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Leaky mode analysis of luminescent thin films: The case of ZnO on sapphire
Leaky mode analysis of luminescent thin films: The case of ZnO on sapphire
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Leaky mode analysis of luminescent thin films: The case of ZnO on sapphire

Aad, Roy ; Divay, Laurent ; Bruyant, Aurelien ; Blaize, Sylvain ; Couteau, Christophe ; Rogers, David J. ; Lerondel, Gilles

Journal of applied physics, 2012-09, Vol.112 (6) [Periódico revisado por pares]

American Institute of Physics

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2
WC/ a -C nanocomposite thin films: Optical and electrical properties
WC/ a -C nanocomposite thin films: Optical and electrical properties
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WC/ a -C nanocomposite thin films: Optical and electrical properties

Abad, M. D. ; Sánchez-López, J. C. ; Cusnir, N. ; Sanjines, R.

Journal of applied physics, 2009-02, Vol.105 (3), p.033510-033510-6 [Periódico revisado por pares]

United States: American Institute of Physics

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3
Anisotropic strain-stress state and intermixing in epitaxial Mo(110)/Ni(111) multilayers: An x-ray diffraction study
Anisotropic strain-stress state and intermixing in epitaxial Mo(110)/Ni(111) multilayers: An x-ray diffraction study
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Anisotropic strain-stress state and intermixing in epitaxial Mo(110)/Ni(111) multilayers: An x-ray diffraction study

Abadias, G. ; Debelle, A. ; Michel, A. ; Jaouen, C. ; Martin, F. ; Pacaud, J.

Journal of applied physics, 2010-01, Vol.107 (2), p.023515-023515-10 [Periódico revisado por pares]

United States: American Institute of Physics

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4
Interdependence between stress, preferred orientation, and surface morphology of nanocrystalline TiN thin films deposited by dual ion beam sputtering
Interdependence between stress, preferred orientation, and surface morphology of nanocrystalline TiN thin films deposited by dual ion beam sputtering
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Interdependence between stress, preferred orientation, and surface morphology of nanocrystalline TiN thin films deposited by dual ion beam sputtering

Abadias, G. ; Tse, Y. Y. ; Guérin, Ph ; Pelosin, V.

Journal of applied physics, 2006-06, Vol.99 (11), p.113519-113519-13 [Periódico revisado por pares]

United States: American Institute of Physics

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5
Hydrogen softening and optical transparency in Si-incorporated hydrogenated amorphous carbon films
Hydrogen softening and optical transparency in Si-incorporated hydrogenated amorphous carbon films
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Hydrogen softening and optical transparency in Si-incorporated hydrogenated amorphous carbon films

Abbas, G. A. ; Papakonstantinou, P. ; McLaughlin, J. A. ; Weijers-Dall, T. D. M. ; Elliman, R. G. ; Filik, J.

Journal of applied physics, 2005-11, Vol.98 (10), p.103505-103505-6 [Periódico revisado por pares]

United States: American Institute of Physics

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6
Characteristics of ultra low-k nanoporous and fluorinated silica based films prepared by plasma enhanced chemical vapor deposition
Characteristics of ultra low-k nanoporous and fluorinated silica based films prepared by plasma enhanced chemical vapor deposition
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Characteristics of ultra low-k nanoporous and fluorinated silica based films prepared by plasma enhanced chemical vapor deposition

Abbasi-Firouzjah, M. ; Shokri, B.

Journal of applied physics, 2013-12, Vol.114 (21) [Periódico revisado por pares]

Melville: American Institute of Physics

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7
Passivation of CdTe/MgCdTe double heterostructure by dielectric thin films deposited using atomic layer deposition
Passivation of CdTe/MgCdTe double heterostructure by dielectric thin films deposited using atomic layer deposition
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Passivation of CdTe/MgCdTe double heterostructure by dielectric thin films deposited using atomic layer deposition

Abbasi, Haris Naeem ; Qi, Xin ; Gong, Jiarui ; Ju, Zheng ; Min, Seunghwan ; Zhang, Yong-Hang ; Ma, Zhenqiang

Journal of applied physics, 2023-10, Vol.134 (13) [Periódico revisado por pares]

Melville: American Institute of Physics

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8
Optical modeling and electrical properties of cadmium oxide nanofilms: Developing a meta–heuristic calculation process model
Optical modeling and electrical properties of cadmium oxide nanofilms: Developing a meta–heuristic calculation process model
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Optical modeling and electrical properties of cadmium oxide nanofilms: Developing a meta–heuristic calculation process model

Abdolahzadeh Ziabari, Ali ; Refahi Sheikhani, A. H. ; Nezafat, Reza Vatani ; Haghighidoust, Kasra Monsef

Journal of applied physics, 2015-04, Vol.117 (13) [Periódico revisado por pares]

Melville: American Institute of Physics

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9
Effect of atomic layer deposited Al2O3:ZnO alloys on thin-film silicon photovoltaic devices
Effect of atomic layer deposited Al2O3:ZnO alloys on thin-film silicon photovoltaic devices
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Effect of atomic layer deposited Al2O3:ZnO alloys on thin-film silicon photovoltaic devices

Abdul Hadi, Sabina ; Dushaq, Ghada ; Nayfeh, Ammar

Journal of applied physics, 2017-12, Vol.122 (24) [Periódico revisado por pares]

Melville: American Institute of Physics

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10
Effect of annealing and hydrogen plasma treatment on the luminescence and persistent photoconductivity of polycrystalline ZnO films
Effect of annealing and hydrogen plasma treatment on the luminescence and persistent photoconductivity of polycrystalline ZnO films
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Effect of annealing and hydrogen plasma treatment on the luminescence and persistent photoconductivity of polycrystalline ZnO films

Abdullin, Kh. A. ; Cicero, G. ; Gritsenko, L. V. ; Kumekov, S. E. ; Markhabaeva, A. A.

Journal of applied physics, 2017-06, Vol.121 (24) [Periódico revisado por pares]

Melville: American Institute of Physics

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