Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Nanocrystalline diamond films grown at very low substrate temperature using a distributed antenna array microwave process: Towards polymeric substrate coatingBaudrillart, B. ; Bénédic, F. ; Chauveau, Th ; Bartholomot, A. ; Achard, J.Diamond and related materials, 2017-05, Vol.75, p.44-51 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
2 |
Material Type: Artigo
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An experimental investigation of the combustion of technical tetrachlorobenzene in a laboratory scale incineratorBissonier, Alain ; Chauveau, Christian ; Delfau, Jean-Louis ; Vovelle, Christian ; Diaz De Mera, YolandaCombustion and flame, 2002-05, Vol.129 (3), p.239-252 [Periódico revisado por pares]New York, NY: Elsevier IncTexto completo disponível |
3 |
Material Type: Artigo
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Characterization of syngas laminar flames using the Bunsen burner configurationBouvet, N. ; Chauveau, C. ; Gökalp, I. ; Lee, S.-Y. ; Santoro, R.J.International journal of hydrogen energy, 2011, Vol.36 (1), p.992-1005 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
4 |
Material Type: Artigo
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Influence of MBE growth conditions on the quality of InAlAs/InGaAs metamorphic HEMTs on GaAsCordier, Y. ; Lorenzini, P. ; Chauveau, J.-M. ; Ferré, D. ; Androussi, Y. ; DiPersio, J. ; Vignaud, D. ; Codron, J.-L.Journal of crystal growth, 2003-04, Vol.251 (1), p.822-826 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
5 |
Material Type: Artigo
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Recyclable metal fuels as future zero-carbon energy carrierHalter, F. ; Jeanjean, S. ; Chauveau, C. ; Berro, Y. ; Balat-Pichelin, M. ; Brilhac, J.F. ; Andrieu, A. ; Schonnenbeck, C. ; Leyssens, G. ; Dumand, C.Applications in energy and combustion science, 2023-03, Vol.13, p.100100, Article 100100 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
6 |
Material Type: Artigo
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A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopyHouard, J. ; Normand, A. ; Di Russo, E. ; Bacchi, C. ; Dalapati, P. ; Beainy, G. ; Moldovan, S. ; Da Costa, G. ; Delaroche, F. ; Vaudolon, C. ; Chauveau, J. M. ; Hugues, M. ; Blavette, D. ; Deconihout, B. ; Vella, A. ; Vurpillot, F. ; Rigutti, L.Review of scientific instruments, 2020-08, Vol.91 (8), p.083704-083704 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
7 |
Material Type: Artigo
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Sub-millisecond atom-to-ion transformation in the TULIP ISOL systemJardin, P. ; MacCormick, M. ; Bosquet, V. ; Chauveau, P. ; Damoy, S. ; Delahaye, P. ; Dubois, M. ; Fadil, M. ; Lalande, M. ; Michel, C. ; Thomas, J.-C.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2023-10, Vol.1055, p.168332, Article 168332 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
8 |
Material Type: Ata de Congresso
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Short infrared wavelength quantum cascade detectors based on non-polar ZnO/ZnMgO quantum wellsJollivet, Arnaud ; Julien, François H ; Hinkov, Borislav ; Pirotta, Stefano ; Derelle, Sophie ; Jaeck, Julien ; Tchernycheva, Maria ; Colombelli, Raffaele ; Bousseksou, Adel ; Hugues, Maxime ; Le Biavan, Nolwenn ; Tamayo-Arriola, Julen ; Montes Bajo, Miguel ; Strasser, Gottfried ; Chauveau, Jean-Michel ; Hierro, Adrian Look, David C ; Rogers, David J ; Teherani, Ferechteh HSPIE 2019Sem texto completo |
9 |
Material Type: Artigo
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MOLECULAR DYNAMICS CALCULATIONS OF NEAR-CRITICAL LIQUID OXYGEN DROPLET SURFACE TENSIONMicci, Michael M. ; Lee, S. J. ; Vieille, B. ; Chauveau, C. ; Gokalp, IskendarAtomization and Sprays, 2005, Vol.15 (4), p.413-422 [Periódico revisado por pares]Begell House IncTexto completo disponível |
10 |
Material Type: Ata de Congresso
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Energy management strategy for hybrid power systems based on moving average filters and power forecastingSaidi, R. ; Olivier, J. C. ; Machmoum, M. ; Chauveau, Eric2018 IEEE International Conference on Industrial Technology (ICIT), 2018, p.966-971IEEESem texto completo |