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On-wafer noise parameters measurement using an extended six-port network and conventional noise figure analyzer
On-wafer noise parameters measurement using an extended six-port network and conventional noise figure analyzer
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Artigo 		Adicionar ao Meu Espaço

On-wafer noise parameters measurement using an extended six-port network and conventional noise figure analyzer

Ahmed, Abdul-Rahman ; Lee, Dong-Hyun ; Yeom, Kyung-Whan

International journal of microwave and wireless technologies, 2017-05, Vol.9 (4), p.821-829 [Periódico revisado por pares]

Cambridge, UK: Cambridge University Press

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Optical property of hexagonal (2H) silicon crystal
Optical property of hexagonal (2H) silicon crystal
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Optical property of hexagonal (2H) silicon crystal

Ahn, Hyung Soo ; Kim, Suck-Whan ; Lee, Gang Seok ; Kim, Kyung Hwa ; Lee, Jae Hak ; Ha, Dong Han ; Chun, Young Tea ; Ryu, Sanghoon

Semiconductor science and technology, 2021-09, Vol.36 (9), p.95023 [Periódico revisado por pares]

IOP Publishing

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3
A Fuzzy Logic-Based Location Management Method for Mobile Networks
A Fuzzy Logic-Based Location Management Method for Mobile Networks
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A Fuzzy Logic-Based Location Management Method for Mobile Networks

Bae, Ihn-Han ; Oh, Sun-Jin ; Olariu, Stephan Lee, Kyung Whan ; Ramamoorthy, C. V. ; Lee, Roger

Lecture notes in computer science, 2004, p.304-319 [Periódico revisado por pares]

Berlin, Heidelberg: Springer Berlin Heidelberg

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4
Balancing Agility and Discipline: A Guide for the Perplexed
Balancing Agility and Discipline: A Guide for the Perplexed
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Balancing Agility and Discipline: A Guide for the Perplexed

Boehm, Barry Lee, Kyung Whan ; Ramamoorthy, C. V. ; Lee, Roger

Software Engineering Research and Applications, p.1-1 [Periódico revisado por pares]

Berlin, Heidelberg: Springer Berlin Heidelberg

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5
The Other-Race Effect Revisited: No Effect for Faces Varying in Race Only
The Other-Race Effect Revisited: No Effect for Faces Varying in Race Only
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The Other-Race Effect Revisited: No Effect for Faces Varying in Race Only

Bülthoff, Isabelle ; Armann, Regine G. M. ; Lee, Ryo Kyung ; Bülthoff, Heinrich H. Bülthoff, Heinrich H. ; Müller, Klaus-Robert ; Lee, Seong-Whan

Recent Progress in Brain and Cognitive Engineering, p.153-165

Dordrecht: Springer Netherlands

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6
Communication Style Driven Connector Configurations
Communication Style Driven Connector Configurations
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Communication Style Driven Connector Configurations

Bures, Tomas ; Plasil, Frantisek Lee, Kyung Whan ; Ramamoorthy, C. V. ; Lee, Roger

Lecture notes in computer science, 2004, p.102-116 [Periódico revisado por pares]

Berlin, Heidelberg: Springer Berlin Heidelberg

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7
An Automatic Test Data Generation System Based on the Integrated Classification-Tree Methodology
An Automatic Test Data Generation System Based on the Integrated Classification-Tree Methodology
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An Automatic Test Data Generation System Based on the Integrated Classification-Tree Methodology

Cain, Andrew ; Chen, Tsong Yueh ; Grant, Doug ; Poon, Pak-Lok ; Tang, Sau-Fun ; Tse, T. H. Lee, Kyung Whan ; Ramamoorthy, C. V. ; Lee, Roger

Lecture notes in computer science, 2004, p.225-238 [Periódico revisado por pares]

Berlin, Heidelberg: Springer Berlin Heidelberg

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8
Architecture Based Software Reengineering Approach for Transforming from Legacy System to Component Based System through Applying Design Patterns
Architecture Based Software Reengineering Approach for Transforming from Legacy System to Component Based System through Applying Design Patterns
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Ata de Congresso 		Adicionar ao Meu Espaço

Architecture Based Software Reengineering Approach for Transforming from Legacy System to Component Based System through Applying Design Patterns

Cha, Jung-Eun ; Kim, Chul-Hong ; Yang, Young-Jong Lee, Kyung Whan ; Ramamoorthy, C. V. ; Lee, Roger

Lecture notes in computer science, 2004, p.266-278 [Periódico revisado por pares]

Berlin, Heidelberg: Springer Berlin Heidelberg

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9
Novel Methods for Identification and Analysis of Various Yield Problems in Semiconductor Manufacturing
Novel Methods for Identification and Analysis of Various Yield Problems in Semiconductor Manufacturing
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Novel Methods for Identification and Analysis of Various Yield Problems in Semiconductor Manufacturing

Chang Huhn Lee ; Jae Yun Moon ; Kyu Whan Chong ; Hyung Dong Woo ; Seog Hee Kang ; Kyung Seok Oh ; Seok Woo Hong ; Jae Cheol Lee

The 17th Annual SEMI/IEEE ASMC 2006 Conference, 2006, p.185-190 [Periódico revisado por pares]

IEEE

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10
Classification of Hand Motions within EEG Signals for Non-Invasive BCI-Based Robot Hand Control
Classification of Hand Motions within EEG Signals for Non-Invasive BCI-Based Robot Hand Control
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Classification of Hand Motions within EEG Signals for Non-Invasive BCI-Based Robot Hand Control

Cho, Jeong-Hyun ; Jeong, Ji-Hoon ; Shim, Kyung-Hwan ; Kim, Dong-Joo ; Lee, Seong-Whan

2018 IEEE International Conference on Systems, Man, and Cybernetics (SMC), 2018, p.515-518

IEEE

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