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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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Microscopic Real-Space Resistance Mapping Across CdTe Solar Cell Junctions by Scanning Spreading Resistance MicroscopyHuan Li ; Chun-Sheng Jiang ; Metzger, Wyatt K. ; Chih-Kang Shih ; Al-Jassim, MowafakIEEE journal of photovoltaics, 2015-01, Vol.5 (1), p.395-400 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
| 2 |
Material Type: Artigo
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Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysisRichard, M.-I. ; Malachias, A. ; Rouvière, J.-L. ; Yoon, T.-S. ; Holmström, E. ; Xie, Y.-H. ; Favre-Nicolin, V. ; Holý, V. ; Nordlund, K. ; Renaud, G. ; Metzger, T.-H.Physical review. B, Condensed matter and materials physics, 2011-08, Vol.84 (7), Article 075314United States: American Physical SocietyTexto completo disponível |
| 3 |
Material Type: Artigo
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Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beamDiaz, A. ; Mocuta, C. ; Stangl, J. ; Mandl, B. ; David, C. ; Vila-Comamala, J. ; Chamard, V. ; Metzger, T. H. ; Bauer, G.Physical review. B, Condensed matter and materials physics, 2009-03, Vol.79 (12), Article 125324American Physical SocietyTexto completo disponível |
| 4 |
Material Type: Artigo
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Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based NanotomographyRastelli, Armando ; Stoffel, Mathieu ; Malachias, Angelo ; Merdzhanova, Tsvetelina ; Katsaros, Georgios ; Kern, Klaus ; Metzger, Till H ; Schmidt, Oliver GNano letters, 2008-05, Vol.8 (5), p.1404-1409 [Periódico revisado por pares]Washington, DC: American Chemical SocietyTexto completo disponível |
| 5 |
Material Type: Artigo
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Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mappingSCHIILLI, T. U ; STOFFEL, M ; HESSE, A ; STANGL, J ; LECHNER, R. T ; WINTERSBERGER, E ; SZTUCKI, M ; METZGER, T. H ; SCHMIDT, O. G ; BAUER, GPhysical review. B, Condensed matter and materials physics, 2005-01, Vol.71 (3), p.035326.1-035326.9, Article 035326Ridge, NY: American Physical SocietyTexto completo disponível |
| 6 |
Material Type: Artigo
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Strain distribution in nitride quantum dot multilayersChamard, V. ; Schülli, T ; Sztucki, M. ; Metzger, T. H. ; Sarigiannidou, E. ; Rouvière, J.-L. ; Tolan, M. ; Adelmann, C. ; Daudin, B.Physical review. B, Condensed matter and materials physics, 2004-03, Vol.69 (12), Article 125327 [Periódico revisado por pares]American Physical SocietyTexto completo disponível |
| 7 |
Material Type: Artigo
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Evaporation––the way to commercial coated conductor fabricationPrusseit, W. ; Nemetschek, R. ; Semerad, R. ; Numssen, K. ; Metzger, R. ; Hoffmann, C. ; Lümkemann, A. ; Bauer, M. ; Kinder, H.Physica. C, Superconductivity, 2003-10, Vol.392, p.801-805 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
| 8 |
Material Type: Artigo
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Superconducting tapes using ISD buffer layers produced by evaporation of MgO or reactive evaporation of magnesiumMetzger, R. ; Bauer, M. ; Numssen, K. ; Semerad, R. ; Berberich, P. ; Kinder, H.IEEE transactions on applied superconductivity, 2001-03, Vol.11 (1), p.2826-2829 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
| 9 |
Material Type: Artigo
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Coherent X-Ray Scattering Phenomenon in Highly Disordered Epitaxial AlN FilmsMetzger, T. ; Höpler, R. ; Born, E. ; Christiansen, S. ; Albrecht, M. ; Strunk, H. P. ; Ambacher, O. ; Stutzmann, M. ; Stömmer, R. ; Schuster, M. ; Göbel, H.Physica status solidi. A, Applied research, 1997-08, Vol.162 (2), p.529-535Berlin: WILEY-VCH VerlagTexto completo disponível |
| 10 |
Material Type: Artigo
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Single crystal X-ray study of the superstructure modulation and long-range order in V2DMetzger, H. ; Jo, H. ; Moss, S. C. ; Westlake, D. G.Physica status solidi. A, Applied research, 1978-06, Vol.47 (2), p.631-638Berlin: WILEY-VCH VerlagTexto completo disponível |
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