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1
Cholestasis induces expression of the oncofetal marker Nope in adult murine liver independent of Fxr
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Cholestasis induces expression of the oncofetal marker Nope in adult murine liver independent of Fxr

Bowe, A ; Hoffmann, V ; Morten, CH ; Fickert, P ; Nierhoff, D

Zeitschrift für Gastroenterologie, 2015 [Periódico revisado por pares]

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2
Cholestasis and bile acids induce expression of the oncofetal marker Nope in adult murine hepatocytes independent of Fxr
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Cholestasis and bile acids induce expression of the oncofetal marker Nope in adult murine hepatocytes independent of Fxr

Bowe, A ; Hoffmann, V ; Morton, CH ; Fickert, P ; Nierhoff, D

Zeitschrift für Gastroenterologie, 2015, Vol.53 (1) [Periódico revisado por pares]

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3
Imaging of through-silicon vias using X-Ray computed tomography
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Imaging of through-silicon vias using X-Ray computed tomography

Gambino, J. P. ; Bowe, W. ; Bronson, D. M. ; Adderly, S. A.

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2014, p.327-331

IEEE

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4
Fxr-independent expression of the oncofetal marker Neighbor of Punc E11 after bile duct ligation in the adult mouse liver
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Fxr-independent expression of the oncofetal marker Neighbor of Punc E11 after bile duct ligation in the adult mouse liver

Bowe, A ; Hoffmann, V ; Morten, CH ; Schievenbusch, S ; Goeser, T ; Fickert, P ; Nierhoff, D

Zeitschrift für Gastroenterologie, 2014, Vol.52 (1) [Periódico revisado por pares]

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5
A process to reduce the occurrence of metal extrusions in al interconnects
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A process to reduce the occurrence of metal extrusions in al interconnects

Adderly, Shawn A. ; Gambino, Jeffrey P. ; Sullivan, Timothy D. ; Moon, Matthew D. ; Speranza, Anthony C. ; Bowe, Nathaniel W. ; Thomas, David C.

ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference, 2013, p.186-190 [Periódico revisado por pares]

IEEE

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6
The effect of etch residuals on via reliability
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The effect of etch residuals on via reliability

Adderly, Shawn A. ; Moon, Matthew D. ; Lifson, Max L. ; Bowe, Nathaniel W. ; Gambino, Jeffrey P. ; Sullivan, Timothy D.

2013 IEEE Conference on Reliability Science for Advanced Materials and Devices, 2013, p.1-5

IEEE

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7
Reliability of circuits under pads for Au and Cu wire bonding
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Reliability of circuits under pads for Au and Cu wire bonding

Gambino, J. P. ; Malinowski, J. ; Cote, A. ; Guthrie, B. ; Chapman, P. ; Vize, A. ; Bowe, W. ; Griffin, C. ; Cooney, E. ; Aoki, T. ; Chen, Y. ; Wang, D. ; Jaffe, M.

2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2012, p.1-6

IEEE

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8
Fourier holograms recorded in PVA-AA photopolymers: Study of the influence of beam ratio
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Fourier holograms recorded in PVA-AA photopolymers: Study of the influence of beam ratio

Carretero, Luis ; Acebal, Pablo ; Blaya, Salvador ; Madrigal, Roque F ; Murciano, A ; Ulibarrena, Manuel ; Fimia, Antonio

Proc. SPIE, 2005, Vol.5827, p.381-388

Bellingham WA: SPIE

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9
Analysis of the diffusion processes in dry photopolymerizable holographic recording materials
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Analysis of the diffusion processes in dry photopolymerizable holographic recording materials

Blaya, Salvador ; Carretero, Luis ; Acebal, Pablo ; Madrigal, Roque F ; Murciano, A ; Ulibarrena, Manuel ; Fimia, Antonio

Proc. SPIE, 2005, Vol.5827, p.128-139

Bellingham WA: SPIE

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10
Application of characteristic vector analysis to multianalyser tensiography for the study of aqueous-ethanol solutions and French wine solutions
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Application of characteristic vector analysis to multianalyser tensiography for the study of aqueous-ethanol solutions and French wine solutions

O'Neill, M ; McMillan, Norman D ; Doyle, Greg ; Pringuet, Philippe ; O'Mongain, Eon

Proc. SPIE, 2005, Vol.5827, p.244-254

Bellingham WA: SPIE

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