Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Cholestasis induces expression of the oncofetal marker Nope in adult murine liver independent of FxrBowe, A ; Hoffmann, V ; Morten, CH ; Fickert, P ; Nierhoff, DZeitschrift für Gastroenterologie, 2015 [Periódico revisado por pares]Texto completo disponível |
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2 |
Material Type: Ata de Congresso
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Cholestasis and bile acids induce expression of the oncofetal marker Nope in adult murine hepatocytes independent of FxrBowe, A ; Hoffmann, V ; Morton, CH ; Fickert, P ; Nierhoff, DZeitschrift für Gastroenterologie, 2015, Vol.53 (1) [Periódico revisado por pares]Texto completo disponível |
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3 |
Material Type: Ata de Congresso
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Imaging of through-silicon vias using X-Ray computed tomographyGambino, J. P. ; Bowe, W. ; Bronson, D. M. ; Adderly, S. A.Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2014, p.327-331IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Fxr-independent expression of the oncofetal marker Neighbor of Punc E11 after bile duct ligation in the adult mouse liverBowe, A ; Hoffmann, V ; Morten, CH ; Schievenbusch, S ; Goeser, T ; Fickert, P ; Nierhoff, DZeitschrift für Gastroenterologie, 2014, Vol.52 (1) [Periódico revisado por pares]Texto completo disponível |
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5 |
Material Type: Ata de Congresso
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A process to reduce the occurrence of metal extrusions in al interconnectsAdderly, Shawn A. ; Gambino, Jeffrey P. ; Sullivan, Timothy D. ; Moon, Matthew D. ; Speranza, Anthony C. ; Bowe, Nathaniel W. ; Thomas, David C.ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference, 2013, p.186-190 [Periódico revisado por pares]IEEETexto completo disponível |
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6 |
Material Type: Ata de Congresso
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The effect of etch residuals on via reliabilityAdderly, Shawn A. ; Moon, Matthew D. ; Lifson, Max L. ; Bowe, Nathaniel W. ; Gambino, Jeffrey P. ; Sullivan, Timothy D.2013 IEEE Conference on Reliability Science for Advanced Materials and Devices, 2013, p.1-5IEEETexto completo disponível |
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7 |
Material Type: Ata de Congresso
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Reliability of circuits under pads for Au and Cu wire bondingGambino, J. P. ; Malinowski, J. ; Cote, A. ; Guthrie, B. ; Chapman, P. ; Vize, A. ; Bowe, W. ; Griffin, C. ; Cooney, E. ; Aoki, T. ; Chen, Y. ; Wang, D. ; Jaffe, M.2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2012, p.1-6IEEETexto completo disponível |
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8 |
Material Type: Ata de Congresso
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Fourier holograms recorded in PVA-AA photopolymers: Study of the influence of beam ratioCarretero, Luis ; Acebal, Pablo ; Blaya, Salvador ; Madrigal, Roque F ; Murciano, A ; Ulibarrena, Manuel ; Fimia, AntonioProc. SPIE, 2005, Vol.5827, p.381-388Bellingham WA: SPIETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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Analysis of the diffusion processes in dry photopolymerizable holographic recording materialsBlaya, Salvador ; Carretero, Luis ; Acebal, Pablo ; Madrigal, Roque F ; Murciano, A ; Ulibarrena, Manuel ; Fimia, AntonioProc. SPIE, 2005, Vol.5827, p.128-139Bellingham WA: SPIETexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Application of characteristic vector analysis to multianalyser tensiography for the study of aqueous-ethanol solutions and French wine solutionsO'Neill, M ; McMillan, Norman D ; Doyle, Greg ; Pringuet, Philippe ; O'Mongain, EonProc. SPIE, 2005, Vol.5827, p.244-254Bellingham WA: SPIETexto completo disponível |