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Improving IoT module testability with test-driven development and machine learning
Improving IoT module testability with test-driven development and machine learning
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Improving IoT module testability with test-driven development and machine learning

Victor Takashi Hayashi Cairo Mateus Neves Ribeiro; Artino Quintino Filho; Matheus Ancelmo Bonfim Pita; Bruno Manias Trazzi; Júlio Cezar Estrella; Wilson Vicente Ruggiero; International Conference on Future Internet of Things and Cloud - FiCloud (8. 2021 Roma)

Proceedings Piscataway : IEEE, 2021

Piscataway IEEE 2021

Available at ICMC - Inst. Ciên. Mat. Computação    (PROD-3052061 )(GetIt)

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by this author/creator:

  1. International Conference on Future Internet of Things and Cloud - FiCloud
  2. Pita, M
  3. Quintino Filho, A
  4. Ruggiero, W
  5. Estrella, J

on this subject:

  1. Aprendizado Computacional
  2. Python
  3. Internet Das Coisas

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