skip to main content
Idioma:
Refinado por: Nome da Publicação: J. Vac. Sci. Technol. A remover Nome da Publicação: Journal Of Vacuum Science & Technology. A, Vacuum, Surfaces, And Films remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
1.5 μm to 0.87 μm optical upconversion using wafer fusion technology
1.5 μm to 0.87 μm optical upconversion using wafer fusion technology
Material Type:
Artigo 		Adicionar ao Meu Espaço

1.5 μm to 0.87 μm optical upconversion using wafer fusion technology

Luo, H. ; Ban, D. ; Liu, H. C. ; SpringThorpe, A. J. ; Wasilewski, Z. R. ; Buchanan, M. ; Glew, R.

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2004-05, Vol.22 (3), p.788-791 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
2
Atomic layer deposition of titanium phosphate on silica nanoparticles
Atomic layer deposition of titanium phosphate on silica nanoparticles
Material Type:
Artigo 		Adicionar ao Meu Espaço

Atomic layer deposition of titanium phosphate on silica nanoparticles

Wiedmann, Monika K. ; Jackson, David H. K. ; Pagan-Torres, Yomaira J. ; Cho, Eunkyung ; Dumesic, James A. ; Kuech, T. F.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2012-01, Vol.30 (1), p.01A134-01A134-8 [Periódico revisado por pares]

American Vacuum Society

Texto completo disponível

Citações Citado por
3
Atomic layer deposition of ZnO on Cu-nanoclusters for methanol synthesis
Atomic layer deposition of ZnO on Cu-nanoclusters for methanol synthesis
Material Type:
Artigo 		Adicionar ao Meu Espaço

Atomic layer deposition of ZnO on Cu-nanoclusters for methanol synthesis

Zhang, Ziyu ; Patterson, Matthew ; Ren, Maoming ; Wang, Ying ; Flake, John C. ; Sprunger, Phillip T. ; Kurtz, Richard L.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2013-01, Vol.31 (1) [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
4
Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence
Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence
Material Type:
Artigo 		Adicionar ao Meu Espaço

Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence

Gregoire, John M. ; Dale, Darren ; Kazimirov, Alexander ; DiSalvo, Francis J. ; Bruce van Dover, R.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2010-09, Vol.28 (5), p.1279-1280 [Periódico revisado por pares]

United States: American Vacuum Society

Texto completo disponível

Citações Citado por
5
Diamond coated silicon field emitter array
Diamond coated silicon field emitter array
Material Type:
Artigo 		Adicionar ao Meu Espaço

Diamond coated silicon field emitter array

Albin, S. ; Fu, W. ; Varghese, A. ; Lavarias, A. C. ; Myneni, G. R.

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1999-07, Vol.17 (4), p.2104-2108 [Periódico revisado por pares]

United States

Texto completo disponível

Citações Citado por
6
Effect of incubation time on preparation of continuous and flat Ru films
Effect of incubation time on preparation of continuous and flat Ru films
Material Type:
Artigo 		Adicionar ao Meu Espaço

Effect of incubation time on preparation of continuous and flat Ru films

Funakubo, Hiroshi ; Shiraishi, Takahisa ; Oikawa, Takahiro ; Hirano, Masaki ; Chiba, Hirokazu ; Kawano, Kazuhisa

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2015-01, Vol.33 (1) [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
7
Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions
Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions
Material Type:
Artigo 		Adicionar ao Meu Espaço

Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions

Karain, W. I. ; Knight, Larry V. ; Allred, David. D. ; Reyes‐Mena, A.

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1994-07, Vol.12 (4), p.2581-2585 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
8
Field emission characteristics of SiC capped Si tip array by ion beam synthesis
Field emission characteristics of SiC capped Si tip array by ion beam synthesis
Material Type:
Artigo 		Adicionar ao Meu Espaço

Field emission characteristics of SiC capped Si tip array by ion beam synthesis

Chen, Dihu ; Cheung, W. Y. ; Wong, S. P. ; Fung, Y. M. ; Xu, J. B. ; Wilson, I. H. ; Kwok, R. W. M.

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1999-07, Vol.17 (4), p.2109-2112 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
9
History of atomic layer deposition and its relationship with the American Vacuum Society
History of atomic layer deposition and its relationship with the American Vacuum Society
Material Type:
Artigo 		Adicionar ao Meu Espaço

History of atomic layer deposition and its relationship with the American Vacuum Society

Parsons, Gregory N. ; Elam, Jeffrey W. ; George, Steven M. ; Haukka, Suvi ; Jeon, Hyeongtag ; (Erwin) Kessels, W. M. M. ; Leskelä, Markku ; Poodt, Paul ; Ritala, Mikko ; Rossnagel, Steven M.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2013-09, Vol.31 (5) [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
10
Interface reaction of Al/W and chemical properties of Al–W bimetallic bonding
Interface reaction of Al/W and chemical properties of Al–W bimetallic bonding
Material Type:
Artigo 		Adicionar ao Meu Espaço

Interface reaction of Al/W and chemical properties of Al–W bimetallic bonding

Tsukada, Mitsuo ; Ohfuji, Shin‐ichi

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1995-09, Vol.13 (5), p.2525-2531 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.