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1
Tribological characterization of TiO2/Au decorative thin films obtained by PVD magnetron sputtering technology
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Tribological characterization of TiO2/Au decorative thin films obtained by PVD magnetron sputtering technology

Abreu, C.S. ; Matos, J. ; Cavaleiro, A. ; Alves, E. ; Barradas, N.P. ; Vaz, F. ; Torrell, M. ; Gomes, J.R.

Wear, 2015-05, Vol.330-331, p.419-428 [Periódico revisado por pares]

Elsevier B.V

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The influence of annealing treatments on the properties of Ag:TiO2 nanocomposite films prepared by magnetron sputtering
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The influence of annealing treatments on the properties of Ag:TiO2 nanocomposite films prepared by magnetron sputtering

Adochite, R.C. ; Munteanu, D. ; Torrell, M. ; Cunha, L. ; Alves, E. ; Barradas, N.P. ; Cavaleiro, A. ; Riviere, J.P. ; Le Bourhis, E. ; Eyidi, D. ; Vaz, F.

Applied surface science, 2012-02, Vol.258 (8), p.4028-4034 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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3
Ion beam studies of TiNxOy thin films deposited by reactive magnetron sputtering
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Ion beam studies of TiNxOy thin films deposited by reactive magnetron sputtering

Alves, E. ; Ramos, A.R. ; Barradas, N.P. ; Vaz, F. ; Cerqueira, P. ; Rebouta, L. ; Kreissig, U.

Surface & coatings technology, 2004-03, Vol.180-181, p.372-376 [Periódico revisado por pares]

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4
Antibacterial effect and biocompatibility of a novel nanostructured ZnO-coated gutta-percha cone for improved endodontic treatment
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Antibacterial effect and biocompatibility of a novel nanostructured ZnO-coated gutta-percha cone for improved endodontic treatment

Alves, M.J. ; Grenho, L. ; Lopes, C. ; Borges, J. ; Vaz, F. ; Vaz, I.P. ; Fernandes, M.H.

Materials Science & Engineering C, 2018-11, Vol.92, p.840-848

Netherlands: Elsevier B.V

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5
On the growth and mechanical properties of nanostructured cobalt foams by dynamic hydrogen bubble template electrodeposition
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On the growth and mechanical properties of nanostructured cobalt foams by dynamic hydrogen bubble template electrodeposition

Arévalo-Cid, P. ; Adán-Más, A. ; Silva, T.M. ; Rodrigues, J.A. ; Maçôas, E. ; Vaz, M.F. ; Montemor, M.F.

Materials characterization, 2020-11, Vol.169, p.110598, Article 110598 [Periódico revisado por pares]

Elsevier Inc

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6
Highly porous FeNi 3D foams produced by one-step electrodeposition: Electrochemical stability and mechanical properties
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Highly porous FeNi 3D foams produced by one-step electrodeposition: Electrochemical stability and mechanical properties

Arévalo-Cid, P. ; Vaz, M.F. ; Montemor, M.F.

Materials characterization, 2022-11, Vol.193, p.112311, Article 112311 [Periódico revisado por pares]

Elsevier Inc

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7
Corrosion resistance of ZrNxOy thin films obtained by rf reactive magnetron sputtering
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Ata de Congresso
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Corrosion resistance of ZrNxOy thin films obtained by rf reactive magnetron sputtering

ARIZA, E ; ROCHA, L. A ; VAZ, F ; CUNHA, L ; FERREIRA, S. C ; CARVALHO, P ; REBOUTA, L ; ALVES, E ; GOUDEAU, Ph ; RIVIERE, J. P

Thin solid films, 2004, Vol.469-70, p.274-281 [Periódico revisado por pares]

Lausanne: Elsevier Science

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8
Corrosion resistance of ZrNxOy thin films obtained by rf reactive magnetron sputtering
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Corrosion resistance of ZrNxOy thin films obtained by rf reactive magnetron sputtering

Ariza, E. ; Rocha, L.A. ; Vaz, F. ; Cunha, L. ; Ferreira, S.C. ; Carvalho, P. ; Rebouta, L. ; Alves, E. ; Goudeau, Ph ; Rivière, J.P.

Thin solid films, 2004-12, Vol.469-470 (Complete), p.274-281 [Periódico revisado por pares]

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9
A new model of noise characteristics of SiC Schottky barrier MESFET with deep impurity levels and traps
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A new model of noise characteristics of SiC Schottky barrier MESFET with deep impurity levels and traps

Aroutiounian, V.M. ; Avetisyan, G.A. ; Buniatyan, V.V. ; Soukiassian, P.G. ; Buniatyan, Vaz.V.

Applied surface science, 2006-05, Vol.252 (15), p.5445-5448 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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10
Quantifying Short-Lived Events in Multistate Ionic Current Measurements
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Quantifying Short-Lived Events in Multistate Ionic Current Measurements

Balijepalli, Arvind ; Ettedgui, Jessica ; Cornio, Andrew T ; Robertson, Joseph W. F ; Cheung, Kin P ; Kasianowicz, John J ; Vaz, Canute

ACS nano, 2014-02, Vol.8 (2), p.1547-1553 [Periódico revisado por pares]

United States: American Chemical Society

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