Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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PBS: proven Boolean simplificationAagaard, M. ; Leeser, M.IEEE transactions on computer-aided design of integrated circuits and systems, 1994-04, Vol.13 (4), p.459-470 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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2 |
Material Type: Ata de Congresso
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Transient current testing of dynamic CMOS circuitsAaraj, N. ; Nazer, A. ; Chehab, A. ; Kayssi, A.19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.264-271Los Alamitos CA: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Hybrid Architectures for Efficient and Secure Face Authentication in Embedded SystemsAaraj, N. ; Ravi, S. ; Raghunathan, A. ; Jha, N.K.IEEE transactions on very large scale integration (VLSI) systems, 2007-03, Vol.15 (3), p.296-308 [Periódico revisado por pares]Piscataway, NJ: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Embedded high-resolution delay measurement system using time amplificationABAS, M. A ; RUSSELL, G ; KINNIMENT, D. JIET computers & digital techniques, 2007, Vol.1 (2), p.77-86 [Periódico revisado por pares]Stevenage: Institution of Engineering and TechnologyTexto completo disponível |
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5 |
Material Type: Artigo
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Built-in time measurement circuits - : a comparative design studyABAS, M. A ; RUSSELL, G ; KINNIMENT, D. JIET computers & digital techniques, 2007-03, Vol.1 (2), p.87-97 [Periódico revisado por pares]Stevenage: Institution of Engineering and TechnologyTexto completo disponível |
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6 |
Material Type: Artigo
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Adaptive hierarchical scheduling policy for enterprise grid computing systemsAbawajy, J.H.Journal of network and computer applications, 2009-05, Vol.32 (3), p.770-779 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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7 |
Material Type: Ata de Congresso
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Noise effects on performance of low power design schemes in deep submicron regime [CMOS digital ICs]Abbas, M. ; Ikeda, M. ; Asada, K.19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.87-95Los Alamitos CA: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Fast Interconnect and Gate Timing Analysis for Performance OptimizationAbbaspour, S. ; Pedram, M. ; Ajami, A. ; Kashyap, C.IEEE transactions on very large scale integration (VLSI) systems, 2006-12, Vol.14 (12), p.1383-1388 [Periódico revisado por pares]Piscataway, NJ: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Xetal-II: A 107 GOPS, 600 mW Massively Parallel Processor for Video Scene AnalysisAbbo, Anteneh A. ; Kleihorst, Richard P. ; Choudhary, Vishal ; Sevat, Leo ; Wielage, Paul ; Mouy, Sebastien ; Vermeulen, Bart ; Heijligers, MarcIEEE journal of solid-state circuits, 2008-01, Vol.43 (1), p.192-201 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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A Digital CMOS Parallel Counter Architecture Based on State Look-Ahead LogicAbdel-Hafeez, S ; Gordon-Ross, AIEEE transactions on very large scale integration (VLSI) systems, 2011-06, Vol.19 (6), p.1023-1033 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |