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Refinado por: Base de dados/Biblioteca: SPIE Conference Proceedings by volume remover tipo de recurso: Anais de Congresso remover
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1
25-GHz spacing 8-ch compact arrowhead arrayed-waveguide grating using v-bend waveguides
25-GHz spacing 8-ch compact arrowhead arrayed-waveguide grating using v-bend waveguides
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25-GHz spacing 8-ch compact arrowhead arrayed-waveguide grating using v-bend waveguides

Suzuki, Takanori ; Masuda, Kenichi ; Tate, Atsushi ; Tsuda, Hiroyuki

Proc. SPIE, 2005, Vol.5728, p.342-349

Bellingham WA: SPIE

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2
40-Gbit/s photonic random access memory for photonic packet-switched networks
40-Gbit/s photonic random access memory for photonic packet-switched networks
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40-Gbit/s photonic random access memory for photonic packet-switched networks

Takahashi, Ryo ; Nakahara, Tatsushi ; Takahata, Kiyoto ; Takenouchi, Hirokazu ; Yasui, Takako ; Kondo, Naoto ; Suzuki, Hiroyuki

Proceedings of SPIE, 2004, Vol.5356, p.130-141

Bellingham WA: SPIE

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3
4.1 mega pixel JFET imaging sensor LBCAST
4.1 mega pixel JFET imaging sensor LBCAST
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4.1 mega pixel JFET imaging sensor LBCAST

ISOGAI, Tadao ; ISHIDA, Tomohisa ; KAMASHITA, Atsushi ; SUZUKI, Satoshi ; JUEN, Masahiro ; KAZAMA, Tsuneyuki

SPIE proceedings series, 2004, p.258-263

Bellingham WA: SPIE

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4
Absolute measurement of spherical surfaces using phase-conjugate waves
Absolute measurement of spherical surfaces using phase-conjugate waves
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Absolute measurement of spherical surfaces using phase-conjugate waves

Sasaki, Osami ; Takebayashi, Yuuichi ; Suzuki, Takamasa

SPIE 1995

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5
Adaptive DPCM for broadcast-quality TV transmission of composite NTSC signal
Adaptive DPCM for broadcast-quality TV transmission of composite NTSC signal
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Adaptive DPCM for broadcast-quality TV transmission of composite NTSC signal

Shibuya, Toru ; Suzuki, Norio ; Kawayachi, Noboru ; Koga, Toshio

SPIE 1993

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6
ADONIS: daytime speckle camera for Air Force Maui Optical Station--overview
ADONIS: daytime speckle camera for Air Force Maui Optical Station--overview
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ADONIS: daytime speckle camera for Air Force Maui Optical Station--overview

Lundgren, Mark A ; Houchard, Jeff E ; Wang, Victor S ; Mariam, Fesseha G ; Suzuki, Andrew H

SPIE 1995

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7
Advanced devices for near-infrared time-resolved spectroscopy and optical computed tomography : High sensitive/fast PMT, high power PLP, miniaturized CFD/TAC module and high speed multi-channel signal acquisition unit
Advanced devices for near-infrared time-resolved spectroscopy and optical computed tomography : High sensitive/fast PMT, high power PLP, miniaturized CFD/TAC module and high speed multi-channel signal acquisition unit
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Advanced devices for near-infrared time-resolved spectroscopy and optical computed tomography : High sensitive/fast PMT, high power PLP, miniaturized CFD/TAC module and high speed multi-channel signal acquisition unit

ODA, M ; YAMASHITA, Y ; SUGIURA, N ; OHTA, K ; TSUCHIYA, Y ; KAN, H ; MIYAJIMA, H ; SAWAKI, A ; NAKANO, T ; SUZUKI, S ; SUZUKI, A ; SHIMIZU, K ; MURAMATSU, S

SPIE proceedings series, 1997, p.765-773

Bellingham WA: SPIE

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8
Advanced FIB mask repair technology for 100nm/ArF lithography (2)
Advanced FIB mask repair technology for 100nm/ArF lithography (2)
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Advanced FIB mask repair technology for 100nm/ArF lithography (2)

HAGIWARA, Ryoji ; YASAKA, Anto ; MATSUDA, Osamu ; OKABE, Mamoru ; SHINOHARA, Shoji ; HASUDA, Masakatsu ; ADACHI, Tatsuya ; MORIKAWA, Yasutaka ; NISHIGUCHI, Masaharu ; SATO, Yasushi ; HAYASHI, Naoya ; OZAWA, Toshiya ; AITA, Kazuo ; TANAKA, Yoshihiro ; YOSHIOKA, Nobuyuki ; TAKAOKA, Osamu ; KOYAMA, Yoshihiro ; KOZAKAI, Tomokazu ; DOI, Toshio ; MURAMATSU, Masashi ; SUZUKI, Katsumi ; SUGIYAMA, Yasuhiko

SPIE proceedings series, 2003, p.510-519

Bellingham WA: SPIE

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9
Advanced FIB mask repair technology for Arf lithography (3)
Advanced FIB mask repair technology for Arf lithography (3)
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Advanced FIB mask repair technology for Arf lithography (3)

HAGIWARA, Ryoji ; YASAKA, Anto ; AITA, Kazuo ; ADACHI, Tatsuya ; KUBO, Shinji ; YOSHIOKA, Nobuyuki ; MORIMOTO, Hiroaki ; MORIKAWA, Yasutaka ; IWASE, Kazuya ; HAYASHI, Naoya ; TAKAOKA, Osamu ; KOZAKAI, Tomokazu ; YABE, Satoru ; KOYAMA, Yoshihiro ; MURAMATSU, Masashi ; DOI, Toshio ; SUZUKI, Katsumi ; OKABE, Mamoru

SPIE proceedings series, 2001, p.555-562

Bellingham WA: SPIE

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10
Advanced mask inspection optical system (AMOS) using 198.5nm wavelength for 65nm (hp) node and beyond: System development and initial state D/D inspection performance
Advanced mask inspection optical system (AMOS) using 198.5nm wavelength for 65nm (hp) node and beyond: System development and initial state D/D inspection performance
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Advanced mask inspection optical system (AMOS) using 198.5nm wavelength for 65nm (hp) node and beyond: System development and initial state D/D inspection performance

TOJO, Toru ; HIRANO, Ryoich ; NAKASHIMA, Kazuhiro ; SUGIHARA, Shinji ; INOUE, Hiromu ; IMAI, Shinichi ; SUZUKI, Hitoshi ; SEKINE, Akihiko ; TAYA, Makoto ; MIWA, Akemi ; YOSHIOKA, Nobuyuki ; OHIRA, Katsumi ; TSUCHIYA, Hideo ; CHUNG, Dong-Hoon ; OTAKI, Masao ; OAKI, Junji ; NISHIZAKA, Takeshi ; SANADA, Yasushi ; MATSUKI, Kazuto ; ISOMURA, Ikunao ; OGAWA, Riki ; KOBAYASHI, Noboru

SPIE proceedings series, 2004, p.1011-1023

Bellingham WA: SPIE

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