p.310-320 [Periódico revisado por pares]IEEETexto completo disponível |
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7 |
Material Type: magazinearticle
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Papers from the second ACM symposium on principles of programming languagesCommunications of the ACM, 1975-12, Vol.18 (12), p.675Texto completo disponível |
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8 |
Material Type: Artigo
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AFWL hydrocode development parallel techniquesNeedham, Charles E ; Durrett, Richard E ; Matuska, Daniel ASIGNUM newsletter, 1975-12, Vol.10 (4), p.13-14Texto completo disponível |
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9 |
Material Type: Artigo
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Statistical Independence & Common-Mode FailuresIEEE transactions on reliability, 1975-12, Vol.R-24 (5), p.289-289 [Periódico revisado por pares]IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Reliability & Mean Life of a Parallel System with Nonidentical UnitsBalagurusamy, E. ; Misra, K. B.IEEE transactions on reliability, 1975-12, Vol.R-24 (5), p.340-341 [Periódico revisado por pares]IEEETexto completo disponível |