Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Hot carrier transport effect in Schottky-barrier diode grown by MBEHwang, C.G. ; Dutton, R.W.IEEE transactions on computer-aided design of integrated circuits and systems, 1988-05, Vol.7 (5), p.578-583 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
2 |
Material Type: Artigo
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Effect of surface treatment on electromigration in aluminum filmsWada, T. ; Sugimoto, M. ; Ajiki, T.IEEE transactions on reliability, 1989-12, Vol.38 (5), p.565-570 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
3 |
Material Type: Artigo
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A nonequilibrium one-dimensional quantum-mechanical simulation for AlGaAs/GaAs HEMT structuresTakano, C. ; Yu, Z. ; Dutton, R.W.IEEE transactions on computer-aided design of integrated circuits and systems, 1990-11, Vol.9 (11), p.1217-1224 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
4 |
Material Type: Artigo
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Making negatives and plates for printing by electroerosion : introduction and overviewPENNINGTON, K. SIBM journal of research and development, 1991-07, Vol.35 (4), p.458-464 [Periódico revisado por pares]Armonk, NY: International Business MachinesTexto completo disponível |
5 |
Material Type: Artigo
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Observation of electromigration at low temperatureRhoden, W.E. ; Banton, D.W. ; Kitchen, D.R. ; Maskowitz, J.V.IEEE transactions on reliability, 1991-12, Vol.40 (5), p.524-530 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
6 |
Material Type: Artigo
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Novel heterostructure device for electronic pulse-mode neural circuitsSong, C. ; Roenker, K.P.IEEE transactions on neural networks, 1994-07, Vol.5 (4), p.663-665New York, NY: IEEETexto completo disponível |
7 |
Material Type: Artigo
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Reliability problems of polysilicon/Al contacts due to grain-boundary enhanced thermomigration effectsManku, T. ; Orchard-Webb, J.H.IEEE transactions on reliability, 1995-12, Vol.44 (4), p.550-555 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
8 |
Material Type: Artigo
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Robust estimation of the Birnbaum-Saunders distributionDupuis, D.J. ; Mills, J.E.IEEE transactions on reliability, 1998-03, Vol.47 (1), p.88-95 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
9 |
Material Type: Artigo
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Accelerated life testing for micro-machined chemical sensorsBose, J.-M. ; Yifan Guo ; Sarihan, V. ; Lee, T.IEEE transactions on reliability, 1998-06, Vol.47 (2), p.135-141 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
10 |
Material Type: Ata de Congresso
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Temperature in HFETs when operating in DCGonzalez, Benito ; Hernandez, Antonio ; Garcia, Javier ; del Pino, F. J ; Nunez, Antonio ; Sendra, Jose RProceedings of SPIE, 2003, Vol.5117, p.527-537Bellingham WA: SPIETexto completo disponível |