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Consideration of chemical-bond configurations for radiation-hard UHV ECR-CVD SiNx x-ray mask membrane
Consideration of chemical-bond configurations for radiation-hard UHV ECR-CVD SiNx x-ray mask membrane
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Consideration of chemical-bond configurations for radiation-hard UHV ECR-CVD SiNx x-ray mask membrane

Ahn, Jinho ; Suzuki, Katsumi ; Tsuboi, Shinji ; Yamashita, Yoshio

SPIE 1995

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2
A 622-MB/S MONOLITHICALLY INTEGRATED INGAAS/INP 4-CHANNEL P-I-N FET RECEIVER ARRAY
A 622-MB/S MONOLITHICALLY INTEGRATED INGAAS/INP 4-CHANNEL P-I-N FET RECEIVER ARRAY
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Artigo 		Adicionar ao Meu Espaço

A 622-MB/S MONOLITHICALLY INTEGRATED INGAAS/INP 4-CHANNEL P-I-N FET RECEIVER ARRAY

AKAHORI, Y ; IKEDA, M ; UCHIDA, N ; YOSHIDA, J ; SUZUKI, Y

IEEE photonics technology letters, 1992-05, Vol.4 (5), p.470-472

PISCATAWAY: IEEE

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3
Sputtered tin silicon oxide films for durable solar control coatings
Sputtered tin silicon oxide films for durable solar control coatings
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Sputtered tin silicon oxide films for durable solar control coatings

ANDO, E ; SUZUKI, S ; SHIMIZU, J ; HAYASHI, Y

Thin solid films, 1999-08, Vol.351 (1-2), p.301-307 [Periódico revisado por pares]

Lausanne: Elsevier Science

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4
Inter-hospital PACS designed for tele-radiology and tele-conference using a secured high speed network
Inter-hospital PACS designed for tele-radiology and tele-conference using a secured high speed network
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Inter-hospital PACS designed for tele-radiology and tele-conference using a secured high speed network

ANDO, Y ; KITAMURA, M ; OKUMURA, A ; FURUKAWA, I ; SUZUKI, J ; ONO, S ; TSUKAMOTO, N ; KAWAGUCHI, O ; KUNIEDA, E ; KUBO, A ; KOHDA, E ; HIRAMATSU, K ; SAKANO, T ; FUJII, T

SPIE proceedings series, 1999, p.420-429

Bellingham WA: SPIE

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5
Channel Selective Wavelength Conversion by Means of Inter Modal Four Wave Mixing
Channel Selective Wavelength Conversion by Means of Inter Modal Four Wave Mixing
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Channel Selective Wavelength Conversion by Means of Inter Modal Four Wave Mixing

Anjum, Omar F. ; Bottrill, Kyle ; Horak, Peter ; Jung, Yongmin ; Suzuki, Masato ; Yamamoto, Yoshinori ; Hasegawa, Takemi ; Richardson, David J. ; Parmigiani, Francesca ; Petropoulos, Periklis

2019 Optical Fiber Communications Conference and Exhibition (OFC), 2019, p.1-3

OSA

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6
Selection of parameters on laser cutting mild steel plates taking account of some manufacturing purposes
Selection of parameters on laser cutting mild steel plates taking account of some manufacturing purposes
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Selection of parameters on laser cutting mild steel plates taking account of some manufacturing purposes

Asano, Hiroshi ; Suzuki, Jippei ; Kawakami, Hiroshi ; Eguchi, Hiroshi

Proceedings of SPIE, 2003, Vol.5063, p.418-425

Bellingham WA: SPIE

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7
Self-pulsating 630-nm band strain-compensated MQW AlGaInP laser diodes
Self-pulsating 630-nm band strain-compensated MQW AlGaInP laser diodes
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Self-pulsating 630-nm band strain-compensated MQW AlGaInP laser diodes

Bessho, Y. ; Uetani, T. ; Suzuki, J. ; Shono, M. ; Ibaraki, A. ; Yagi, K. ; Yodoshi, K. ; Niina, T.

LEOS '95. IEEE Lasers and Electro-Optics Society 1995 Annual Meeting. 8th Annual Meeting. Conference Proceedings, 1995, Vol.2, p.149-150 vol.2

IEEE

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8
System definition of the ESA Earth Explorer EarthCARE mission
System definition of the ESA Earth Explorer EarthCARE mission
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System definition of the ESA Earth Explorer EarthCARE mission

Bezy, Jean-Loup ; Leibrandt, Wolfgang ; Silvestrin, Pierluigi ; Baptista, Pedro ; Kawamura, Akihito ; Oki, Riko ; Suzuki, Makoto ; Kumagai, Hiroshi

SPIE 2003

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9
Far infrared spectroscopy of the troposphere (FIRST): sensor concept
Far infrared spectroscopy of the troposphere (FIRST): sensor concept
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Far infrared spectroscopy of the troposphere (FIRST): sensor concept

Bingham, Gail E ; Wellard, Stanley J ; Mlynczak, Martin G ; Johnson, David G ; Traub, Wesley A ; Jucks, Kenneth W

Proceedings of SPIE, 2003, Vol.4897, p.127-137

SPIE

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10
Fine characterization of ITO layers by spectroscopic ellipsometry
Fine characterization of ITO layers by spectroscopic ellipsometry
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Fine characterization of ITO layers by spectroscopic ellipsometry

Boher, Pierre ; Defranoux, Christophe ; Piel, Jean-Philippe ; Stehle, Jean-Louis P ; Suzuki, Y

SPIE 1996

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