Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Photoelectric mixing of coherent light in bulk photoconductorsLucovsky, G. ; Schwarz, R.F. ; Emmons, R.B.Proceedings of the IEEE, 1963-04, Vol.51 (4), p.613-614 [Periódico revisado por pares]IEEETexto completo disponível |
2 |
Material Type: Artigo
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Adaptive data compressionAndrews, C.A. ; Davies, J.M. ; Schwarz, G.R.Proceedings of the IEEE, 1967-01, Vol.55 (3), p.267-277 [Periódico revisado por pares]IEEETexto completo disponível |
3 |
Material Type: Artigo
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Sinusoidal Molecular Beam Chopper with an Internally Generated Phase Reference SignalSchwarz, James A. ; Madix, Robert J.Review of scientific instruments, 1968-01, Vol.39 (9), p.1366-1368 [Periódico revisado por pares]Texto completo disponível |
4 |
Material Type: Artigo
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Reactive scattering from solid surfaces: Treatment of lock-in detector signals from modulated molecular beamsSchwarz, James A. ; Madix, Robert J.Journal of catalysis, 1968-01, Vol.12 (2), p.140-144 [Periódico revisado por pares]Elsevier IncTexto completo disponível |
5 |
Material Type: Artigo
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Buffer Design for Data Compression SystemsSchwarz, G.IEEE transactions on communication technology, 1968-08, Vol.16 (4), p.606-615Texto completo disponível |
6 |
Material Type: Artigo
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Behavior of surface ions on semiconductor devicesSchlegel, E.S. ; Schnable, G.L. ; Schwarz, R.F. ; Spratt, J.P.IEEE transactions on electron devices, 1968-12, Vol.15 (12), p.973-979 [Periódico revisado por pares]IEEETexto completo disponível |
7 |
Material Type: Artigo
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Saturation of infrared absorption in gaseous molecular systemsWood, O. ; Gordon, P. ; Schwarz, S.IEEE journal of quantum electronics, 1969-10, Vol.5 (10), p.502-513 [Periódico revisado por pares]IEEETexto completo disponível |
8 |
Material Type: Artigo
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Dielectric constants, dipole moments, and molecular structure of some bicyclic nitriles and aliphatic dinitrilesSchwarz, Meyer ; Kitchman, Lester A ; Tucker, Robert W ; Nelson, Edward RJournal of chemical and engineering data, 1970-04, Vol.15 (2), p.341-346 [Periódico revisado por pares]American Chemical SocietyTexto completo disponível |
9 |
Material Type: Artigo
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Concentration profiles of implanted boron ions in silicon from measurements with the ion microprobeSchwarz, G. ; Trapp, M. ; Schimko, R. ; Butzke, G. ; Rogge, K.Physica status solidi. A, Applied research, 1973-06, Vol.17 (2), p.653-658Berlin: WILEY-VCH VerlagTexto completo disponível |
10 |
Material Type: Artigo
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The effect of growth conditions on the structural and electrical properties of the SiGe heteroepitaxial systemVasilevskaja, V.N. ; Konakova, R.V. ; Osadchaja, N.V. ; Tkhorik, Yu.A. ; Philatov, M.Yu ; Schwarz, Yu.M.Thin solid films, 1975-01, Vol.30 (1), p.91-98 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |