Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
![]() |
Multiresolution Markov models for signal and image processingWillsky, A.S.Proceedings of the IEEE, 2002-08, Vol.90 (8), p.1396-1458 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
2 |
Material Type: Artigo
|
![]() |
A multiresolution methodology for signal-level fusion and data assimilation with applications to remote sensingDaniel, M.M. ; Willsky, A.S.Proceedings of the IEEE, 1997-01, Vol.85 (1), p.164-180 [Periódico revisado por pares]IEEETexto completo disponível |
3 |
Material Type: Artigo
|
![]() |
A multiresolution methodology for signal-level fusion and data assimilation with applications to remote sensing: Data fusionDANIEL, M. M ; WILLSKY, A. SProceedings of the IEEE, 1997, Vol.85 (1), p.164-180 [Periódico revisado por pares]New York, NY: Institute of Electrical and Electronics EngineersTexto completo disponível |
4 |
Material Type: Artigo
|
![]() |
Solution and linear estimation of 2-D nearest-neighbor modelsLevy, B.C. ; Adams, M.B. ; Willsky, A.S.Proceedings of the IEEE, 1990-04, Vol.78 (4), p.627-641 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
5 |
Material Type: Artigo
|
![]() |
Maximum likelihood array processing for the estimation of superimposed signalsWeiss, A.J. ; Willsky, A.S. ; Levy, B.C.Proceedings of the IEEE, 1988-02, Vol.76 (2), p.203-205 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
6 |
Material Type: Artigo
|
![]() |
Relationships between digital signal processing and control and estimation theoryWillsky, A.S.Proceedings of the IEEE, 1978-01, Vol.66 (9), p.996-1017 [Periódico revisado por pares]IEEETexto completo disponível |
7 |
Material Type: Artigo
|
![]() |
A statistical approach to rhythm diagnosis of cardiogramsGustafson, D.E. ; Willsky, A.S. ; Jyh-Yun Wang ; Lancaster, M.C. ; Triebwasser, J.H.Proceedings of the IEEE, 1977-01, Vol.65 (5), p.802-804 [Periódico revisado por pares]IEEETexto completo disponível |