Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Synthesis and radical polymerization of 2-vinylcyclopropanesMoszner, Norbert ; Völkel, Thomas ; Zeuner, Frank ; Rheinberger, VolkerMacromolecular symposia., 2000-03, Vol.153 (1), p.151-159 [Periódico revisado por pares]Weinheim: WILEY-VCH VerlagTexto completo disponível |
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2 |
Material Type: Artigo
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Pulse height distribution and radiation tolerance of CVD diamond detectorsAdam, W. ; Berdermann, E. ; Bergonzo, P. ; Bertuccio, G. ; Bogani, F. ; Borchi, E. ; Brambilla, A. ; Bruzzi, M. ; Colledani, C. ; Conway, J. ; Dangelo, P. ; Dabrowski, W. ; Delpierre, P. ; Deneuville, A. ; Dulinski, W. ; van Eijk, B. ; Fallou, A. ; Fizzotti, F. ; Foulon, F. ; Friedl, M. ; Gan, K.K. ; Gheeraert, E. ; Grigoriev, E. ; Hallewell, G. ; Han, S. ; Hartjes, F. ; Hrubec, J. ; Husson, D. ; Kagan, H. ; Kania, D. ; Kaplon, J. ; Karl, C. ; Kass, R. ; Krammer, M. ; Logiudice, A. ; Lu, R. ; Manfredotti, C. ; Meier, D. ; Mishina, M. ; Moroni, L. ; Oh, A. ; Pan, L.S. ; Pernicka, M. ; Peitz, A. ; Pirollo, S. ; Polesello, P. ; Procario, M. ; Riester, J.L. ; Roe, S. ; Rousseau, L. ; Rudge, A. ; Russ, J. ; Sala, S. ; Sampietro, M. ; Schnetzer, S. ; Sciortino, S. ; Stelzer, H. ; Stone, R. ; Suter, B. ; Tapper, R.J. ; Tesarek, R. ; Trawick, M. ; Trischuk, W. ; D.Tromson ; Vittone, E. ; Walsh, A.M. ; Wedenig, R. ; Weilhammer, P. ; White, C. ; Zeuner, W. ; Zoeller, M. ; Fenyvesi, A. ; Molnar, J. ; Sohler, D.Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2000-06, Vol.447 (1), p.244-250 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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3 |
Material Type: Artigo
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Low temperature analysis of 0.25 μm T-gate strained Si/Si/sub 0.55/Ge/sub 0.45/ n-MODFET'sAniel, F. ; Zerounian, N. ; Adde, R. ; Zeuner, M. ; Hackbarth, T. ; Konig, U.IEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1477-1483 [Periódico revisado por pares]Texto completo disponível |
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4 |
Material Type: Artigo
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Low temperature analysis of 0.25 /spl mu/m T-gate strained Si/Si/sub 0.55/Ge/sub 0.45/ n-MODFET'sAniel, F. ; Zerounian, N. ; Adde, R. ; Zeuner, M. ; Hackbarth, T. ; Konig, U.IEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1477-1483 [Periódico revisado por pares]IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Low temperature analysis of 0.25 [mu]m T-gate strained Si/Si0.55Ge0.45 n-MODFET'sAniel, F ; Zerounian, N ; Adde, R ; Zeuner, M ; Hackbarth, T ; Konig, UIEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1477 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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6 |
Material Type: Artigo
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Low temperature analysis of 0.25 mu m T-gate strainedSi/Si)0.55)Ge)0.45) n-MODFET' sAniel, F ; Zerounian, N ; Adde, R ; Zeuner, M ; Hackbarth, T ; Konig, UIEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1477-1483 [Periódico revisado por pares]Texto completo disponível |
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7 |
Material Type: Artigo
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Low temperature analysis of 0.25 mu m T-gate strained Si/Si sub(0.55)Ge sub(0.45) n-MODFET'sAniel, F ; Zerounian, N ; Adde, R ; Zeuner, M ; Hackbarth, T ; Konig, UIEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1477-1483 [Periódico revisado por pares]Texto completo disponível |
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8 |
Material Type: Artigo
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Micro-strip sensors based on CVD diamondAdam, W ; Berdermann, E ; Bergonzo, P ; Bertuccio, G ; Bogani, F ; Borchi, E ; Brambilla, A ; Bruzzi, M ; Colledani, C ; Conway, J ; D'Angelo, P ; Dabrowski, W ; Delpierre, P ; Deneuville, A ; Dulinski, W ; van Eijk, B ; Fallou, A ; Fizzotti, F ; Foulon, F ; Friedl, M ; Gan, K.K ; Gheeraert, E ; Hallewell, G ; Han, S ; Hartjes, F ; Hrubec, J ; Husson, D ; Kagan, H ; Kania, D ; Kaplon, J ; Kass, R ; Koeth, T ; Krammer, M ; Logiudice, A ; Lu, R ; mac Lynne, L ; Manfredotti, C ; Meier, D ; Mishina, M ; Moroni, L ; Oh, A ; Pan, L.S ; Pernicka, M ; Peitz, A ; Perera, L ; Pirollo, S ; Procario, M ; Riester, J.L ; Roe, S ; Rousseau, L ; Rudge, A ; Russ, J ; Sala, S ; Sampietro, M ; Schnetzer, S ; Sciortino, S ; Stelzer, H ; Stone, R ; Suter, B ; Tapper, R.J ; Tesarek, R ; Trischuk, W ; Tromson, D ; Vittone, E ; Walsh, A.M ; Wedenig, R ; Weilhammer, P ; Wetstein, M ; White, C ; Zeuner, W ; Zoeller, MNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2000-10, Vol.453 (1), p.141-148 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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Control of target cell survival in thyroid autoimmunity by T helper cytokines via regulation of apoptotic proteinsDe Maria, Ruggero ; Stassi, Giorgio ; Di Liberto, Diana ; Todaro, Matilde ; Zeuner, Ann ; Ricci-Vitiani, Lucia ; Stoppacciaro, Antonella ; Ruco, Luigi ; Farina, Felicia ; Zummo, GiovanniNature immunology, 2000-12, Vol.1 (6), p.483-488 [Periódico revisado por pares]United States: Nature Publishing GroupTexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Ultra-low noise strained Si/SiGe n- and Ge/SiGe p-MODFETsEnciso, M. ; Fox, A. ; Aniel, F. ; Crozat, P. ; Giguerre, L. ; Adde, R. ; Zeuner, M. ; Hock, G.31st European Solid-State Device Research Conference, 2001, p.443-446Editions FrontieresTexto completo disponível |