Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: magazinearticle
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New Dugway facility stalled by lawsuit1Chemical & Engineering News Archive, 1985-01, Vol.63 (4), p.7Texto completo disponível |
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2 |
Material Type: magazinearticle
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Applying NFPA 75 in data centersAaby, Mark JasonConsulting - Specifying Engineer, 2016-10Denver: CFE MediaTexto completo disponível |
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3 |
Material Type: magazinearticle
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Bayesian motion estimation for temporally recursive noise reduction in X-ray fluoroscopyAach, T. ; Kunz, D.Philips journal of research, 1998-01, Vol.51 (2), p.231-251Elsevier ScienceTexto completo disponível |
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4 |
Material Type: magazinearticle
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New model improves deepwater fracture gradient values off Norway. (Drilling Production)Aadnoy, Bernt S ; Saetre, RoarThe Oil & gas journal, 2003-02, Vol.101 (5), p.51-55Nashville: PennWell Publishing CorpTexto completo disponível |
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5 |
Material Type: magazinearticle
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Transistor Modeling - With an Eye Toward the Future [From the Guest Editor's Desk]Aaen, Peter H.IEEE microwave magazine, 2012-11, Vol.13 (7), p.24-26New York: IEEETexto completo disponível |
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6 |
Material Type: magazinearticle
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ARFTG 2017Aaen, Peter H. ; Ridler, NickIEEE microwave magazine, 2017-05, Vol.18 (3), p.98-100New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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7 |
Material Type: magazinearticle
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iPads for all: Experiencing the unexpectedAagard, Mary ; Armstrong, Michelle ; Cooper, Peggy ; Nuxoll, RitaCollege & Research Libraries News, 2013-01, Vol.74 (1), p.18-20Chicago: Association of College and Research LibrariesTexto completo disponível |
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8 |
Material Type: magazinearticle
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QA: Sherry A. AaholmAaholm, Sherry AComputerworld, 2005-05, Vol.39 (21), p.48-48Framingham: IDG Communications, IncTexto completo disponível |
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9 |
Material Type: magazinearticle
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TDDB Data Generation for Fast Lifetime Projections Based on V-Ramp Stress DataAal, A.IEEE transactions on device and materials reliability, 2007-06, Vol.7 (2), p.278-284 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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10 |
Material Type: magazinearticle
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Share Your Shots: Don't hide your digital photos away. Put 'em online for everyone to see, without spending a dime.(How 2.0: Hacks, Upgrades, Projects, Gripes, Tips & Tricks)Aaland, MikkelPopular science (New York, N.Y.), 2005-02, Vol.266 (2), p.79-79Miami: Bonnier CorporationTexto completo disponível |